Transcript
SYSTEM DIAGRAM Digital Sight Series CFI 10x
Dynamic Auto-Focus Unit for Microscope System Integration LV-DAF
USB
CFI UW 10x
Z
DS-L2
PC
USB
G F.N. ø22
C-mount TV Adapter
H F.N. ø25
G H
USB LV-Set up (SDK, Set up) • NIS-Elements
RS232C
G LV-TT2 Tilting Trinocular Tube
H
LV-TI3 Trinocular Tube TI3 ESD
X
DS-U2
L2A-ANB Analyzer B for AF
•
W
Z
V W Z
Z
Y
LV-ECON E Controller
W L2-DIC DIC Prism
LV-NU5A Motorized Nosepiece or LV-NU5AC U5AC Nosepiece (Motorized)
A
L2-DIC High Contrast DIC Prism
Y
LV-UEPI2A Motorized Universal Epi-illuminator 2 *1
X
White LED Illuminator LV-EPILED
A LV-FMA Motorized Focusing Module A
Y
NDF Slide Achro Condenser for LV-AF (Make to order)
X
Y
F
D F
LV-EPI EPI Base
LV-DIA DIA Base
TE2-PS100W Power Supply
LV-LH50PC 12V50W Lamphouse F´
B
F´
X
F´
LV-HGFA HG Fiber Adapter
B C
LV-SUB Substage
F
E
LV-CR Column Riser 35
D
A
B C
LVAF 45IRC Filter for DIA Illuminator
LV-IMA Motorized Focusing Module A
E
Objective Lens
C-SP Simple Polarizer
User Equipment Digital I/O Cable (Designed by user)
LED Controller
Dynamic Auto-Focus Unit for Microscope System Integration
LV-MDIC Motorized DIC Module
E
LV-S32 3x2 Stage
X
V
X
F´
X
LNF-LWD Condenser for LV-AF
AF Controller
LV-EPILED IR Cut Filter
F
Objective Lens
RS232C
Surugaseiki B23-60CR
F´ LVUEPI2-DLS Double Light Source Adapter
LV-SUB Substage 2
C-HGFIE Fiber Light Source (E)
*1: Also, LV-UEPI and LV-UEPI2 can be configured with the LV-DAF Unit. (This universal illuminator cannot be controlled externally.)
Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. September 2008 ©2008 NIKON CORPORATION N.B. Export of the products* in this brochure is controlled under the Japanese Foreign Exchange and Foreign Trade Law. Appropriate export procedure shall be required in case of export from Japan. *Products: Hardware and its technical information (including software)
ISO 14001 Certified for NIKON CORPORATION
NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290, Japan phone: +81-3-6433-3705 fax: +81-3-6433-3785
ISO 9001 Certified for NIKON CORPORATION Microscope Solutions Business Unit Industrial Metrology Business Unit
http://www.nikon.com/instruments/
NIKON METROLOGY, INC.
NIKON SINGAPORE PTE LTD.
NIKON METROLOGY UK LTD.
12701 Grand River Avenue, Brighton, MI 48116 U.S.A. phone: +1-810-220-4360 fax: +1-810-220-4300
SINGAPORE phone: +65-6559-3651 fax: +65-6559-3668
UNITED KINGDOM phone: +44-1332-811-349 fax: +44-1332-639-881
NIKON MALAYSIA SDN. BHD.
E-mail:
[email protected]
E-mail:
[email protected] http://www.nikonmetrology.com/
MALAYSIA phone: +60-3-7809-3688 fax: +60-3-7809-3633
NIKON METROLOGY SARL
PT. NIKON INDONESIA
FRANCE phone: +33-1-60-86-09-76 fax: +33-1-60-86-57-35
NIKON METROLOGY EUROPE NV Geldenaaksebaan 329, 3001 Leuven, Belgium phone: +32-16-74-01-00 fax: +32-16-74-01-03
INDONESIA phone: +62-21-574-6262 fax: +62-21-574-6363
Nikon Sales (Thailand) Co., Ltd.
Email:
[email protected] http://www.nikonmetrology.com/
THAILAND phone: +66-2633-5100 fax: +66-2633-5191
NIKON INSTRUMENTS (SHANGHAI) CO., LTD.
INDIA phone: +91-124-4688500 fax: +91-124-4688527
CHINA phone: +86-21-6841-2050 fax: +86-21-6841-2060 (Beijing branch) phone: +86-10-5831-2028 fax: +86-10-5831-2026 (Guangzhou branch) phone: +86-20-3882-0550 fax: +86-20-3882-0580
NIKON CANADA INC.
NIKON INSTRUMENTS KOREA CO., LTD.
ITALY phone: +39-055-300-96-01 fax: +39-055-30-09-93
KOREA phone: +82-2-2186-8400 fax: +82-2-555-4415
Printed in Japan (0809-03) Am/M
NIKON INDIA PRIVATE LIMITED
CANADA phone: +1-905-602-9676 fax: +1-905-602-9953
NIKON INSTRUMENTS S.p.A.
