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CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CE TEST REPORT Product Name : Notebook Model No. MS-1688, CX620Z : (Z=0~9, A~Z or blank), A6205 Applicant : Micro-Star INT’L CO., LTD. Address : No. 69, Lide St., Jhonghe City, Taipei County 235, Taiwan Date of Receipt : Dec. 11, 2009 Issued Date : Dec. 22, 2009 Report No. : TECE0912052 The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF The test report shall not be reproduced except in full without the written approval of Cerpass Technology Corp. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 1 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment: Product Name Model No. Trade Name : Notebook MS-1688, CX620Z (Z=0~9, A~Z or : blank), A6205 : MSI This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: EN 55022:2006/A1:2007 (Class B) EN 61000-3-2 : 2006 EN 61000-3-3 : 1995/ A1:2001/ A2:2005 EN 55024 : 1998/ A1:2001/ A2:2003 IEC 61000-4-2 : 1995/ A1:1998/ A2:2000 IEC 61000-4-3 : 2006 IEC 61000-4-4 : 2004 IEC 61000-4-5 : 2005 IEC 61000-4-6 : 2006 IEC 61000-4-8 : 2001 IEC 61000-4-11 : 2004 The following importer/manufacturer is responsible for this declaration: Company Name : Company Address : Telephone : Facsimile : Person is responsible for marking this declaration: Name (Full Name) Position/ Title Date Legal Signature Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 2 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Statement of Conformity Product Name : Notebook MS-1688, CX620Z (Z=0~9, A~Z or Model No. : blank), A6205 Trade Name : MSI Company Name : Micro-Star INT’L CO., LTD. This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied: EN 55022:2006/A1:2007 (Class B) EN 61000-3-2 : 2006 EN 61000-3-3 : 1995/ A1:2001/ A2:2005 EN 55024 : 1998/ A1:2001/ A2:2003 IEC 61000-4-2 : 1995/ A1:1998/ A2:2000 IEC 61000-4-3 : 2006 IEC 61000-4-4 : 2004 IEC 61000-4-5 : 2005 IEC 61000-4-6 : 2006 IEC 61000-4-8 : 2001 IEC 61000-4-11 : 2004 Test Laboratory Senior Manager / Jonson Lee The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 3 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. Test Report Certification Issued Date: Dec. 22, 2009 Applicant : Micro-Star INT’L CO., LTD. Address : No. 69, Lide St., Jhonghe City, Taipei County 235, Taiwan Equipment : Notebook Model No. : MS-1688, CX620Z (Z=0~9, A~Z or blank), A6205 Rated Voltage : AC 230V/ 50Hz EUT Voltage : AC 100-240V, 50-60Hz Applicable Standard : EN 55022:2006/A1:2007 (Class B) EN 55024 : 1998/ A1:2001/ A2:2003 Report No. : TECE0912052 Trade Name : MSI Test Result : Complied Cerpass Technology Corp. 2F-11, No. 3, Yuan Qu St. (Nankang Software Park), Performed Location : Taipei, Taiwan 115, R.O.C. Tel:886-2-2655-8100 Fax:886-2-2655-8200 Documented By Specialist / Fion Lin Reviewed By Assistant Manager / Clark Lin Approved By Senior Manager / Jonson Lee Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 4 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Laboratory Information We , Cerpass Technology Corp., are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes: Taiwan R.O.C. : BSMI, NCC, TAF Germany : TUV SUD USA : FCC Japan : VCCI The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site: http://www.cerpass.net/big5/about_03.html The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.cerpass.net/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: Taipei(Taiwan) Testing Laboratory: 2F-11, No. 3, Yuan Qu St. (Nankang Software Park), Taipei, Taiwan 115, R.O.C. Taipei(Taiwan) (OATS1-SD) Testing Laboratory: No. 7-2, Moshihkeng, Fongtian Village, Shihding Township, Taipei County, Taiwan, R.O.C. Suzhou(China) Testing Laboratory: No.66, Tangzhuang Road, Suzhou Industrial Park, Jiangsu 215006, China TEL: +86-512-6917-5888#3803 FAX: +86-512-6917-5666 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 5 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Contents Test Report Certification ................................................................................................................................... 4 1. Declaration of Conformity and the CE Mark ............................................................................................ 8 Test Configuration of Equipment under Test................................................................................................ 11 1.6. Feature of Equipment under Test................................................................................................... 11 1.7. Pretest Mode .................................................................................................................................. 13 1.8. Test Manner ................................................................................................................................... 14 1.9. Description of Test System ............................................................................................................ 15 1.10. Connection Diagram of Test System.............................................................................................. 16 1.11. General Information of Test ............................................................................................................ 17 1.12. Measurement Uncertainty .............................................................................................................. 17 1.13. History of this test report ................................................................................................................ 18 2. Test of Conducted Emission .................................................................................................................... 19 2.1. Test Limit ........................................................................................................................................ 19 2.2. Test Procedures ............................................................................................................................. 20 2.3. Typical Test Setup .......................................................................................................................... 20 2.4. Measurement Equipment ............................................................................................................... 20 2.5. Test Result and Data ...................................................................................................................... 21 2.6. Test Photographs of Power Port .................................................................................................... 26 2.7. Test Photographs of Telecommunication Port ............................................................................... 27 3. Test of Radiated Emission ....................................................................................................................... 28 3.1. Test Limit........................................................................................................................................ 28 3.2. Test Procedures ............................................................................................................................. 29 3.3. Typical Test Setup .......................................................................................................................... 30 3.4. Measurement Equipment ............................................................................................................... 30 3.5. Test Result and Data ...................................................................................................................... 31 3.6. Test Photographs ........................................................................................................................... 37 4. Harmonics Test ......................................................................................................................................... 38 4.1. Limits of Harmonics Current Measurement ................................................................................... 38 4.2. Typical Test Setup .......................................................................................................................... 39 4.3. Measurement Equipment ............................................................................................................... 39 4.4. Test Result and Data ...................................................................................................................... 39 5. Voltage Fluctuations Test ......................................................................................................................... 40 5.1. Test Procedure ............................................................................................................................... 40 5.2. Typical Test Setup .......................................................................................................................... 40 5.3. Measurement Equipment ............................................................................................................... 40 5.4. Test Result and Data ...................................................................................................................... 41 5.5. Test Photographs ........................................................................................................................... 43 6. Electrostatic Discharge Immunity Test ................................................................................................... 44 6.1. Test Procedure ............................................................................................................................... 44 6.2. Test Setup for Tests Performed in Laboratory................................................................................ 45 6.3. Test Severity Levels ....................................................................................................................... 46 6.4. Measurement Equipment ............................................................................................................... 