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Infrared Imaging Components For Use In Automotive Safety

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Infrared Imaging Components for Use in Automotive Safety Applications (ICU) Frank Niklaus, KTH-MST Kick-off: 1 May 2008 Duration: 30 months Supported by the European Community, FP7 framework Information and Communication Technologies Programme Low Cost Far Infrared Camera for Vision Enhancement and Injury Mitigation • Enhance driver awareness • Warn the driver for pedestrians in risk zone • Low IR system cost is a prerequisite Picture source: BMW AG Research Focus in ICU Diffractive IR optics IR detector chip, 320x240 array with 25x25 and 20x20 µm2 pixel pitch Wafer-level vacuum package MEMS-based camera integration/assembly concepts Component evaluation ICU Vision is a Wafer-Level Integrated IR Camera ICU Consortium Infineon Technologies SensoNor AS, Norway Autoliv, Sweden KTH - Royal Institute of Technology, Sweden Acreo AB, Sweden Vrije Universiteit Brussel, Belgium Umicore NV, Belgium Project Organization WP8: Dissemination and Promotion WP1: Project Management WP2: Bolometer design and integration WP3: Wafer-level vacuum package KTH Acreo Autoliv SensoNor SensoNor KTH Autoliv WP4: Full size infrared bolometer focal plane array Acreo, KTH, SensoNor, Autoliv WP5: MEMS based integration of infrared optics for 1 st level camera module WP6: Infrared optics SensoNor Umicore Autoliv KTH Umicore VUB SensoNor Autoliv WP7: InfraredInfrared camera module evaluation Autoliv 3D IC Integration of SiGe IR Bolometers KTH, Acreo, Infineon Polymer Adhesive SOI Wafer SOI Wafer Mono-Crystalline Si IC Contact Pads IC Wafer IC Wafer IC Wafer (a) (b) Vias Via Holes IC Wafer (d) (c) IC-Integrated MEMS IC Wafer (e) IC Wafer (f) • 3D IC integrated MEMS enables high-performance IR bolometer materials (Si/SiGe) on CMOS integrated circuits (ROICs). • Imaging chips can be manufactured in commercial MEMS foundries. • Improved bolometer performance allows for wafer-level vacuum packaging. Quantum Well Si/SiGe Bolometers • Large temperature coefficient of resistance & very low 1/f noise due to epitaxially grown single crystalline material. Bolometer based on amorphous silicon Quantum well based bolometer Simulations of NETD QW Si/SiGe IR Bolometers Si/SiGe QW layers R(T) Barrier QW E Contact Metal Wafer-Level Vacuum Packaging of IR Bolometer Array Infineon, KTH, Autoliv • Implementation of a low-cost CMOS compatible wafer-level vacuum packaging. • Cavity target pressure of 0.001 mbar. • Packaging technology compatible with standard CMOS processes and the 1st level camera integration approach. Wafer-Level Vacuum Packaging with Getter Material Wafer processing including getter and vacuum level sensors. Fully implemented wafer bonding process in high-vacuum targeting 0.001 mbar. IR Optics Umicore, VUB, Infineon, Autoliv • Design of diffractive multilevel optics • “Flat” lens designs • Lens in package integration MEMS Based Integration Concepts for 1st Level Camera Modules Infineon, Umicore, Autoliv, KTH • Development of 1st level camera design and mechanics that enables a MEMS manufacturing strategy for integrating bolometer and optics. • Adaptation of the lenses of WP6 to be suitable for integration into MEMS processes. Diffractive IR optics WL Vacuum package System-Level FP7 Project Complementary to ICU FNIR - Fusing Far-Infrared and Near-Infrared Imaging for Pedestrian Injury Mitigation ICT-2007.6.1: ICT for intelligent vehicles and mobility services (start Jan 2008) Objectives: Demonstrate the next generation Night Vision Enhancement system (NVE) with FIR and NIR sensor signal fusion to increase performance for automatic detection of pedestrians ( www.fnir.eu ). Daimler (D), Autoliv (S), Infineon (N), Umicore (B) Acreo (S), KTH-MST (S), Linköping University (S) Questions…?