Code No. 2CE-KZAH-1
E-mail:
[email protected]
NIKON METROLOGY GMBH GERMANY phone: +49-6023-91733-0 fax: +49-6023-91733-229
Delivers fast, versatile auto-focus with the newly developed and unique Hybrid Auto-Focus system. The LV-DAF makes the most of two types of auto-focus systems.
E-mail:
[email protected]
Comes with Nikon’s Auto-Adjustment Program, increasing efficiency by ensuring rapid startup. Supports a variety of observation methods, including brightfield, darkfield, and differential interference contrast (DIC), as well as various transparent samples such as liquid crystal and glass panels.
DIMENSIONS LV-DAF + LV-FMA + LV-EPI Base + LV-UEPI2A (Microscope set)
The Hybrid Auto-Focus features large focus range and fast tracking ability BF DF FL1 FLFL2
FL1
What is Hybrid Auto-Focus? There are two common types of auto-focus systems for microscopes: slit projection and contrast detection. Slit projection system projects a slit image and then detects the shift in the reflected light. This system is useful when a large focal range is necessary. Contrast detection system projects a slit pattern and then detects the contrast of the reflected light. This system is useful when focus accuracy is needed. This is possible because this auto-focus system is less affected by sample surface variation.
FL2
CCD
3 segment prism Dichroic mirror
Half mask LED
Single slit (for slit AF)
Half mirror
79
250
341
LED Objective lens
Hybrid Auto-Focus combines the advantages of both systems and makes the most of their paired potential.
Multi slit Sample
LV-DAF + LV-IMA + LV-EPILED (System integration set)
60 114
Features 1 Focal range is remarkably larger than with contrast detection alone. This means that samples with distortions on their surface, such as a liquid crystal 122
113.5
substrate, can be rapidly tracked, thereby enabling speedy focusing. 2 The LV-DAF uses a bright LED for the auto-focus light source. And since it also automatically adjusts the auto-focus light volume for the sample, it can
support samples ranging from low to high reflectivity. 3 A wide range of observation methods is supported, including brightfield, darkfield, and DIC. Reflective samples and transparent samples are also both
118
170
supported.
298
4 The Auto-Adjustment Program, that is included as standard, enables simple and speedy system setup. The program performs immediate auto-adjustment
after the user focuses the system and presses the button to start the setup. It is also possible to automatically set/register optimal parameters for each type of sample and recall them in accordance to the sample being photographed.
95
5 The LV-DAF can be controlled from a PC or a DS-L2 digital camera system for microscopes via USB or RS232C. 6 The LV-DAF can be combined with other LV series products. When combined with the LV-ECON, it enables observation under the optimal conditions for 139
each particular sample. 7 The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and
59 (60~40)
used anywhere. 8 Nikon provides a software development kit (SDK) for integrating the LV-DAF into a variety of systems. (Compatibility is only guaranteed for Nikon products.)
Product specifications
AF offset feature Minimum drive resolution
Enables observation with precise adjustment of focal position while applying auto-focus 0.05 µm*1
External communication Power source
RS232C, USB, and parallel I/O 100-240 V AC, 1.0 A, 50/60 Hz
*1. Some limitations for 2.5x and 100x. *2. Using Nikon’s standard Cr vapor deposition sample. *3. Using the LV-IMA or LV-FMA. Note: The LV-ECON Controller (available separately) is required when using a motorized revolver.
14
101 87
62
165 113.5
Continuous mode and search mode (single, continuous) Focal range without searching (brightfield)*2 2.5x: 5.5 mm or more, 5x: 4.5 mm or more, 10x: 1.3 mm or more, 20x: 320 µm or more, 50x: 50 µm or more, 100x: 10 µm or more Focal time 0.7 seconds or less (20x: 200µm with no search)*2 *3 Focal precision (repeated reproducibility) 1/2 or less of focal depth*2 *3
LV-DAF (controller)
122
Auto-focus modes Focal range
LV-DAF (unit)
210 118 298
55
Hybrid system combining slit projection with contrast detection Near-IR LED (λ = 770 nm) CFI60 objective lens 2.5x-100x (includes extra-long working distance (ELWD), super-long working distance (SLWD), and CR for LCD substrate inspection)*1
