E931.06 1/7 Features Digital Sensor Assembly With E931.06

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E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 Features General Description ÿ ÿ ÿ ÿ ÿ ÿ ÿ ÿ ÿ The E931.06 integrated circuit is designed for interfacing Passive Infra Red (PIR) sensors with micro-controllers or processors. A single wire Data Out, Clock In (DOCI) interface is provided for interfacing with a micro-controller. Multiple devices can easily be operated at the same time. One PIR sensors ceramic elements connect directly to the PIR inputs. The PIR signal is converted to a 14 bit digital value. The E931.06 contains an on chip temperature measurement circuit with a resolution of better than 0.05K. The PIR sensor voltages and the temperature value are supplied to an external microcontroller through the DOCI interface. Direct connection to PIR sensor elements Temperature measurement Differential PIR Input Digital Signal Processing (DSP) Single wire serial interface (DOCI) Operating voltage down to 2.7V Low current consumption High dynamic range High supply rejection Applications ÿ ÿ ÿ Integration with PIR sensor elements (hybrid modules) High end PIR systems Building Management Digital Sensor Assembly with E931.06 The E931.06 PIR Signal processor replaces the JFET and optional discrete components. Traditional analog PIR detector Traditional New digital PIR detector Analog Output Temperature Analog to Digital VSS U3 78L05 Vout Vin D1 1 C4 100n 2 C3 100n C2 100n U1 C1 470n 1 2 3 4 DIGITAL U2 VSS VDD VSS GP5/OSC1/CLKIN GP0 GP4/OSC2 GP1 GP3/MCLR/VPP Digital Output GP2/T0CKI 8 5 MICRO 1 2 VSS Voltage J2 1 2 RE1 RELAY-SPST D2 Alarm Loop 7 6 J1 SN4007 + C5 100u/16V 1N4148 3 Serial Interface VDD VSS GND VDD E931.06A PIR Analog to Digital VDD Q1 BC237 R1 10k VSS VSS Typical application circuit for alarm motion sensor Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 1/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 Absolute Maximum Ratings Parameter Supply Voltage Current into any pin Storage Temperature Symbol VDD Tst Min Max -0.3 -100 -45 3.6 100 125 Unit V mA °C Remarks One pin at a time Stresses beyond those listed above may cause permanent damage to the device. Exposure to absolute maximum ratings may affect the device reliability. ESD protection: all pins will be able to withstand a discharge of a 100pF capacitor charged to 1.6kV through a 1500Ω series resistor. Test method: MIL-STD-883D method 3015. Operating Conditions (T=25 °C, unless stated otherwise) Operating temperature range: -25 to +70°C Parameter Supply Supply voltage Supply current Digital DOCI interface Symbol Typ Unit 3.6 15 V µA Input low voltage VIL Input high voltage VIH 80 Pull down current 200 Pull up current 130 Input capacitance 5 DOCI interface setup time ts 2 Data clock low time tL 0.1 DOCI low time tL + tbit Data clock high time tH 0.1 Data bit settling time tbit 1 DOCI low time to ensure update tW 64 Analog Inputs PIR+, PIR-, Analog to Digital Converter Input leakage -1 20 %VDD %VDD µA µA pF 1/FCLK µs 1/FCLK µs µs 1/FCLK RIN ADC Sensitivity 6 ADC Temperature Coefficient RMS output noise referred to input 14 6.5 -300 F0 FS TI 1 1 fA 50 100 GΩ mV mV Bits 30 -50 -100 ADC Resolution ADC Offset Digital Filter Type & Cut off Freq. Digital Filter Sampling Freq. DOCI Interrupt cycle 2.7 Max 3.3 10 Input Impedance PIRIN input voltage range VDD IDD Min 7 300 2.5 1.5 0.5 0.4 7000 8192 9200 FCLK * 1.41 / 2048 / PI 1/32 512 µV/coun t ppm/K µV µV µV µV counts Hz FCLK 1/ FCLK Remarks VDD=3.3V IN/Out to VDD IN/Out to VSS µC defines TREP avoid update to avoid update CLOAD = 10pF VIN = -10mV .. +10mV Referred to VSS Differential Common Mode Max Count = 2^14-1 @ 0.5Hz @ 1Hz @ 2Hz @ 5Hz nd 2 Order BW LPF Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 2/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 Temperature Measurement Gain Measurement Range Linearity Count Value at Ambient Oscillator Internal Oscillator Frequency Internal clock frequency Temperature Dependency 80 -20 -5 5700 58 FOSC FCLK 6700 +90 5 7700 Counts/K ºC % Counts 64 70 kHz 1000 ppm/k -20ºC to +90ºC -20ºC to +90ºC @ 25ºC FOSC /2 -1000 FOSC /2 -20ºC to +80ºC Table 2: Operation conditions Detailed Description___________________________________________ PIRIN0 NPIRIN0 ADC 0 PIR Decimator nd (2 Order BW LP Filter) ADC 1 Temp. °C Serial Interface VDD Decimator Voltage Reference DOCI VSS Oscillator Fig 2: Block diagram of E931.06 Oscillator the reference to a digital value with a resolution of better than 0.1K. The IC contains an on chip low power oscillator, with a frequency of 64 kHz. All time related signals and the cutoff frequencies of the digital filters are related to the oscillator's frequency. Decimation – Digital Filters