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Hexfet Power Mosfet Irf5m3205 Thru-hole (to-254aa)

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PD - 94292A HEXFET® POWER MOSFET THRU-HOLE (TO-254AA) IRF5M3205 55V, N-CHANNEL Product Summary Part Number BVDSS IRF5M3205 55V RDS(on) 0.015Ω ID 35A* Fifth Generation HEXFET® power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits. TO-254AA Features: n n n n n n n Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 10V, TC = 25°C ID @ VGS = 10V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current ➀ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy ➁ Avalanche Current ➀ Repetitive Avalanche Energy ➀ Peak Diode Recovery dv/dt ➂ Operating Junction Storage Temperature Range Lead Temperature Weight Units 35* 35* 140 125 1.0 ±20 475 35 12.5 2.6 -55 to 150 A W W/°C V mJ A mJ V/ns o 300 (0.063in./1.6mm from case for 10s) 9.3 (Typical) C g * Current is limited by package For footnotes refer to the last page www.irf.com 1 08/28/01 IRF5M3205 Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified) Parameter Min IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD l Ciss C oss C rss Typ Max Units Test Conditions 55 — — V VGS = 0V, ID = 250µA — 0.056 — V/°C Reference to 25°C, ID = 1.0mA — — 0.015 Ω 2.0 34 — — — — — — 4.0 — 25 250 V S( ) Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (‘Miller’) Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance — — — — — — — — — — — — — — — — — — — 6.8 100 -100 170 32 74 22 80 70 55 — Input Capacitance Output Capacitance Reverse Transfer Capacitance — — — 3600 1200 445 — — — VGS = 10V, ID = 35A ➃ VDS = VGS, ID = 250µA VDS =15V, IDS = 35A ➃ VDS = 55V ,VGS=0V VDS = 44V, VGS = 0V, TJ =125°C VGS =-20V VGS = -20V VGS =10V, ID = 35A VDS = 44V Ω BVDSS Drain-to-Source Breakdown Voltage ∆BV DSS/∆T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS Zero Gate Voltage Drain Current µA nA nC VDD = 28V, ID = 35A, VGS = 10V, RG = 2.5Ω ns nH pF Measured from drain lead (6mm / 0.25in. from package ) to source lead (6mm/0.25in. from pacakge VGS = 0V, VDS = 25V f = 1.0MHz Source-Drain Diode Ratings and Characteristics Parameter IS ISM VSD t rr QRR ton Min Typ Max Units Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) ➀ Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time — — — — — — — — — — 35* 140 1.3 130 410 Test Conditions A V ns nC Tj = 25°C, IS = 35A, VGS = 0V ➃ Tj = 25°C, IF = 35A, di/dt ≤ 100A/µs VDD ≤ 25V ➃ Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. * Current is limited by package Thermal Resistance Parameter RthJC Junction-to-Case Min Typ Max Units — — 1.0 Test Conditions °C/W Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page 2 www.irf.com IRF5M3205 1000  1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) 100 100 4.5V 10 20µs PULSE WIDTH  T = 25 C 1 4.5V 10 10 100 TJ = 25 ° C  100 TJ = 150 ° C  15  V DS = 25V 20µs PULSE WIDTH 8.