46 6.5. Test Result and Data ...................................................................................................................... 47 6.6. Test Photographs ........................................................................................................................... 48 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 6 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 7. Radio Frequency electromagnetic field immunity test ......................................................................... 49 7.1. Test Procedure ............................................................................................................................... 49 7.2. Typical Test Setup .......................................................................................................................... 49 7.3. Test Severity Levels ....................................................................................................................... 50 7.4. Measurement Equipment ............................................................................................................... 50 7.5. Test Result and Data ...................................................................................................................... 51 7.6. Test Photographs ........................................................................................................................... 52 8. Electrical Fast Transient/ Burst Immunity Test ...................................................................................... 53 8.1. Test Procedure ............................................................................................................................... 53 8.2. Typical Test Setup .......................................................................................................................... 54 8.3. Test Severity Levels ....................................................................................................................... 54 8.4. Measurement Equipment ............................................................................................................... 54 8.5. Test Result and Data ...................................................................................................................... 55 8.6. Test Photographs ........................................................................................................................... 56 9. Surge Immunity Test ................................................................................................................................. 57 9.1. Test Procedure ............................................................................................................................... 57 9.2. Typical Test Setup .......................................................................................................................... 58 9.3. Test Severity Level ......................................................................................................................... 58 9.4. Measurement Equipment ............................................................................................................... 58 9.5. Test Result and Data ...................................................................................................................... 59 9.6. Test Photographs ........................................................................................................................... 60 10. Conduction Disturbances induced by Radio-Frequency Fields .......................................................... 61 10.1. Test Procedure ............................................................................................................................... 61 10.2. Typical Test Setup .......................................................................................................................... 62 10.3. Test Severity Levels ....................................................................................................................... 62 10.4. Measurement Equipment ............................................................................................................... 62 10.5. Test Result and Data ...................................................................................................................... 63 10.6. Test Photographs ........................................................................................................................... 64 11. Power Frequency Magnetic Field Immunity Test ................................................................................... 65 11.1. Test Setup ...................................................................................................................................... 65 11.2. Test Severity Levels ....................................................................................................................... 65 11.3. Measurement Equipment ............................................................................................................... 65 11.4. Test Result and Data ...................................................................................................................... 66 11.5. Test Photographs ........................................................................................................................... 67 12. Voltage Dips and Voltage Interruptions Immunity Test Setup .............................................................. 68 12.1. Test Conditions............................................................................................................................... 68 12.2. Test Setup ...................................................................................................................................... 68 12.3. Measurement Equipment ............................................................................................................... 68 12.4. Test Result and Data ...................................................................................................................... 69 12.5. Test Photographs ........................................................................................................................... 70 Appendix A. Photographs of EUT………………………….……..…..…..…..………..………..…..…....A1 ~ A70 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 7 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1. Declaration of Conformity and the CE Mark There are three possible procedures pertaining to the declaration of conformity: 1.1. Conformity Testing and Declaration of Conformity by the Manufacturer or His Authorized Representative Established within the Community or by an Importer. - Article 10 (1) of the EMC Directive, - § 3 (1) no. 2a of the EMC Act. 1.2. Declaration of Conformity Issued by the Manufacturer or His Authorized Representative Established within the Community or by an Importer Following Testing of the Product and Issued of an EC certificate of conformity by a competent body. - Article 10 (2) of the EMC Directive, - § 3 (1) no. 2b of the EMC Act. 1.3. Declaration of Conformity Issued by the Manufacturer or His Authorized Representative Established within the Community or by an Importer Following Testing and Certification of the Product by a Notified Body. - Article 10 (5) of the EMC Directive, - § 3 (1) no. 2b of the EMC Act (radio transmitting installations). 1.4. Specimen For The CE Marking Of Electrical / Electronical Equipment The components of the CE marking shall have substantially the same vertical dimension, which may not be less than 5 mm. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 8 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 1.5. List of Test Equipment a. Conducted Emission Instrument Manufacturer Model No. Serial No. Calibration Date EMI Receiver R&S ESCI 100443 2008/12/19 LISN NSLK 8127 Schwarzbeck 8127-516 2009/05/15 LISN ROLF HEINE NNB-2/16Z 03/10058 2009/04/18 ISN TESEQ GMBH ISN T8 24315 2009/06/15 b. Radiated Emission Instrument Manufacturer Model No. Serial No. Calibration Date Bilog Antenna Schaffner CBL6112B 2840 2009/05/14 EMI Receiver R&S ESCI 100443 2008/12/19 Amplifier Agilent 8447D 2944A10593 2009/05/21 APC AFC-11005 F103120008 N/A AC Power Converter c.Harmonics Test Instrument Manufacturer Model No. Serial No. Calibration Date Power & Harmonics Analyzer TTI HA1600 198226 2009/12/18 d. Electrostatic Discharge Immunity Instrument Manufacturer Model No. ESD SIMULATOR Schaffner NSG438 Serial No. Calibration Date 878 2009/06/23 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 9 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. e. Radio Frequency electromagnetic field immunity Instrument Serial No. Calibration Date Manufacturer Model No. Amplifiers 80-1000MHz/100 SCHAFFNER W CBA9413B 43510 N/A Antenna SCHAFFNER CBL6141A 4257 N/A Power Meter Boonton 4231A-01 115902 2009/10/12 Field Probe HOLADAY HI-6005 00035824 2009/01/03 Signal Generator HP 8648C 3629U00 612 2009/10/07 Power Sensor Boonton 51011-EMC 33312 2009/09/29 Serial No. Calibration f. Electrical Fast Transient/ Burst Immunity Instrument Manufacturer Model No. EMC Pro KeyTek EMC Pro Date 0309207 2009/04/28 Serial No. Calibration g. Surge Immunity Instrument Manufacturer Model No. EMC Pro KeyTek EMC Pro Date 0309207 2009/04/28 h. Conduction Disturbances induced by Radio-Frequency Fields Instrument Manufacturer Model No. Serial No. Calibration Date CS GENERATOR Schaffner NSG 2070 1059 2009/11/23 CDN (M2+M3) Schaffner M016 20056 2009/11/24 CDN Schaffner T400 19818 2009/11/24 EM-CLAMP Schaffner KEMZ 801 19793 2009/11/24 i. Power Frequency Magnetic Field Immunity Instrument Manufacturer Model No. Serial No. Calibration Date EMC Pro KeyTek EMC Pro 0309207 2009/04/28 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 10 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Test Configuration of Equipment under Test 1.6. Feature of Equipment under Test Item Brand CPU Intel GPU ATI LED Panel CMO Samsung Model No. CPU,CPU+GPU,CORE I7 CPU M620,INTEL/2.66GHz(Q3G5),2.66GHz,PGA-988pin