Transcript
Fast Recovery Epitaxial Diode (FRED) Module
PSMD 100E
IFAV VRRM
= 136 A = 200-600V
Preliminary Data Sheet VRSM V 200 400 600
VRRM V 200 400 600
Type PSMD 100E/02 PSMD 100E/04 PSMD 100E/06
Symbol
Test Conditions
IFAV IFSM
TC = 70°C TVJ = 45°C VR = 0
t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine
136 2000 2200
A A A
TVJ = TVJM VR = 0
t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine
1800 1980
A A
TVJ = 45°C VR = 0
t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine
20000 20080
A2 s A2 s
TVJ = TVJM VR = 0
t = 10 ms (50 Hz), sine t = 8.3 ms (60 Hz), sine
16200 16250
A2 s A2 s
-40 ... + 150 150 -40 ... + 125
°C °C °C
2500 3000
V∼ V∼
5 5 270
Nm Nm g
∫ i2 dt
TVJ TVJM Tstg VISOL Md Weight
50/60 HZ, RMS IISOL ≤ 1 mA
Maximum Ratings
t = 1 min t=1s
Mounting torque Terminal connection torque typ.
(M6) (M6)
Features • Package with screw terminals • Isolation voltage 3000 V∼ • Planar glasspassivated chips • Short recovery time • Low forward voltage drop • Short recovery behaviour • UL registered, E 148688 Applications • Inductive heating and melting • Free wheeling diode in converters and motor control circuits
• Uninterruptible power supplies (UPS) • Ultrasonic cleaners and welders Advantages • High reliability circuit operation • Low voltage peaks for reduced protection circuits
• Low noise switching • Low losses
Symbol
Test Conditions
Characteristic Value
IR
VR = VRRM TVJ = 25°C VR = VRRM TVJ = TVJM IF = 100 A TVJ = 25°C TVJ = 25°C; IF=1A; -diF/dt=400A/µs VR= 30V IF=100A; -diF/dt=200A/µs; VR=100V L ≤ 0,05 mH; TVJ = 100°C For power-loss calculations only TVJ = TVJM per diode; DC current per diode; DC current Creeping distance on surface Creeping distance in air Max. allowable acceleration
≤ ≤ ≤
VF trr IRM VTO rT RthJH RthJC dS dA a
POWERSEM GmbH, Walpersdorfer Str. 53 91126 D- Schwabach Phone: 09122 - 9764-0 Fax.: 09122 - 9764-20
250 2.5 1.25 typ. 60
µA mA V ns
typ. 45
A
0.45 1.25 0.84 0.65 10 9.4 50
V mΩ K/W K/W mm mm m/s2
Package, style and outline Dimensions in mm (1mm = 0.0394“)
2003 POWERSEM reserves the right to change limits, test conditions and dimensions