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com R DS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 2.0 7.0 10 100 Fig 2. Typical Output Characteristics 1000 6.0 1 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 5.0 ° J 1 0.1 VDS , Drain-to-Source Voltage (V) 10 4.0 20µs PULSE WIDTH  T = 150 C ° J 1 0.1  VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP TOP ID = 35A  1.5 1.0 0.5 0.0 -60 -40 -20 VGS = 10V  0 20 40 60 80 100 120 140 160 TJ , Junction Temperature( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRF5M3205 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd C, Capacitance (pF) 6000 4500 Ciss  3000 C oss 1500 Crss  20 VGS , Gate-to-Source Voltage (V)  7500 ID = 35A  16 12 8 4  FOR TEST CIRCUIT SEE FIGURE 13 0 0 1 10 0 100 50 100 150 200 Q G , Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 ID, Drain-to-Source Current (A) 1000 ISD, Reverse Drain Current (A)  VDS = 44V VDS = 27V VDS = 11V 100 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 T J = 150°C 10 T J = 25°C 1 100µs 10ms Tc = 25°C Tj = 150°C Single Pulse VGS = 0V 1 0.1 0.0 0.5 1.0 1.5 2.0 VSD, Source-toDrain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 1ms 10 2.5 1 10 100 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRF5M3205 80 RD V DS  LIMITED BY PACKAGE I D , Drain Current (A) VGS D.U.T. RG 60 + -V DD VGS Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 40 Fig 10a. Switching Time Test Circuit 20 VDS 90% 0 25 50 75 100 125 150 TC , Case Temperature ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50  0.20 PDM 0.10 0.1 t1 0.05 0.02 0.01 0.01 0.00001 t2   SINGLE PULSE (THERMAL RESPONSE) 0.0001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF5M3205  1 5V D .U .T. RG + V - DD IA S VGS 20V tp ID 15.7A 22A BOTTOM 35A TOP 1000 D R IV E R L VD S EAS , Single Pulse Avalanche Energy (mJ) 1200 A 0 .0 1 Ω Fig 12a. Unclamped Inductive Test Circuit V (B R )D S S 800 600 400 200 0 25 50 75 100 125 150 Starting TJ , Junction Temperature( °C) tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Current Regulator Same Type as D.U.T. Fig 12b. Unclamped Inductive Waveforms 50KΩ .2µF 12V .3µF QG 10V D.U.T. QGS + V - DS QGD VGS VG 3mA IG Charge Fig 13a. Basic Gate Charge Waveform 6 ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRF5M3205 Footnotes:  Repetitive Rating; Pulse width limited by ƒ ISD ≤ 35A, di/dt ≤ 230 A/µs, maximum junction temperature. ‚ VDD = 25 V, Starting TJ = 25°C, L= 0.8 mH Peak IAS = 35A, VGS =10V, RG= 25Ω „ Pulse width ≤ 300 µs; Duty Cycle ≤ 2% VDD ≤ 55V, TJ ≤ 150°C Case Outline and Dimensions — TO-254AA 0.12 [.005] 3 .7 8 ( .14 9 ) 3 .5 3 ( .13 9 ) -A - 2 0 .3 2 ( .8 0 0 ) 2 0 .0 7 ( .7 9 0 ) 17 .4 0 ( .6 8 5 ) 16 .8 9 ( .6 6 5 ) 3 1 .4 0 ( 1.2 3 5 ) 3 0 .3 9 ( 1.1 9 9 ) 6 .6 0 ( .2 6 0 ) 6 .3 2 ( .2 4 9 ) 1 2 1 3 .8 4 ( .5 4 5 ) 1 3 .5 9 ( .5 3 5 ) 3 -C - -B - A 1 .2 7 ( .0 5 0 ) 1 .0 2 ( .0 4 0 ) 22.73 [.895] 21.21 [.835] 3X 13.84 [.545] 13.59 [.535] LEGEND 1 1 - C O LL 2 - E M IT 3 - G A TE 3.81 [.150] 1 .1 4 ( .0 4 5 ) 0 .8 9 ( .0 3 5 ) .50 ( .0 2 0 ) .25 ( .0 1 0 ) 20.32 [.800] 20.07 [.790] 17.40 [.685] 16.89 [.665] 4.82 [.190] 3.81 [.150] 3 .8 1 ( .1 5 0 ) 2X 6.60 [.260] 6.32 [.249] 13.84 [.545] 13.59 [.535] 3.78 [.149] 3.53 [.139] .1 2 ( .0 0 5 ) 1 3 .8 4 ( .5 4 5 ) 1 3 .5 9 ( .5 3 5 ) 3 .8 1 ( .1 5 0 ) 2X 2 1.27 [.050] 1.02 [.040] B R 1.52 [.060] 3 4.06 [.160] 3.56 [.140] 3X 1.14 [.045] 0.89 [.035] 0.36 [.014] B A M C A M B M C LEGEND 1- DRAIN 2- SOURCE 3- GATE IRHM57163SED IRHM57163SEU CAUTION BERYLLIA WARNING PER MIL-PRF-19500 Packages containing beryllia shall not be ground, sandblasted, machined, or have other operations performed on them which will produce beryllia or beryllium dust. Furthermore, beryllium oxide packages shall not be placed in acids that will produce fumes containing beryllium. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 08/01 www.irf.com 7