CPU,CPU+GPU,CORE I7 CPU U620,INTEL/1.06GHz(Q3G2),1.06GHz,BGA-1288pin CPU,CPU+GPU,CORE I5 CPU M540,INTEL/2.53GHz(Q3G9),2.53GHz,PGA-988pin CPU,CPU+GPU,CORE I5 CPU M520,INTEL/2.4GHz(Q3GB),2.4GHz,PGA-988pin CPU,CPU+GPU,CORE I5 CPU M430,INTEL/2.26GHz(Q3LR),2.26GHz,PGA-988pin CPU, CPU+GPU, I3+330M, INTEL/2.13GHz, PGA-988pin Park LP Park XT 15.6” \ N156B6-L04 15.6” \ LTN156AT05-H AUO 15.6” \ B156XW02 CPT 15.6” \ CLAA156WA11A HANNSTAR 16” \ HSD160PHW1-B Samsung 16” \ LTN160AT06-A01 WD5000BEVT \ 500GB, 5400rpm WD3200BEKT \ 320GB, 7200rpm WD3200BEVT \ 320GB, 5400rpm WD WD2500BEVT \ 250GB, 5400rpm WD2500BEVT \ 250GB, 5400rpm WD3200BEVT \ 320GB, 5400rpm WD5000BEVT \ 500GB, 5400rpm WD6400BEVT \ 640GB, 5400rpm MK5055GSX \ 500GB, 5400rpm HDD (SATA) Toshiba MK3263GSX \ 320GB, 5400rpm MK3265GSX \ 320GB, 5400rpm MK2555GSX \ 250GB, 5400rpm ST9500325AS \ 500GB, 5400rpm Seagate ST9500420AS \ 500GB, 7200rpm ST9320325AS \ 320GB, 5400rpm ST9250315AS \ 250GB, 5400rpm MJA2500BH \ 500GB, 5400rpm Fujitsu MJA2320BH \ 320GB, 5400rpm MHZ2320BJ \ 320GB, 7200rpm MJA2250BH \ 250GB, 5400rpm Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 11 of 70 CERPASS TECHNOLOGY CORP. Item Brand HDD (SATA) Hitachi Hynix Samsung DRAM (DDRIII) Hynix Samsung Transcend HLDS HLDS Optiarc ODD TSST PLDS HLDS WLAN Atheros Bluetooth CSR WLAN+BT Combo MSI SYNAPTICS Touch Pad SENTELIC BISON Webcam AzureWave Celxpert Battery MiTAC Celxpert LI SHIN Adapter Delta Chicony Keyboard SUNREX Report No.: TECE0912052 Model No. HTS545050B9A300 \ 500GB, 5400rpm HTS545032B9A300 \ 320GB, 5400rpm HTS545025B9A300 \ 250GB, 5400rpm HMT112S6BFR6C-G7N0 \ 1GB M471B2874EH1-CF8 \ 1GB HMT125S6BFR8C-G7N0 \ 2GB M471B5673EH1-CF8 \ 2GB TS256MSK64V1U \ 2GB GT10N GT30N AD-7560S TS-L633 DS-8A3S CT21N AR5B95 BSMAN1 MS-3870 TM-00300-000 TPA2D2IC99RA1 BN29M6SSB-000 \ 1.3M/RIGHT PLUG AM-1C016 \ 1.3M/RIGHT PLUG BTY-L74 \ 6 CELL BTY-L74 \ 6 CELL BTY-L75 \ 9 CELL LSE0202C1990 ADP-90SB BB MP-09C13U4-3591 V111922AK1 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 12 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1.7. Pretest Mode y The test modes for pretest as follow y Test Mode 1 was the worst test result, it was chosen to be the final test mode. Item Mode 1 Mode 2 CPU Intel \ 2.66GHz Intel \ 1.06GHz GPU ATI \ Park LP ATI \ Park XT LED Panel HANNSTAR \ HSD160PHW1-B \16” AUO \ B156XW02 \ 15.6” HDD WD \ WD6400BEVT \ 640GB Toshiba \ MK5055GSX \ 500GB DRAM Hynix \ HMT125S6BFR8C-G7N0 \ 2GB Transcend \ TS256MSK64V1U \ 2GB ODD Optiarc \ AD-7560S TSST \ TS-L633 Touch Pad SYNAPTICS \ TM-00300-000 SENTELIC \ TPA2D2IC99RA1 Webcam BISON \ BN29M6SSB-000 AzureWave \ AM-1C016 Battery Celxpert \ BTY-L75 \ 9 CELL Celxpert \ BTY-L74 \ 6 CELL Adapter LI SHIN \ LSE0202C1990 Delta \ ADP-90SB BB Bluetooth CSR \ BSMAN1 MSI \ MS-3870 WLAN Atheros \ AR5B95 MSI \ MS-3870 Item CPU GPU LED Panel HDD DRAM ODD Touch Pad Webcam Battery Adapter Bluetooth WLAN Mode 3 Intel \ 2.53GHz ATI \ Park LP CPT \ CLAA156WA11/A \ 15.6” Seagate \ ST9500420AS \ 500GB Hynix \ HMT112S6BFR6C-G7N0 \ 1GB PLDS \ DS-8A3S SYNAPTICS \ TM-00300-000 BISON \ BN29M6SSB-000 MiTAC \ BP-M173BK-32 \ 6 CELL LI SHIN \ LSE0202C1990 CSR \ BSMAN1 Atheros \ AR5B95 Mode 4 Intel \ 2.4GHz ATI \ Park XT CMO \ N156B6-L04 \ 15.6” Fujitsu \ MJA2500BH \ 500GB Samsung \ M471B2874EH1-CF8 \ 1GB HLDS \ CT21N SENTELIC \ TPA2D2IC99RA1 AzureWave \ AM-1C016 Celxpert \ BTY-L75 \ 9 CELL Delta \ ADP-90SB BB MSI \ MS-3870 MSI \ MS-3870 Item Mode 5 Mode 6 CPU GPU LED Panel HDD DRAM ODD Touch Pad Webcam Battery Adapter Bluetooth WLAN Intel \ 2.26GHz ATI \ Park LP Samsung \ LTN156AT05-H \ 15.6” Seagate \ ST9500325AS \ 500GB Hynix \ HMT125S6BFR8C-G7N0 \ 2GB HLDS \ GT10N SYNAPTICS \ TM-00300-000 BISON \ BN29M6SSB-000 Celxpert \ BTY-L74 \ 6 CELL LI SHIN \ LSE0202C1990 CSR \ BSMAN1 Atheros \ AR5B95 Intel \ 2.13GHz ATI \ Park XT Samsung \ LTN160AT06-A01 \ 16” Hitachi \ HTS545050B9A300 \ 500GB Samsung \ M471B5673EH1-CF8 \ 2GB HLDS \ GT30N SENTELIC \ TPA2D2IC99RA1 AzureWave \ AM-1C016 MiTAC \ BP-M173BK-32 \ 6 CELL Delta \ ADP-90SB BB MSI \ MS-3870 MSI \ MS-3870 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 13 of 70 CERPASS TECHNOLOGY CORP. Item CPU GPU LED Panel HDD DRAM ODD Touch Pad Webcam Battery Adapter Bluetooth WLAN Report No.: TECE0912052 Mode 7 Intel \ 2.66GHz ATI \ Park XT Samsung \ LTN160AT06-A01 \ 16” Hitachi \ HTS545050B9A300 \ 500GB Samsung \ M471B5673EH1-CF8 \ 2GB HLDS \ GT30N SENTELIC \ TPA2D2IC99RA1 AzureWave \ AM-1C016 MiTAC \ BP-M173BK-32 \ 6 CELL Delta \ ADP-90SB BB CSR \ BSMAN1 Atheros \ AR5B95 1.8. Test Manner a. During testing, the interface cables and equipment positions were varied according to Europe Standard EN55022 Class B. b. The complete test system included remote workstation, Monitor, Earphone, eSATA HDD, USB 2.0 HDD, SD Card and EUT for EMI test. The remote workstation included Notebook. c. According to pretest modes (please refer to page 8, 9), test mode 1 was the worst test result, it was chosen to be the following test mode for conduction and radiation test: Mode 1: Panel sorce: HANNSTAR \ HSD160PHW1-B \ 16”, HDMI: 1366 x 768 60Hz, LAN: 1Gbps Mode 2: Panel sorce: AUO \ B156XW02 \ 15.6,VGA: 1366 x 768 60Hz, LAN: 1Gbps cause “mode 1” generated the worst test result, it was reported as final data. d. The result of disturbances at telecommunication ports test as follow: Mode 1: ISN LAN (10M) Mode 2: ISN LAN (100M) Mode 3: ISN LAN (1000M) e. The result of EMS test as follow: Mode 1. Panel sorce: HANNSTAR \ HSD160PHW1-B \16”, HDMI: 1366 x 768 60Hz, LAN: 1Gbps Mode 2: Panel sorce: AUO \ B156XW02 \ 15.6, VGA: 1366 x 768 60Hz, LAN: 1Gbps f. An executive program, “WINFCC.EXE” under WIN XP, which generates a complete line of continuously repeating “H” pattern was used as the test software. The program was executed as follows: 1. Turn on the power of all equipment. 2. The PC reads the test program from the hard disk drive and runs it. 3. The PC sends “H” messages to the monitor, and the monitor displays “H” patterns on the screen. 4. The PC sends “H” messages to the internal Hard Disk, and the Hard Disk reads and writes the message. 5. Repeat the steps from 2 to 4. g. An executive program, “WINTHRAX.EXE” under WIN XP was executed to read and write data from USB 2.0 HDD & eSATA HDD. h. An executive program, “PING.EXE” under WIN XP was executed to transmit and receive data to the remote workstation through LAN. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 14 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1.9. Description of Test System EMI Device Manufacturer Model No. Monitor DELL 2408WFPb Earphone MIC MIC-4 USB 2.0 HDD*2 Terasys F12UF eSATA HDD STARDOM iTank-i302 Kingstone SD Card Remote workstation Notebook IBM SDC-2GB Description Power Cable, Adapter Unshielding 1.8m Data Cable, VGA Shielding 1.35 m Data Cable, HDMI Shielding, 1.35m Data Cable, Audio Shielding 1.35m Power Cable, Adapter Unshielding 1.8m Data Cable, USB Shielding 1.6m Power Cable, Adapter Unshielding 1.8m Data Cable, eSATA Shielding 1.8m N/A R40 Power Cable, Unshielding 1.8m Use Cable: Cable RJ45 Quantity 1 Description Unshielding, 10.0m EMS Device Manufacture r Model No. Monitor DELL 2408WFPb Earphone MIC Flash Memory*2 TranScend Remote workstation Notebook Dell e-SATA 3.5” iTank SD Card Kingston Giga HUB NETGAR Description MIC-4 JF 150 1GB Power Cable, Adapter Unshielding 1.8m Data Cable, HDMI Shielding, 1.35m Data Cable, Audio Shielding 1.35m N/A PP10L Series-i302 SD-C02G JGS516 Power Cable, Unshielding 1.8m Power Cable, Unshielding 1.8m N/A Power Cable, Unshielding 1.8m Use Cable: Cable RJ45 Quantity 1 Description Unshielding, 10.0m Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 15 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1.10. Connection Diagram of Test System 1. The VGA or HDMI cable is connected from EUT to the Monitor. 2. The eSATA cable is connected from EUT to the eSATA HDD. 3. The USB cables (*2) are connected from EUT to the USB 2.0 HDD. 4. The Audio cable is connected from EUT to the Earphone. 5. The RJ45 cable is connected from EUT to the remote workstation. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 16 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1.11.General Information of Test Test Site : Cerpass Technology Corp. 2F-11, No. 3, Yuan Qu St. (Nankang Software Park), Taipei, Taiwan 115, R.O.C. Test Site Location (OATS1-SD): No. 7-2, Moshihkeng, Fongtian Village, Shihding Township, Taipei County, Taiwan, R.O.C. FCC Registration Number : TW1049, TW1056, 982971, 488071 IC Registration Number : 4934C-1, 4934D-1 T-543 for Telecommunication Test C-3328 for Conducted emission test VCCI Registration Number : R-3013 for Radiated emission test Test Voltage: AC 230V/ 50Hz Test in Compliance with: EMI Test (conduction and radiation) : European Standard EN 55022:2006/A1:2007 Class B Harmonics Test : European Standard EN 61000-3-2 :2006 Voltage Fluctuations Test : European Standard EN 61000-3-3 :1995/ A1:2001/ A2:2005 EMS Test : European Standard EN 55024 :1998/ A1:2001/ A2:2003 ESD : IEC 61000-4-2 :1995/ A1:1998/ A2:2000 RS : IEC 61000-4-3 :2006 EFT : IEC 61000-4-4 :2004 SURGE : IEC 61000-4-5 :2005 CS : IEC 61000-4-6 :2006 Power Frequency Magnetic Field : IEC 61000-4-8 :2001 DIPS : IEC 61000-4-11 :2004 Frequency Range Investigated : Conducted Emission Test: from 150kHz to 30 MHz Radiated Emission Test: from 30 MHz to 6,000 MHz Test Distance : The test distance of radiated emission below 1GHz from antenna to EUT is 10 M. The test distance of radiated emission above 1GHz from antenna to EUT is 3 M. 1.12.Measurement Uncertainty Measurement Item Measurement Frequency Polarization Uncertainty Conducted Emission 9 kHz ~ 30 MHz Radiated Emission 30 MHz ~ 6GHz LINE / NEUTRAL Vertical Horizontal 2.71 dB 3.89 dB 3.59 dB Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 17 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 1.13.History of this test report ORIGINAL. Additional attachment as following record: Attachment No. Issue Date Description Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 18 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 2. Test of Conducted Emission 2.1. Test Limit Conducted Emissions were measured from 150 kHz to 30 MHz with a bandwidth of 9 kHz and return leads of the EUT according to the methods defined in European Standard EN 55022. The EUT was placed on a nonmetallic stand in a shielded room 0.8 meters above the ground plane as shown in section 4.2. The interface cables and equipment positioning were varied within limits of reasonable applications to determine the position producing maximum conducted emissions. Table 1 Class B Line Conducted Emission Limits: Limits (dB µ V) Frequency range (MHz) Quasi Peak Average 0.15 to 0.50 66 to 56 56 to 46 0.50 to 5 56 46 5. to 30. 