The output signal from the PIR ADC is processed through a second order Butterworth low pass filter with a sampling rate of 1kHz. PIR inputs and A/D conversion The analog to digital converter generates a digital signal from the voltage level measured between the PIRIN and NPIRIN terminals. The output signal from the Temperature ADC is converted to a 14 bit value by down sampling to Fclk/512. Temperature Measurement The on chip temperature is measured by converting the temperature dependent voltage of Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 3/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 Parallel to Serial Data Latch all 28 bits have been read. After the last bit is read, the microcontroller must force low level and subsequently release DOCI. If reading is interrupted for more than 1 system clock with the DOCI interface at low level, the output data latch is updated with new values. Reading can be interrupted, while the DOCI interface is forced high. The output latch is not updated in this condition. New data is transferred from the decimators to the serial interface every 32 system clocks, if the DOCI output is not active (being read). If the micro controller reads the register faster than the update rate of the filter, the data read is “0”. The E931.06 generates an interrupt every 512 system clock cycles, if the microcontroller reads all 28 bits within 32 system clock cycles. The interrupt is indicated by the E931.06 by pulling DOCI high. The E931.06 accepts readout with µC defined timing. The interrupt signal can be ignored and reading frequency can be up to FCLK/64. In this mode, the µC has to force DOCI to a high level for the duration of 3 device clock cycles (3/FCLK) and subsequently read out the data bits as described in the timing diagram below. The microcontroller must wait for 1us. It then generates a low to high transition on the DOCI line, before it samples the data bit. The first bit read is the MSB. This process is repeated until DOCI Interface______________________________________________ LSB MSB tS tL tH tbit Data Bit tW TREP Micro controller drive Micro controller sample bit MOS device drive Data ready on MOS device Fig 3: Timing diagram for the DOCI interface 28 x Data Bit 13 12 2 1 0 13 12 CHANNEL0 2 1 0 TEMPERATURE TREP Fig 4: Data words available on DOCI interface Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 4/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 ADC Input Stage____________________________________________ Rp IP PIRIN Sp ADC Sn Rn NPIRIN Out of Range Fig 5: Input structure of the ADC Out of Range Detection The dynamic range of the ADC Input stage is approximately +/- 50mV. To avoid saturation, the E931.06 contains out of range detection logic, which detects values above 15872 (97% of range) and below 511 (3% of range). If the values are outside this range, the switches Sp and Sn are closed for the duration of 512 system clocks. This ensures fast settling after disturbances. The input impedance of the actual ADC (IP / IN) is practically infinite. Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 5/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 Pad Names__________________________________________________ Pad Name VSS NPIRIN PIRIN VDD Pin No. External Internal Internal External TO5-3 3 Int. Int. 1 Description Negative supply voltage Negative PIR sensor input Positive PIR sensor input Positive Supply voltage TCLK DOCI TEST Internal External Internal Int. 2 Int. Test clock, Leave Open Data Out Clock In, Soft driver, MCU interface Test mode select, Leave Open Table 3: Device Pin Out Pad Positions_________________________________________________ TEST VDD DOCI TCLK PIRIN0 Pad Name VDD PIRIN NPIRIN VSS TEST DOCI TCLK X 0.87 0.87 0.87 0.87 0.524 0.524 0.524 Y 0.983 0.452 0.257 0.084 1.049 0.918 0.687 Database 0.61 1.180 Table 4: Pad positions NPIRIN0 VSS Fig 6: Die with pad names top view Contact Information____________________________________________ Microsystems On Silicon (Pty) Ltd. Pretoria, South Africa Tel: +27 (12) 3488367 Fax: +27 (12) 3481790 email: [email protected] Visit our website for the latest information Elmos Semiconductor AG reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. Elmos Semiconductor AG Data Sheet 6/7 QM-No.: 25DS0089E.01 E931.06 SINGLE CHANNEL PIR SIGNAL PROCESSOR PRODUCTION DATA - DEC 1, 2015 WARNING – Life Support Applications Policy Elmos Semiconductor AG is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing Elmos Semiconductor AG products, to observe standards of safety, and to avoid situations in which malfunction or failure of an Elmos Semiconductor AG Product could cause loss of human life, body injury or damage to property. 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