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Finite Element Analysis Attacks Problems In Packaging

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Finite Element Analysis Attacks Problems in Packaging – Is Secondary Education Ready? William G. Daly, Physics Teacher Collins Hill High School Gwinnett County Public Schools, Georgia Summer Teacher Experience Program Utilizing Physics at Georgia Tech June 3 - July 26, 2013 Abstract • For  over  50  years,  Moore’s  law  has  driven  an  exponential  growth  in  system  capability  and  size  reduction,   approximately  doubling  transistor  density  every  18  months,  from  about  1cm    in  the  1950’s  to  hundreds  of  atoms   across today. Until recently, this advancement occurred in 2 dimensions, constructing integrated circuits on the top 20mm of silicon, by sometimes obvious and sometimes esoteric means. Along with density increases grew an enormous industry of semiconductor design, analysis and production tools to deal with the ever increasing challenges and complexities of these microscopic devices. At 200 atoms across it is obvious that the end of Moore’s  law,  at  least  in  2  dimensions,  is  not  far  off.    So  the  drive  continues  to  keep  Moore’s  law  alive.    An  obvious   advancement is to unconstrain the third dimension, stacking the 20mm layer within a single piece of silicon. Although this idea is not new, the challenges of doing so are immense, leaving 2 dimensional solutions an easier, more profitable pursuit. But as industry approaches the end of 2 dimensional densities, grappling with the issues of  utilizing  the  third  dimension  seem  more  attractive.    One  area  that  must  be  dealt  with  is  how  to  “drill”  through   each 20mm layer, creating Through Silicon Vias (TSVs) to get from one layer to the next. While the tooling to do so is challenging, the ability to create vias exists today, but not without technical hurdles in the finished product, not the least of which is a thermal expansion mismatch among the host semiconductor, insulator and conducting via. Evaluating this mismatch at such a microscopic level presents a challenge in analysis and measurement. One of focus in the Electromagnetic modeling, Packaging, Signal integrity, Integrated components Laboratory fOr Next generation systems (EPSILON) is modeling and analyzing electrical and mechanical interactions using finite element methods. A narrow slice of this effort is to evaluate commercial and open source Finite Element Modeling (FEM) software tools to model electrical and mechanical interactions at both the macroscopic and microscopic levels. The EPSILON group is concerned not only with packaging issues at the microscopic level, but also at the material system boundary, the antenna. Additional work was done to retrace processes for designing microstrip antennae for contemporary frequencies, in the neighborhood of 2GHz. It is hoped that an outgrowth of this effort will be introduction of technical challenges, opportunities, rudimentary analysis tools and projects in a pre-college academic setting. Introduction • Finite Element Analysis to Advance – Antenna Design – Integrated Circuit Design • A Few Tools of the Trade – – – – – – COMSOL Multiphysics – proprietary FEA * CST Microwave Studio – proprietary FEA * Elmer – open source FEA MATLAB * Paraview – open source * Express Schematic / PCB * Used as part of my during STEP-UP 2013. Theory – Packaging • How  did  we  get  from  here  (1987)  … Theory – Packaging • To  here  (2011)  …  Where’s  the  antenna?!? Theory – Packaging • How do we get from here? Intel Ivy Bridge Proceesor 4 Core Processor ~  ½”  on  an  edge ~1.5 Billion Transistors < $200 Feature  dimensions  ~  100’s  of  atoms Is  Moore’s  law  nearing  the  end??? Theory – Packaging • To here? Motherboard Outline:    14.9”  x  11.8”  x  3.3”   < $350 Theory – Packaging • All of the Processor circuitry is in the top layer of the silicon, epitaxial layer. Theory – Packaging • But this is a small fraction of the bulk silicon. Theory – Packaging • Next  we  have  to  put  the  silicon  chip  in  a  “box”. Theory – Packaging • Package mount into a ZIF socket. Theory – Packaging • Where is this on the motherboard? Theory – Packaging • If we