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Aon4807 30v Dual P-channel Mosfet General Description Product Summary

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AON4807 30V Dual P-Channel MOSFET General Description Product Summary The AON4807 combines advanced trench MOSFET technology with a low resistance package to provide extremely low RDS(ON). This device is ideal for load switch and battery protection applications. ID (at VGS=-10V) -30V -4A RDS(ON) (at VGS=-10V) < 68mΩ RDS(ON) (at VGS =-4.5V) < 105mΩ Top View DFN 3x2A Bottom View VDS S1 G1 S2 G2 1 8 2 7 D1 D1 3 6 D2 4 5 D2 S1 Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol Drain-Source Voltage VDS Gate-Source Voltage VGS TA=25°C Junction and Storage Temperature Range Thermal Characteristics Parameter Maximum Junction-to-Ambient A Maximum Junction-to-Ambient A D Maximum Junction-to-Lead Rev 1: July 2012 Steady-State Steady-State ±20 V A 1.9 W 1.2 TJ, TSTG Symbol t ≤ 10s Units V -18 PD TA=70°C Maximum -30 -3 IDM TA=25°C S2 -4 ID TA=70°C Pulsed Drain Current C Power Dissipation B G2 G1 Pin 1 Continuous Drain Current D2 D1 Top View RθJA RθJL www.aosmd.com -55 to 150 Typ 51.5 82 37 °C Max 65 100 50 Units °C/W °C/W °C/W Page 1 of 5 AON4807 Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol Parameter STATIC PARAMETERS Drain-Source Breakdown Voltage BVDSS IDSS Zero Gate Voltage Drain Current Conditions Min ID=-250µA, VGS=0V -30 -1 TJ=55°C -5 Gate-Body leakage current VDS=0V, VGS=±20V VGS(th) Gate Threshold Voltage VDS=VGS,ID=-250µA -1.3 ID(ON) On state drain current VGS=-10V, VDS=-5V -18 nA -2.3 V 54 68 76 95 VGS=-4.5V, ID=-3A 80 105 8 TJ=125°C gFS Forward Transconductance VDS=-5V, ID=-4A VSD Diode Forward Voltage IS=-1A,VGS=0V IS Maximum Body-Diode Continuous Current DYNAMIC PARAMETERS Ciss Input Capacitance Crss Reverse Transfer Capacitance Rg Gate resistance µA ±100 Static Drain-Source On-Resistance Output Capacitance Units -1.8 VGS=-10V, ID=-4A Coss Max V VDS=-30V, VGS=0V IGSS RDS(ON) Typ VGS=0V, VDS=-15V, f=1MHz VGS=0V, VDS=0V, f=1MHz A -0.78 mΩ mΩ S -1 V -2.5 A 290 pF 60 pF 40 pF 16 Ω SWITCHING PARAMETERS Qg(10V) Total Gate Charge 5.8 10 nC Qg(4.5V) Total Gate Charge 2.8 6 nC Qgs Gate Source Charge Qgd Gate Drain Charge tD(on) Turn-On DelayTime tr Turn-On Rise Time tD(off) Turn-Off DelayTime VGS=-10V, VDS=-15V, ID=-4A VGS=-10V, VDS=-15V, RL=3.75Ω, RGEN=3Ω 1.1 nC 1.3 nC 6 ns 5 ns 21 ns tf Turn-Off Fall Time 9 ns trr Body Diode Reverse Recovery Time IF=-4A, dI/dt=100A/µs 10 Qrr Body Diode Reverse Recovery Charge IF=-4A, dI/dt=100A/µs 20 ns nC A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The value in any given application depends on the user's specific board design. B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance. C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep initialTJ=25°C. D. The RθJA is the sum of the thermal impedance from junction to lead RθJL and lead to ambient. E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating. THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE. Rev 1: July 2012 www.aosmd.com Page 2 of 5 AON4807 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 20 10 -10V VDS=-5V -6V 8 -4.5V 15 -ID(A) -ID (A) 6 -4V 10 4 125°C -3.5V 5 2 25°C VGS=-3V 0 0 0 1 2 3 4 0 5 110 2 3 4 5 1.6 Normalized On-Resistance 100 VGS=-4.5V 90 RDS(ON) (mΩ Ω) 1 -VGS(Volts) Figure 2: Transfer Characteristics (Note E) -VDS (Volts) Fig 1: On-Region Characteristics (Note E) 80 70 60 50 VGS=-10V ID=-4A 1.4 17 5 VGS=-4.5V 2 ID=-3A 10 1.2 1 VGS=-10V 0.8 40 0 0 2 4 6 8 -ID (A) Figure 3: On-Resistance vs. Drain Current and Gate Voltage (Note E) 25 50 75 100 125 150 175 0 Temperature (°C) Figure 4: On-Resistance vs. Junction 18Temperature (Note E) 220 1.0E+01 ID=-4A 1.0E+00 40 1.0E-01 140 -IS (A) RDS(ON) (mΩ Ω) 180 125°C 125°C 1.0E-02 100 1.0E-03 25°C 60 25°C 1.0E-04 20 0.0 2 6 8 10 -VGS (Volts) Figure 5: On-Resistance vs. Gate-Source Voltage (Note E) Rev 1: July 2012 0.2 0.4 0.6 0.8 1.0 1.2 4 www.aosmd.com -VSD (Volts) Figure 6: Body-Diode Characteristics (Note E) Page 3 of 5 AON4807 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 10 400 VDS=-15V ID=-4A 350 Ciss 8 Capacitance (pF) -VGS (Volts) 300 6 4 250 200 150 Coss 100 2 50 0 Crss 0 0 1 2 3 4 5 6 0 Qg (nC) Figure 7: Gate-Charge Characteristics 5 10 15 20 25 -VDS (Volts) Figure 8: Capacitance Characteristics 30 10000 100.0 TA=25°C RDS(ON) limited 100µs 1.0 1ms 10ms 0.1 TJ(Max)=150°C TA=25°C Power (W) ID (Amps) 1000 10µs 10.0 100 10 10s DC 1 0.0 0.00001 0.01 0.1 1 VDS (Volts) 10 0.001 0.1 10 1000 100 Pulse Width (s) Figure 10: Single Pulse Power Rating Junction-toAmbient (Note F) Figure 9: Maximum Forward Biased Safe Operating Area (Note F) Zθ JA Normalized Transient Thermal Resistance 10 D=Ton/T TJ,PK=TA+PDM.ZθJA.RθJA 1 In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse RθJA=100°C/W 0.1 PD Single Pulse 0.01 Ton T 0.001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 Pulse Width (s) Figure 11: Normalized Maximum Transient Thermal Impedance (Note F) Rev 1: July 2012 www.aosmd.com Page 4 of 5 AON4807 Gate Charge Test Circuit & Waveform Vgs Qg -10V - - VDC + VDC Qgd Qgs Vds + DUT Vgs Ig Charge Resistive Switching Test Circuit & Waveforms RL Vds toff ton Vgs - DUT Vgs VDC td(on) t d(off) tr tf 90% Vdd + Rg Vgs 10% Vds Unclamped Inductive Switching (UIS) Test Circuit & Waveforms 2 L E AR= 1/2 LIAR Vds Vds Id - Vgs Vgs VDC + Rg BVDSS Vdd Id I AR DUT Vgs Vgs Diode Recovery Test Circuit & Waveforms Q rr = - Idt Vds + DUT Vgs Vds Isd Vgs Ig Rev 1: July 2012 L -Isd + Vdd t rr dI/dt -I RM Vdd VDC - -I F -Vds www.aosmd.com Page 5 of 5