60 50 Note 1: The lower limits shall apply at the transition frequencies. Note 2:The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz to .50MHz. Table 2 - Limits of conducted common mode (asymmetric mode) disturbance at telecommunication ports in the frequency range 0.15 MHz to 30 MHz for class B equipment. Frequency range (MHz) 0.15 to 0.5 0.5 to 30 Voltage limits dB(μV) Quasi-peak Average 84 to 74 74 to 64 74 64 Current limits dB(μA) Quasi-peak Average 40 to 30 30 to 20 30 20 Note 1: The limits decrease linearly with the logarithm of the frequency in the range 0.15 to 0.5 MHz. Note 2: The current and voltage disturbance limits are derived for use with an impedance stabilization network (ISN) which presents a common mode (asymmetric mode) impedance of 150Ω to the telecommunication under test (conversion factor is 20 log10 150/1 = 44dB). Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 19 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 2.2. Test Procedures a. The EUT was placed on a desk 0.8 meters height from the metal ground plane and 0.4 meter from the conducting wall of the shielding room and it was kept at least 0.8 meters from any other grounded conducting surface. b. Connect EUT to the power mains through a line impedance stabilization network (LISN). c. All the support units are connecting to the other LISN. d. The LISN provides 50 ohm coupling impedance for the measuring instrument. e. The CISPR states that a 50 ohm, 50 micro-Henry LISN should be used. f. Both sides of AC line were checked for maximum conducted interference. g. The frequency range from 150 kHz to 30 MHz was searched h. Set the test-receiver system to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. 2.3. Typical Test Setup 10cm EUT 80cm 80cm AE 80cm 40cm LISN ISN LISN 40cm 2.4. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date EMI Receiver R&S ESCI 100443 2008/12/19 LISN NSLK 8127 Schwarzbeck 8127-516 2009/05/15 LISN ROLF HEINE NNB-2/16Z 03/10058 2009/04/18 ISN TESEQ GMBH ISN T8 24315 2009/06/15 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 20 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 2.5. Test Result and Data 2.5.1 Conducted Emission for Power Port Test Data Power : AC 230V Pol/Phase : LINE Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 25 °C Memo : Conduction 1 Humidity : 57 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 21 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : NEUTRAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 25 °C Memo : Conduction 1 Humidity : 57 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 22 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 2.5.2 Conducted Emission for Telecommunication Port Test Data Power : AC 230V Temperature : 25 °C Test Mode 1 : ISN LAN (10M) Humidity : 57 % Memo : Conduction 1 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 23 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Temperature : 25 °C Test Mode 2 : ISN LAN (100M) Humidity : 57 % Memo : Conduction 1 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 24 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Temperature : 25 °C Test Mode 3 : ISN LAN (1000M) Humidity : 57 % Memo : Conduction 1 Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 25 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 2.6. Test Photographs of Power Port Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 26 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 2.7. Test Photographs of Telecommunication Port Telecommunication Port (RJ45) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 27 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 3. Test of Radiated Emission 3.1. Test Limit The EUT shall meet the limits of below Table when measured at the measuring distance R in accordance with the methods described in European Standard EN 55022 Clause 10. If the reading on the measuring receiver shows fluctuations close to the limit, the reading shall be observed for at least 15 s at each measurement frequency; the highest reading shall be recorded, with the exception of any brief isolated high reading, which shall be ignored. Table – Limits for radiated disturbance of class B ITE at a measuring distance of 10 m Frequency range Quasi-peak limits MHz dB(μV/m) 30 to 230 30 230 to 1000 37 NOTE 1 The lower limit shall apply at the transition frequency. NOTE 2 Additional provisions may be required for cases where interference occurs. The EUT shall meet the limits of below Table when measured in accordance with the method described in European Standard EN 55022 Clause 10 and the conditional testing procedure described below. Table – Limits for radiated disturbance of class B ITE at a measuring distance of 3 m Frequency range Average limit GHz dB(μV/m) 1 to 3 50 3 to 6 54 NOTE The lower limit applies at the transition frequency. • Conditional Peak limits dB(μV/m) 70 74 testing procedure: The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes. If the highest frequency of the internal sources of the EUT is less than 108 MHz, the measurement shall only be made up to 1 GHz. If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz, the measurement shall only be made up to 2 GHz. If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz, the measurement shall only be made up to 5 GHz. If the highest frequency of the internal sources of the EUT is above 1 GHz, the measurement shall be made up to 5 times the highest frequency or 6 GHz, whichever is less. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 28 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 3.2. Test Procedures a. The EUT was placed on a rotatable table top 0.8 meter above ground. b. The EUT was set 3/10 meters from the interference receiving antenna which was mounted on the top of a variable height antenna tower. c. The table was rotated 360 degrees to determine the position of the highest radiation. d. The antenna is a half wave dipole and its height is varied between one meter and four meters above ground to find the maximum value of the field strength both horizontal polarization and vertical polarization of the antenna are set to make the measurement. e. For each suspected emission the EUT was arranged to its worst case and then tune the antenna tower (from 1 M to 4 M) and turn table (from 0 degree to 360 degrees) to find the maximum reading. f. Set the test-receiver system to Peak Detect Function and specified bandwidth with Maximum Hold Mode. g. If the emission level of the EUT in peak mode was 3 dB lower than the limit specified, then testing will be stopped and peak values of EUT will be reported, otherwise, the emissions which do not have 3 dB margin will be repeated one by one using the quasi-peak method and reported. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 29 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 3.3. Typical Test Setup Antenna Equipment under Test * Test distance Turn Table 0.8M Ground Plane Receiver 3.4. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date Bilog Antenna Schaffner CBL6112B 2840 2009/05/14 EMI Receiver R&S ESCI 100443 2008/12/19 Amplifier Agilent 8447D 2944A10593 2009/05/21 AC Power Converter APC AFC-11005 F103120008 N/A Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 30 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 3.5. Test Result and Data Power : AC 230V Pol/Phase : VERTICAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 31 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : VERTICAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 32 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : HORIZONTAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 33 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : HORIZONTAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 34 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : VERTICAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 35 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Power : AC 230V Pol/Phase : HORIZONTAL Test Mode 1 : HDMI: 1366 x 768 60Hz, LAN: 1Gbps Temperature : 20 °C Memo : Open site 2 Humidity : 65 % Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 36 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 3.6. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 37 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 4. Harmonics Test 4.1. Limits of Harmonics Current Measurement Limits for Class A equipment Harmonics Max. Permissible Order harmonics n current A Odd harmonics 3 2.30 5 1.14 7 0.77 9 0.40 11 0.33 13 0.21 15<=n<=39 0.15¯15/n Even harmonics 2 1.08 4 0.43 6 0.30 8<=n<=40 0.23¯8/n Harmonics Order n 3 5 7 9 11 13 15<=n<=39 Limits for Class D equipment Max. Permissible Max. Permissible harmonics current per harmonics current watt mA/W A Odd Harmonics only 3.4 2.30 1.9 1.14 1.0 0.77 0.5 0.40 0.35 0.33 0.30 0.21 3.85/n 0.15 x15/n NOTE: 1. Class A and Class D are classified according to item section 5 of EN 61000-3-2: 2006. 2. According go section 7 of EN 61000-3-2: 2006, the above limits for all equipment except for lighting equipment are for all applications having a rated power > 75 W and no limits apply for equipment with a rated power up to and including 75 W. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 38 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 4.2. Typical Test Setup 4.3. Measurement Equipment Instrument Manufacturer Model No. Serial No. Power & Harmonics Analyzer TTI HA1600 198226 Calibration Date 2009/12/18 4.4. Test Result and Data As specified on clause 7 and figure Z1 of EN 61000-3-2:2006, the limits are not specified for equipment with a rated power of 75W or less. The EUT meets the above condition, so it conforms to EN 61000-3-2 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 39 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 5. Voltage Fluctuations Test 5.1. Test Procedure The equipment shall be tested under the conditions of Clause 5. The total impedance of the test circuit, excluding the appliance under test, but including the internal impedance of the supply source, shall be equal to the reference impedance. The stability and tolerance of the reference impedance shall be adequate to ensure that the overall accuracy of ±8% is achieved during the whole assessment procedure. 5.2. Typical Test Setup 5.3. Measurement Equipment Instrument Manufacturer Model No. Serial No. Power & Harmonics Analyzer TTI HA1600 198226 Calibration Date 2009/12/18 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 40 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 5.4. Test Result and Data Basic Standard : EN 61000-3-3 Final Test Result : PASS Test Data : Dec. 15, 2009 Temperature : 16 ℃ Test Mode : Adapter: LSE0202C1990 Relative Humidity : 50 % Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 41 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Basic Standard : EN 61000-3-3 Final Test Result : PASS Test Data : Dec. 15, 2009 Temperature : 16 ℃ Test Mode : Adapter: ADP-90SB BB Relative Humidity : 50 % Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 42 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 5.5. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 43 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 6. Electrostatic Discharge Immunity Test 6.1. Test Procedure a. In the case of air discharge testing the climatic conditions shall be within the following ranges: - ambient temperature: 15℃ to 35℃; - relative humidity : 30％ to 60％; - atmospheric pressure : 86 KPa (860 mbar) to 106 KPa (1060 mbar). b. Test programs and software shall be chosen so as to exercise all normal modes of operation of the EUT. The use of special exercising software is encouraged, but permitted only where it can be shown that the EUT is being comprehensively exercised. c. The test voltage shall be increased from the minimum to the selected test severity level, in order to determine any threshold of failure. The final severity level should not exceed the product specification value in order to avoid damage to the equipment. d. The test shall be performed with both air discharge and contact discharge. On reselected points at least 10 single discharges (in the most sensitive polarity) shall be applied on air discharge. On reselected points at least 25 single discharges (in the most sensitive polarity) shall be applied on contact discharge. e. For the time interval between successive single discharges an initial value of one second is recommended. Longer intervals may be necessary to determine whether a system failure has occurred. f. In the case of contact discharges, the tip of the discharge electrode shall touch the EUT before the discharge switch is operated. g. In the case of painted surface covering a conducting substrate, the following procedure shall be adopted : If the coating is not declared to be an insulating coating by the equipment manufacturer, then the pointed tip of the generator shall penetrate the coating so as to make contact with the conducting substrate. Coating declared as insulating by the manufacturer shall only be submitted to the air discharge. The contact discharge test shall not be applied to such surfaces. h. In the case of air discharges, the round discharge tip of the discharge electrode shall be approached as fast as possible (without causing mechanical damage) to touch the EUT . After each discharge, the ESD generator (discharge electrode) shall be removed from the EUT. The generator is then retriggered for a new single discharge. This procedure shall be repeated until the discharges are completed. In the case of an air discharge test, the discharge switch, which is used for contact discharge, shall be closed. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 44 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 6.2. Test Setup for Tests Performed in Laboratory VCP: 0.5x0.5 m Table Size 1.6LX0.8WX0.8H m 470K ohm EUT 10cm 470K ohm 10cm 470K ohm HCP 1.6mx0.8m 470K ohm GRP The test setup consists of the test generator, EUT and auxiliary instrumentation necessary to perform DIRECT and INDIRECT application of discharges to the EUT as applicable, in the follow manner : a. Contact Discharge to the conductive surfaces and to coupling plane; b. Air Discharge at insulating surfaces. The preferred test method is that of type tests performed in laboratories and the only accepted method of demonstrating conformance with this standard. The EUT was arranged as closely as possible to arrangement in final installed conditions. A ground reference plane was provided on the floor of the test site. It was a metallic sheet (copper or aluminum) of 0.25 mm, minimum thickness; other metallic may be used but they shall have at least 0.65 mm thickness. In the Cerpass Technology Corp., we provided 1 mm thickness stainless steel ground reference plane. The minimum size of the ground reference plane is 2.5 m x 2.5 m, the exact size depending on the dimensions of the EUT. It was connected to the protective grounding system. The EUT was arranged and connected according to its functional requirements. A distance of 1m minimum was provided between the EUT and the wall of the lab. and any other metallic structure. In cases where this length exceeds the length necessary to apply the discharges to the selected points, the excess length shall, where possible, be placed non-inductively off the ground reference plane and shall not come closer than 0.2m to other conductive parts in the test setup. Where the EUT is installed on a metal table, the table was connected to the reference plane via a cable with a 470k ohm resister located at each end, to prevent a build-up of charge. The test setup was consist a wooden table, 0.8m high, standing on the ground reference plane. A HCP, 1.6 m x 0.8 m, was placed on the table. The EUT and cables was isolated from the HCP by an insulating support 0.5 mm thick. The VCP size, 0.5 m x 0.5 m. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 45 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 6.3. Test Severity Levels Contact Discharge Level Test Voltage (KV) of Air Discharge Level Test Voltage (KV) of Contact discharge Air Discharge 1 ±2 1 ±2 2 ±4 2 ±4 3 ±6 3 ±8 4 ±8 4 ±15 X Specified X Specified Remark: “X” is an open level. 6.4. Measurement Equipment Instrument Manufacturer Model No. ESD SIMULATOR Schaffner NSG438 Serial No. Calibration Date 878 2009/06/23 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 46 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 6.5. Test Result and Data : PASS : A Final Test Result Pass performance criteria Required performance criteria : B : IEC 61000-4-2 Basic Standard Product Standard : EN 55024 Test Voltage : ±2 / ±4 / ±8 KV for air discharge, ±2 / ±4 KV for contact discharge : 16°C Temperature Atmospheric Pressure : 50 % : 1009 hPa Test Date : Dec. 21, 2009 Relative Humidity Test Mode: The test result of all test modes are the same Contact Discharge 25 Voltage Point\Polarity HCP Air Discharge times / each 10 times / each 2 KV + － A A 4 KV + － A A 2 KV + － ----- 4 KV + － ----- 8 KV + － ----- VCP A A A A --- --- --- --- --- --- Screw A A A A --- --- --- --- --- --- CASE --- --- --- --- A A A A A A DC Jack --- --- --- --- A A A A A A RJ45 Port --- --- --- --- A A A A A A DVD ROM --- --- --- --- A A A A A A USB Port --- --- --- --- A A A A A A Button --- --- --- --- A A A A A A SD Card --- --- --- --- A A A A A A HDMI Port --- --- --- --- A A A A A A Panel --- --- --- --- A A A A A A e-SATA --- --- --- --- A A A A A A Camera & MIC --- --- --- --- A A A A A A Note:” A” means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 47 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 6.6. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 48 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 7. Radio Frequency electromagnetic field immunity test 7.1. Test Procedure a. The equipment to be tested is placed in the center of the enclosure on a wooden table. The equipment is then connected to power and signal leads according to pertinent installation instructions. b. The antenna which is enabling the complete frequency range of 80-1000 MHz is placed 3m away from the equipment. The required field strength is determined by placing the field strength meter(s) on top of or directly alongside the equipment under test and monitoring the field strength meter via a remote field strength indicator outside the enclosure while adjusting the continuous-wave to the applicable antennae. c. The test is normally performed with the antenna facing the most sensitive side of the EUT. The polarization of the field generated by the bucolical antenna necessitates testing each position twice, once with the antenna positioned vertically and again with the antenna positioned horizontally. The circular polarization of the field from the log-spiral antenna makes a change of position of the antenna unnecessary. d. At each of the above conditions, the frequency range is swept 80-1000 MHz, pausing to adjust the R.F. signal level or to switch oscillators and antenna. The rate of sweep is in the order of 1.5*10-3 decades/s. The sensitive frequencies or frequencies of dominant interest may be discretely analyzed. 7.2. Typical Test Setup Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 49 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 7.3. Test Severity Levels Level 1 2 3 X Frequency Band : 80-1000 MHz Test field strength (V/m) 1 3 10 Specified Remark: “X” is an open class. 