5
Detection system Auto-focus light source Objective lens
SYSTEM DIAGRAM Digital Sight Series CFI 10x
Dynamic Auto-Focus Unit for Microscope System Integration LV-DAF
USB
CFI UW 10x
Z
DS-L2
PC
USB
G F.N. ø22
C-mount TV Adapter
H F.N. ø25
G H
USB LV-Set up (SDK, Set up) • NIS-Elements
RS232C
G LV-TT2 Tilting Trinocular Tube
H
LV-TI3 Trinocular Tube TI3 ESD
X
DS-U2
L2A-ANB Analyzer B for AF
•
W
Z
V W Z
Z
Y
LV-ECON E Controller
W L2-DIC DIC Prism
LV-NU5A Motorized Nosepiece or LV-NU5AC U5AC Nosepiece (Motorized)
A
L2-DIC High Contrast DIC Prism
Y
LV-UEPI2A Motorized Universal Epi-illuminator 2 *1
X
White LED Illuminator LV-EPILED
A LV-FMA Motorized Focusing Module A
Y
NDF Slide Achro Condenser for LV-AF (Make to order)
X
Y
F
D F
LV-EPI EPI Base
LV-DIA DIA Base
TE2-PS100W Power Supply
LV-LH50PC 12V50W Lamphouse F´
B
F´
X
F´
LV-HGFA HG Fiber Adapter
B C
LV-SUB Substage
F
E
LV-CR Column Riser 35
D
A
B C
LVAF 45IRC Filter for DIA Illuminator
LV-IMA Motorized Focusing Module A
E
Objective Lens
C-SP Simple Polarizer
User Equipment Digital I/O Cable (Designed by user)
LED Controller
Dynamic Auto-Focus Unit for Microscope System Integration
LV-MDIC Motorized DIC Module
E
LV-S32 3x2 Stage
X
V
X
F´
X
LNF-LWD Condenser for LV-AF
AF Controller
LV-EPILED IR Cut Filter
F
Objective Lens
RS232C
Surugaseiki B23-60CR
F´ LVUEPI2-DLS Double Light Source Adapter
LV-SUB Substage 2
C-HGFIE Fiber Light Source (E)
*1: Also, LV-UEPI and LV-UEPI2 can be configured with the LV-DAF Unit. (This universal illuminator cannot be controlled externally.)
Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. September 2008 ©2008 NIKON CORPORATION N.B. Export of the products* in this brochure is controlled under the Japanese Foreign Exchange and Foreign Trade Law. Appropriate export procedure shall be required in case of export from Japan. *Products: Hardware and its technical information (including software)
ISO 14001 Certified for NIKON CORPORATION
NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290, Japan phone: +81-3-6433-3705 fax: +81-3-6433-3785
ISO 9001 Certified for NIKON CORPORATION Microscope Solutions Business Unit Industrial Metrology Business Unit
http://www.nikon.com/instruments/
NIKON METROLOGY, INC.
NIKON SINGAPORE PTE LTD.
NIKON METROLOGY UK LTD.
12701 Grand River Avenue, Brighton, MI 48116 U.S.A. phone: +1-810-220-4360 fax: +1-810-220-4300
SINGAPORE phone: +65-6559-3651 fax: +65-6559-3668
UNITED KINGDOM phone: +44-1332-811-349 fax: +44-1332-639-881
NIKON MALAYSIA SDN. BHD.
E-mail:
[email protected]
E-mail:
[email protected] http://www.nikonmetrology.com/
MALAYSIA phone: +60-3-7809-3688 fax: +60-3-7809-3633
NIKON METROLOGY SARL
PT. NIKON INDONESIA
FRANCE phone: +33-1-60-86-09-76 fax: +33-1-60-86-57-35
NIKON METROLOGY EUROPE NV Geldenaaksebaan 329, 3001 Leuven, Belgium phone: +32-16-74-01-00 fax: +32-16-74-01-03
INDONESIA phone: +62-21-574-6262 fax: +62-21-574-6363
Nikon Sales (Thailand) Co., Ltd.
Email:
[email protected] http://www.nikonmetrology.com/
THAILAND phone: +66-2633-5100 fax: +66-2633-5191
NIKON INSTRUMENTS (SHANGHAI) CO., LTD.
INDIA phone: +91-124-4688500 fax: +91-124-4688527
CHINA phone: +86-21-6841-2050 fax: +86-21-6841-2060 (Beijing branch) phone: +86-10-5831-2028 fax: +86-10-5831-2026 (Guangzhou branch) phone: +86-20-3882-0550 fax: +86-20-3882-0580
NIKON CANADA INC.
NIKON INSTRUMENTS KOREA CO., LTD.
ITALY phone: +39-055-300-96-01 fax: +39-055-30-09-93
KOREA phone: +82-2-2186-8400 fax: +82-2-555-4415
Printed in Japan (0809-03) Am/M
NIKON INDIA PRIVATE LIMITED
CANADA phone: +1-905-602-9676 fax: +1-905-602-9953
NIKON INSTRUMENTS S.p.A.
Code No. 2CE-KZAH-1
E-mail:
[email protected]
NIKON METROLOGY GMBH GERMANY phone: +49-6023-91733-0 fax: +49-6023-91733-229
Delivers fast, versatile auto-focus with the newly developed and unique Hybrid Auto-Focus system. The LV-DAF makes the most of two types of auto-focus systems.
E-mail:
[email protected]
Comes with Nikon’s Auto-Adjustment Program, increasing efficiency by ensuring rapid startup. Supports a variety of observation methods, including brightfield, darkfield, and differential interference contrast (DIC), as well as various transparent samples such as liquid crystal and glass panels.