scale active layer (epi)  to  the  table  top  … Theory – Packaging Is  Moore’s  Law  at  an  end? • Can we increase density 2 . in silicon without changing the motherboard? – Extreme UV  100 atom features in 2015. – Yield issues with planar increase in die size. • The 3rd Dimension is one answer. – Intels FINFET begins to go vertical – Maybe  the  chips  could  be  stacked  … Theory – Packaging 3D Integrate Circuits • The epi layer accounts for < 0.2% of the PC board height. PCB ~ 1600m  Theory – Packaging 3D Integrate Circuits PCB ~ 1600m  Theory – Packaging 3D – not without issues • How do you get out the heat? • How do you interconnect the layers? • Through silicon vias (TSV) • Drilled with eximer lasers or Deep Reactive Ion Etching • Vias filled with copper • Copper has over 5X thermal expansion than silicon. 𝜕 𝑑̅ • Solid mechanics modeling of TSV: 𝜌 𝜕𝑡 − 𝛻 𝜎 = 𝑓̅ Theory – Packaging Turn attention to antennas • Circuit board transmission lines Cu Ground Cu FR4 Insulator Cu Ground Stripline Cu FR4 Insulator Cu Ground Microstrip • Stripline >$, but better containment of fields • But what if you do not want to contain the fields? Theory – Packaging Dimensions for optimal resonance/ radiation • For 50 impedance: 120𝜋 𝑍𝑜 = 𝑤 𝑤 𝜖 + 1.393 + 0.667𝑙𝑛 + 1.44 𝑑 𝑑 • Rectangular patch dimensions: 1 𝐿= − 2∆𝐿 𝑓 𝜖 𝜇 𝜖 𝑊= 2 2𝑓 (𝜖 + 1)𝜇 𝜖 Theory – Packaging Design Objectives • Center frequency = 2GHz • Two port RF network – antenna has only one 𝑠 𝑠 transmission line port: 𝑠 𝑠 • Minimize reflected power s11 • Return loss: 𝑅𝐿 = 20𝑙𝑜𝑔 𝑠 < -10dB Methodology – Optimize / Analyze Design with FEA • Generic flow Computer Aided Design File (CAD) Create/Refine Mesh GMSH.exe Convert Mesh Set Up Solver Parameters ElmerMesh.exe ElmerGUI Run Solver ElmerGUI Visualization Paraview Methodology – Preliminary Antenna Design Methodology – Optimize Return Loss with Electromagnetic FEA CST Microwave Studio Methodology – Model Far Field with Electromagnetic FEA CST Microwave Studio Methodology – Customize Design CST Microwave Studio Methodology – Customize Design CST Microwave Studio Methodology – Return to TSV discussion CAD Model and Mesh in GMSH (open source) 2D CAD Model Extrude / Define Facets Define Cube Physical Volume Mesh Define Cylinder Physical Volume Methodology – Return to TSV discussion CAD Model and Mesh in GMSH (open source) 2D CAD Model Extrude / Define Facets Define Cube Physical Volume Mesh Define Cylinder Physical Volume Methodology – Completed Model Facets Copper Silicon Results and Discussion – ELMER / Paraview Solver Equation, Material Assignment, Boundary Conditions, Initial Conditions Von Mises Stress with Improper selection of boundary conditions. Results and Discussion – ELMER / Paraview Solver Equation, Material Assignment, Boundary Conditions, Initial Conditions Simulation of Von Mises Stress for T = 145C Results and Discussion – ELMER / Paraview • Eigen modes of circular membrane • The model • The demonstration Results and Discussion – ELMER / Paraview Antenna Implementation • Antenna Fabrication – Requires $26000 VNA to test – Circuit on the right RSSI for classroom use • Collaborate with high school students for design and test: Results and Discussion – ELMER / Paraview Return  Loss  of  “Mickey  Mouse”  Antenna Return Loss of 2GHz Patch Antenna with Elliptical Pattern 0 -5 -10 -15 S11 (dB) -20 -25 -30 -35 -40 0 1000000000 2000000000 3000000000 Frequency (Hz) 4000000000 5000000000 6000000000 Conclusion • Research objectives – Succeeded in modeling TSVs with open source finite element software • Next steps – Explore different geometries – Implement test configuration – Designed, analyzed and tested 2GHz patch attenna • Next step is to complete RSSI circuit • Classroom objectives – Discovered open source method of introducing FEA – Constructed  “hands  on”  approach  to  demonstrating   FEA in project based activities Acknowledgements • Prof. Madhavan Swaminathan, John Pippin Chair in Electromagnetics - Advisor • Mixed Signal Design Group Graduate Students - Mentors – Munmun Islam – Kyu Hwan Han – Jianyong Xie • • • • Dr. Leyla Conrad, Outreach Director Nirvana Edwards, Outreach Coordinator Georgia Tech for support of the Step-Up Program National Science Foundation for support of STEM initiative grant # CMMI-1129918