7.4. Measurement Equipment Manufacturer Model No. Serial No. Calibration Date Amplifiers SCHAFFNER 80-1000MHz/100W CBA9413B 43510 N/A Instrument Antenna SCHAFFNER CBL6141A 4257 N/A Power Meter Boonton 4231A-01 115902 2009/10/12 Field Probe HOLADAY HI-6005 00035824 2009/01/03 Signal Generator HP 8648C 3629U00612 2009/10/07 Power Sensor Boonton 51011-EMC 33312 2009/09/29 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 50 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 7.5. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-3 Product Standard : EN 55024 Frequency Range : 80~1000 MHz Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008hPa Test Date : Dec. 18, 2009 Test Mode: The test result of all test modes are the same Modulation : AM 80% , 1KHz sine wave, Dwell time: 2.9 S Frequency Step Size : 1 % of preceding frequency value Frequency (MHz) Antenna Polarization face Field strength (V/m) Result 80~1000 Vertical Front 3 V/m A 80~1000 Vertical Rear 3 V/m A 80~1000 Vertical Left 3 V/m A 80~1000 Vertical Right 3 V/m A 80~1000 Horizontal Front 3 V/m A 80~1000 Horizontal Rear 3 V/m A 80~1000 Horizontal Left 3 V/m A 80~1000 Horizontal Right 3 V/m A Note: “A” means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 51 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 7.6. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 52 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 8. Electrical Fast Transient/ Burst Immunity Test 8.1. Test Procedure a. In order to minimize the effect of environmental parameters on test results, the climatic conditions when test is carrying out shall comply with the following requirements: ambient temperature: 15℃ to 35℃; relative humidity : 45％ to 75％; Atmospheric pressure: 86 Kpa (860 mbar) to 106 Kpa (1060 mbar). b. In order to minimize the effect of environmental parameters on test results, the electromagnetic environment of the laboratory shall not influence the test results. c. The variety and diversity of equipment and systems to be tested make it difficult to establish general criteria for the evaluation of the effects of fast transients/bursts on equipment and systems. d. Test on Power Line: The EFT/B-generator was located on the GRP.. The length from the EFT/B-generator to the EUT is not exceeding 1 m. The EFT/B-generator provides the ability to apply the test voltage in a non-symmetrical condition to the power supply input terminals of the EUT. e. Test on Communication Lines The coupling clamp is composed of a clamp unit for housing the cable (length more than 3 m), and was placed on the GRP. The coupling clamp provides the ability of coupling the fast transient/bursts to the cable under test. f. The test results may be classified on the basic of the operating conditions and the functional specification of the equipment under test, according to the following performance criteria : Normal performance within the specification limits. Temporary degradation or loss of function or performance which is self-recoverable. Temporary degradation or loss of function or performance which requires operator intervention or system reset. Degradation or loss of function which is not recoverable due to damage of equipment (components). Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 53 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 8.2. Typical Test Setup 8.3. Test Severity Levels The following test severity levels are recommended for the fast transient/burst test : Open circuit output test voltage ± 10％ Level On Power Supply On I/O signal, data and control line 1 0.5 KV 0.25 KV 2 1.0 KV 0.50 KV 3 2.0 KV 1.00 KV 4 4.0 KV 2.00 KV X Specified Specified Remark : “ X ” is an open level. The level is subject to negotiation between the user and manufacturer or is specified by the manufacturer. 8.4. Measurement Equipment Instrument EMC Pro Manufacturer Model No. KeyTek EMC Pro Serial No. Calibration Date 0309207 2009/04/28 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 54 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 8.5. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : B Basic Standard : IEC 61000-4-4 Product Standard : EN 55024 Test Voltage : Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008 hPa Test Date : Dec. 18, 2009 On Power Supply -- ±0.5 KV, ±1.0 KV On Signal Port - - ±0.5 KV Test Mode: The test result of all test modes are the same Repetition Rate: 2.5 kHz above 2.0 kV Pulse : 5/50 ns Burst : 15m/300ms Test time : 1 min/each condition Voltage/ Mode/ Polarity/ Result/ Phase Power Line Signal Line 5 kHz below and equal 2.0Kv 0.5 kV 1.0 kV + － + － L A A A A N A A A A L-N A A A A PE A A A A L-PE A A A A N-PE A A A A L-N-PE A A A A RJ45 LAN (10 / 100M / 1000M) A A --- --- Note: “A” Means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 55 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 8.6. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 56 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 9. Surge Immunity Test 9.1. Test Procedure a. b. c. d. e. f. g. h. i. Climatic conditions The climatic conditions shall comply with the following requirements : ambient temperature : 15 ℃ to 35 ℃ relative humidity : 10 % to 75 % atmospheric pressure : 86 kPa to 106 kPa ( 860 mbar to 1060 mbar ) Electromagnetic conditions the electromagnetic environment of the laboratory shall not influence the test results. The test shall be performed according the test plan that shall specify the test set-up with generator and other equipment utilized; test level ( voltage/current ); generator source impedance; internal or external generator trigger; number of tests : at least five positive and five negative at the selected points; repetition rate : maximum 1/min. inputs and outputs to be tested; representative operating conditions of the EUT; sequence of application of the surge to the circuit; phase angle in the case of AC. power supply; actual installation conditions, for example : AC : neutral earthed, DC : ( + ) or ( - ) earthed to simulated the actual earthing conditions. If not otherwise specified the surges have to be applied synchronized to the voltage phase at the zero-crossing and the peak value of the AC. voltage wave ( positive and negative ). The surges have to be applied line to line and line(s) and earth. When testing line to earth, the test voltage has to be applied successively between each of the lines and earth, if there is no other specification. The test procedure shall also consider the non-linear current-voltage characteristics of the equipment under test. Therefore the test voltage has to be increased by steps up to the test level specified in the product standard or test plan. All lower levels including the selected test level shall be satisfied. For testing the secondary protection, the output voltage of the generator shall be increased up to the worst-case voltage breakdown level ( let-through level ) of the primary protection. If the actual operating signal sources are not available, that may be simulated. Under no circumstances may the test level exceed the product specification. The test shall be carried out according to a test plan. To find all critical points of the duty cycle of the equipment, a sufficient number of positive and negative test pulses shall be applied. For acceptance test previously unstressed equipment shall be used to the protection devices shall be replaced. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 57 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 9.2. Typical Test Setup 9.3. Test Severity Level Level Open-circuit test voltage, ± 10％, KV 1 0.5 2 1.0 3 2.0 4 4.0 X Specified NOTE: “X” is an open class. This level can be specified in the product specification. 9.4. Measurement Equipment Instrument EMC Pro Manufacturer Model No. KeyTek EMC Pro Serial No. Calibration Date 0309207 2009/04/28 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 58 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 9.5. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : B Basic Standard : IEC 61000-4-5 Product Standard : EN 55024 Test Voltage : Input AC Power Port L-N-- ± 0.5 kV, ± 1.0 kV Signal Port – N/A Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008 hPa Test Date : Dec. 18, 2009 Test Mode: The test result of all test modes are the same Power Port Waveform : 1.2/50μs(8/20μs) Repetition rate : 60 sec Time : 5 time/each condition /Phase Voltage / Mode / Polarity / Result 0° 90° 180° 270° + A A A A － A A A A + A A A A － A A A A + A A A A － A A A A 0.5 kV, 1.0 kV L-N L-PE 2 KV N-PE Note: “A” Means the EUT function is normal working during the test. Signal Port: RJ45 where normal functioning cannot be achieved because of the impact of the CDN on the EUT. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 59 of 70 CERPASS TECHNOLOGY CORP. 9.6. Report No.: TECE0912052 Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 60 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 10. Conduction Disturbances induced by Radio-Frequency Fields 10.1. Test Procedure a. The EUT shall be operated within its intended climatic conditions. The temperature and relative humidity should be recorded. b. This test method test can be performed without using a sell shielded enclosure. This is because the disturbance levels applied and the geometry of the setups are not likely to radiated a high amount of energy, especially at the lower frequencies. If under certain circumstances the radiated energy is too high, a shielded enclosure has to be used. c. The test shall be performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non-excited RF-input ports of the coupling devices are terminated by a 50 ohm load resistor. d. The frequency range is swept from 150 KHz to 80 MHz, using the signal levels established during the setting process, and with the disturbance signal 80% amplitude modulated with a 1KHz sign wave, pausing to adjust the RF-signal level or to switch coupling devices as necessary. The rate of sweep shall no exceed 1.5 x 10-3 decades/s. Where the frequency is swept incrementally, the step size shall no exceed 1% of the start and thereafter 1% of the preceding frequency value. e. The dwell time at each frequency shall not be less than the time necessary for the EUT to be exercised, and able to respond. Sensitive frequencies e.g. clock frequency (ies) and harmonics or frequencies of dominant interest shall be analyzed separately. f. An alternative test procedure may be adopted, wherein the frequency range is swept incrementally, with a step size not exceeding 4% of the start ad thereafter 4% of the preceding frequency value. g. The test level should be at least twice the value of the specified test level. In cases of dispute, the test procedure using a step size not exceeding 1% of the start and thereafter 1% of preceding frequency value shall take precedence. h. Attempts should be made to fully exercise the EUT during testing, and to fully interrogate all exercise modes selected for susceptibility. i. The use of special exercising programs is recommended. j. Testing shall be performed according to a Test Plan, which shall be included in the test report. k. It may be necessary to carry out some investigatory testing in order to establish some aspects of the test plan. Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 61 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 10.2.Typical Test Setup 10.3. Test Severity Levels Level Voltage Level ( EMF ), 1 1V 2 3V 3 10 V x Specified NOTE - x is an open class. This level can be specified in the product specification. 10.4. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date CS GENERATOR Schaffner NSG 2070 1059 2009/11/23 CDN (M2+M3) Schaffner M016 20056 2009/11/24 CDN Schaffner T400 19818 2009/11/24 EM-CLAMP Schaffner KEMZ 801 19793 2009/11/24 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 62 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 10.5. Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-6 Product Standard : EN 55024 Coupling mode : Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008 hPa Test Date : Dec. 18, 2009 CDN-(M3) for AC power ports CDN-T400 for Signal Ports Test Mode: The test result of all test modes are the same Frequency : 0.15~80MHz, Modulation : AM 80%,1KHz sine wave, Dwell time: 2.9s Frequency Step Size : 1 % of preceding frequency value Frequency Test Mode Voltage(V) Result 0.15 ~ 80MHz Power(M3) 3 A 0.15 ~ 80MHz RJ45 LAN (10M / 100M) 3 A 0.15 ~ 80MHz RJ45 Clamp LAN(1G) 3 A Note: “A” Means the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 63 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 10.6. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 64 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 11. Power Frequency Magnetic Field Immunity Test 11.1. Test Setup GPR A S EUT Lc E : : : : : : Ground plane Safety earth Insulating support Equipment under test Induction coil Earth terminal C1 C2 L B D G : : : : : : Power supply circuit Signal circuit Communication line To power supply source To signal source, simulator To the test generator 11.2. Test Severity Levels Magnetic field strength A/m 1 3 10 30 100 special Level 1 2 3 4 5 X1) NOTE 1 “X” is an open level. This level can be given in the product specification. 11.3. Measurement Equipment Instrument Manufacturer Model No. MAGNETIC FIELD GENERATOR KeyTek F-1000-4-8-G -125A Serial No. Calibration Date N/A 2009/10/29 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 65 of 70 CERPASS TECHNOLOGY CORP. 11.4. Report No.: TECE0912052 Test Result and Data Final Test Result : PASS Pass performance criteria : A Required performance criteria : A Basic Standard : IEC 61000-4-8 Product Standard : EN 55024 Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008 hPa Test Date : Dec. 18, 2009 Test Mode: The test result of all test modes are the same Power Frequency Magnetic Field : 50 Hz, 1 A/m Coil Orientation Testing duration Results X-axis 1.0 Min A Y-axis 1.0 Min A Z-axis 1.0 Min A Note: “A” Mean the EUT function is normal working during the test. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 66 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 11.5. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 67 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 12. Voltage Dips and Voltage Interruptions Immunity Test Setup 12.1. Test Conditions 1. Source voltage and frequency : 230V / 50Hz, Single phase. 2. Test of interval : 10 sec. 3. Level and duration : Sequence of 3 dips/interrupts. 4. Voltage rise (and fall) time : 1 ∼ 5 μs. 5. Test severity : Voltage dips and Interrupt reduction (%) Test Duration (period) >95% 250 30% 25 >95% 0.5 12.2. Test Setup 12.3. Measurement Equipment Instrument Manufacturer Model No. Serial No. Calibration Date EMC Pro KeyTek EMC Pro 0309207 2009/04/28 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 68 of 70 Report No.: TECE0912052 CERPASS TECHNOLOGY CORP. 12.4. Test Result and Data Final Test Result : PASS Pass performance Criteria : C for voltage interruption, A for voltage dips Required performance Criteria : C for voltage interruption, B/C for voltage dips Basic Standard : IEC 61000-4-11 Product Standard : EN 55024 Temperature : 17°C Relative Humidity : 52 % Atmospheric Pressure : 1008 hPa Test Date : Dec. 18, 2009 Test Mode: The test result of all test modes are the same Voltage(UT): AC 230 V Test mode Voltage interruptions 50 Hz Interval(s) : 10s Times : 3 Phase / Result Test level UT % Durations (period) 0° 180° >95% 250 C C 30% 25 A A >95% 0.5 A A Voltage dips Note: “A” Mean the EUT function is normal working during the test. ”C” Mean the EUT function is affect during the test, and it can be recover by manual resetting. Test engineer: Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 69 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 12.5. Test Photographs Front View Rear View Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : 70 of 70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Appendix A. Photographs of EUT Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A1 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A2 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A3 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A4 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A5 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A6 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A7 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A8 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A9 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A10 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A11 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: M620,INTEL/2.66GHz(Q3G5),2.66GHz,PGA-988pin (MSI PN: OA3-1675006) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A12 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: M620,INTEL/2.66GHz(Q3G5),2.66GHz,PGA-988pin (MSI PN: OA3-1675006) CPU: U620,INTEL/1.06GHz(Q3G2),1.06GHz,BGA-1288pin (MSI PN: OA3-1355001) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A13 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: U620,INTEL/1.06GHz(Q3G2),1.06GHz,BGA-1288pin ((MSI PN: OA3-1355001) CPU: M540,INTEL/2.53GHz(Q3G9),2.53GHz,PGA-988pin (MSI PN: OA3-1675008) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A14 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: M540,INTEL/2.53GHz(Q3G9),2.53GHz,PGA-988pin (MSI PN: OA3-1675008) CPU: M520,INTEL/2.4GHz(Q3GB),2.4GHz,PGA-988pin ((MSI PN: OA3-1675007) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A15 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: M520,INTEL/2.4GHz(Q3GB),2.4GHz,PGA-988pin ((MSI PN: OA3-1675007) CPU: M430,INTEL/2.26GHz(Q3LR),2.26GHz,PGA-988pin (MSI PN: OA3-1675010) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A16 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: M430,INTEL/2.26GHz(Q3LR),2.26GHz,PGA-988pin (MSI PN: OA3-1675010) CPU: INTEL/2.13GHz, PGA-988pin Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A17 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 CPU: INTEL/2.13GHz, PGA-988pin LED Panel: CMO \ 15.6” \ N156B6-L04 (MSI PN: S1J-642G002-CC1) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A18 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel: CMO \ 15.6” \ N156B6-L04 (MSI PN: S1J-642G002-CC1) LED Panel: Samsung \ 15.6” \ LTN156AR05 (MSI PN: S1J-642G006-S02) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A19 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel: Samsung \ 15.6” \ LTN156AR05 (MSI PN: S1J-642G006-S02) LED Panel: AUO \ 15.6” \ B156XW02 V0-G (MSI PN: S1J-642G005-A90) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A20 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel: AUO \ 15.6” \ B156XW02 V0-G (MSI PN: S1J-642G005-A90) LED Panel; CPT \ 15.6” \ CLAA156WA11/A (MSI PN: S1J-642G004-CG1) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A21 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel; CPT \ 15.6” \ CLAA156WA11/A (MSI PN: S1J-642G004-CG1) LED Panel: Hannstar \ 16” \ HSD160PHW1 (MSI PN: S1J-A42G005-H34) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A22 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel: Hannstar \ 16” \ HSD160PHW1 (MSI PN: S1J-A42G005-H34) LED Panel: SAMSUNG \ 16” \ LTN160AT06-A01 (MSI PN: S1J-A42G004-S02) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A23 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 LED Panel: SAMSUNG \ 16” \ LTN160AT06-A01 (MSI PN: S1J-A42G004-S02) HDD: WD \ WD5000BEVT \ 500GB, 5400rpm (MSI PN: S71-2450501-W36 Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A24 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD5000BEVT \ 500GB, 5400rpm (MSI PN: S71-2450501-W36 HDD: WD \ WD3200BEKT \ 320GB, 7200rpm (MSI PN: S71-2432701-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A25 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD3200BEVT \ 320GB, 5400rpm (MSI PN: S71-2432501-W36) HDD: WD \ WD3200BEVT \ 320GB, 5400rpm (MSI PN: S71-2432501-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A26 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD2500BEVT \ 250GB, 5400rpm (MSI PN: S71-2425521-W36) HDD: WD \ WD2500BEVT \ 250GB, 5400rpm (MSI PN: S71-2425521-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A27 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD2500BEVT \ 250GB, 5400rpm (MSI PN: S71-2425542-W36) HDD: WD \ WD2500BEVT \ 250GB, 5400rpm (MSI PN: S71-2425542-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A28 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD3200BEVT \ 320GB, 5400rpm (MSI PN: S71-2432538-W36) HDD: WD \ WD3200BEVT \ 320GB, 5400rpm (MSI PN: S71-2432538-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A29 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD5000BEVT \ 500GB, 5400rpm (MSI PN: S71-2450515-W36) HDD: WD \ WD5000BEVT \ 500GB, 5400rpm (MSI PN: S71-2450515-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A30 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: WD \ WD6400BEVT \ 640GB, 5400rpm (MSI PN: S71-2464501-W36) HDD: WD \ WD6400BEVT \ 640GB, 5400rpm (MSI PN: S71-2464501-W36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A31 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Toshiba \ MK5055GSX \ 500GB, 5400rpm (MSI PN: S71-2450504-T14) HDD: Toshiba \ MK5055GSX \ 500GB, 5400rpm (MSI PN: S71-2450504-T14) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A32 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Toshiba \ MK3263GSX \ 320GB, 5400rpm (MSI PN: S71-2432525-T14) HDD: Toshiba \ MK3263GSX \ 320GB, 5400rpm (MSI PN: S71-2432525-T14) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A33 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Toshiba \ MK3265GSX \ 320GB, 5400rpm (MSI PN: S71-2432537-T14) HDD: Toshiba \ MK3265GSX \ 320GB, 5400rpm (MSI PN: S71-2432537-T14) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A34 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Toshiba \ MK2555GSX \ 250GB, 5400rpm (MSI PN: S71-2425531-T14) HDD: Seagate \ ST9500325AS \ 500GB, 5400rpm (MSI PN: S71-2450502-S70) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A35 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Seagate \ ST9500325AS \ 500GB, 5400rpm (MSI PN: S71-2450502-S70) HDD: Seagate \ ST9500420AS \ 500GB, 7200rpm (MSI PN: S71-2450701-S70) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A36 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Seagate \ ST9500420AS \ 500GB, 7200rpm (MSI PN: S71-2450701-S70) HDD: Seagate \ ST9320325AS \ 320GB, 5400rpm (MSI PN: S71-2432526-S70) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A37 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Seagate \ ST9320325AS \ 320GB, 5400rpm (MSI PN: S71-2432526-S70) HDD: Seagate \ ST9250315AS \ 250GB, 5400rpm (MSI PN: S71-2425532-S70) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A38 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Seagate \ ST9250315AS \ 250GB, 5400rpm (MSI PN: S71-2425532-S70) HDD: Fujitsu \ MJA2500BH \ 500GB, 5400rpm (MSI PN: S71-2450505-F06) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A39 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Fujitsu \ MJA2500BH \ 500GB, 5400rpm (MSI PN: S71-2450505-F06) HDD: Fujitsu \ MJA2320BH \ 320GB, 5400rpm (MSI PN: S71-2432516-F06) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A40 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Fujitsu \ MJA2320BH \ 320GB, 5400rpm (MSI PN: S71-2432516-F06) HDD: Fujitsu \ MHZ2320BJ \ 320GB, 7200rpm (MSI PN: S71-2432702-F06) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A41 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Fujitsu \ MHZ2320BJ \ 320GB, 7200rpm (MSI PN: S71-2432702-F06) HDD: Fujitsu \ MJA2250BH \ 250GB, 5400rpm (MSI PN: S71-2425528-F06) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A42 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Fujitsu \ MJA2250BH \ 250GB, 5400rpm (MSI PN: S71-2425528-F06) HDD: Hitachi \ HTS545050B9A300 \ 500GB, 5400rpm (MSI PN: S71-2450509-H05) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A43 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Hitachi \ HTS545050B9A300 \ 500GB, 5400rpm (MSI PN: S71-2450509-H05) HDD: Hitachi \ HTS545032B9A300 \ 320GB, 5400rpm (MSI PN: S71-2432520-H05) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A44 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 HDD: Hitachi \ HTS545032B9A300 \ 320GB, 5400rpm (MSI PN: S71-2432520-H05) HDD: Hitachi \ HTS545025B9A300 \ 250GB, 5400rpm (MSI PN:S71-2425534-H05) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A45 of A70 CERPASS TECHNOLOGY CORP. HDD: Hitachi \ HTS545025B9A300 \ 250GB, 5400rpm Report No.: TECE0912052 (MSI PN:S71-2425534-H05) DRAM(DDRIII): Hynix \ HMT112S6BFR6C-G7N0 \ 1GB (MSI PN: S7C-S448201-H23) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A46 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 DRAM(DDRIII): Hynix \ HMT112S6BFR6C-G7N0 \ 1GB (MSI PN: S7C-S448201-H23) DRAM(DDRIII): Samsung \ M471B2874EH1-CF8 \ 1GB (MSI PN: S7C-S448802-S02) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A47 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 DRAM(DDRIII): Samsung \ M471B2874EH1-CF8 \ 1GB (MSI PN: S7C-S448802-S02 DRAM(DDRIII): Hynix \ HMT125S6BFR8C-G7N0 \ 2GB (MSI PN: S7C-S458201-H23) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A48 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 DRAM(DDRIII): Hynix \ HMT125S6BFR8C-G7N0 \ 2GB (MSI PN: S7C-S458201-H23) DRAM(DDRIII): Samsung \ M471B5673EH1-CF8 \ 2GB (MSI PN: S7C-S458804-S02) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A49 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 DRAM(DDRIII): Samsung \ M471B5673EH1-CF8 \ 2GB (MSI PN: S7C-S458804-S02) DRAM(DDRIII): Transcend \ TS256MSK64V1U \ 2GB (MSI PN: S7C-S458801-T10) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A50 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: HLDS \ GT10N (MSI PN: S7D-2270015-H44) ODD: HLDS \ GT10N (MSI PN: S7D-2270015-H44) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A51 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: HLDS \ GT30N (MSI PN: S7D-2270031-H44) ODD: HLDS \ GT30N (MSI PN: S7D-2270031-H44) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A52 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: Optiarc \ AD-7560S (MSI PN: S7D-2270001-SI4) ODD: Optiarc \ AD-7560S (MSI PN: S7D-2270001-SI4) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A53 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: TSST \ TS-L633 (MSI PN: S7D-2270026-T87) ODD: TSST \ TS-L633 (MSI PN: S7D-2270026-T87) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A54 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: PLDS \ DS-8A3S (MSI PN: S7D-2270038-T87) ODD: PLDS \ DS-8A3S (MSI PN: S7D-2270038-T87) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A55 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: PLDS \ DS-8A3S (MSI PN: S7D-2270032-P87) ODD: PLDS \ DS-8A3S (MSI PN: S7D-2270032-P87) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A56 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 ODD: HLDS \ CT21N (MSI PN: S7D-2280014-H44) ODD: HLDS \ CT21N (MSI PN: S7D-2280014-H44) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A57 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 WLAN: Atheros \ AR5B95 (MSI PN: S57-0800290-T46) WLAN: Atheros \ AR5B95 (MSI PN: S57-0800290-T46) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A58 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Bluetooth: CSR \ BSMAN1 (MSI PN: 605-3801-010) Bluetooth: CSR \ BSMAN1 (MSI PN: 605-3801-010) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A59 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 WLAN+BT Combo: MSI \ MS-3870 (MSI PN: 605-3870-A30) WLAN+BT Combo: MSI \ MS-3870 (MSI PN: 605-3870-A30) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A60 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Touch Pad: SYNAPTICS \ TM-00300-000 (MSI PN: S78-3700360-SD2) Touch Pad: SYNAPTICS \ TM-00300-000 (MSI PN: S78-3700360-SD2) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A61 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Touch Pad: SENTELIC \ TPA2D2IC99RA1 (MSI PN: S78-3700360-SK9) Touch Pad: SENTELIC \ TPA2D2IC99RA1 (MSI PN: S78-3700360-SK9) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A62 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Webcam: BISON \ BN29M6SSB-000 \ 1.3M/RIGHT PLUG (MSI PN: S1F-0001580-B36) Webcam: BISON \ BN29M6SSB-000 \ 1.3M/RIGHT PLUG (MSI PN: S1F-0001580-B36) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A63 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Webcam: AzureWave \ AM-1C016 \ 1.3M/RIGHT PLUG (MSI PN: S1F-0001590-AH3) Webcam: AzureWave \ AM-1C016 \ 1.3M/RIGHT PLUG (MSI PN: S1F-0001590-AH3) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A64 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Battery: Celxpert \ BTY-L74 \ 6 CELL (MSI PN: S9N-2062200-CE1) Battery: Celxpert \ BTY-L74 \ 6 CELL (MSI PN: S9N-2062200-CE1) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A65 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Battery: MiTAC \ BTY-L74 \ 6 CELL (MSI PN: S9N-2062210-M47) Battery: MiTAC \ BTY-L74 \ 6 CELL (MSI PN: S9N-2062210-M47) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A66 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Battery: Celxpert \ BTY-L75 \ 9 CELL (MSI PN: S9N-2492200-CE1) Battery: Celxpert \ BTY-L75 \ 9 CELL (MSI PN: S9N-2492200-CE1) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A67 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Adapter: LI SHIN \ LSE0202C1990 (MSI PN: S93-0406120-L44) Adapter: LI SHIN \ LSE0202C1990 (MSI PN: S93-0406120-L44) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A68 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Adapter: LI SHIN \ LSE0202C1990 (MSI PN: S93-0406120-L44) Adapter: Delta \ ADP-90SB BB (MSI PN: S93-0406210-D04) Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A69 of A70 CERPASS TECHNOLOGY CORP. Report No.: TECE0912052 Adapter: Delta \ ADP-90SB BB (MSI PN: S93-0406210-D04) Adapter: Delta \ ADP-90SB BB (MSI PN: S93-0406210-D04) . Cerpass Technology Corp. Issued Date : Dec. 22, 2009 Tel:886-2-2655-8100 Fax:886-2-2655-8200 Page No. : A70 of A70

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