Transcript
CERTIFICATE Issued Date: March 03, 2011 Report No. : 112040R-ITCEP07V06 This is to certify that the following designated product Product : Notebook Trade name : msi Model Number : MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, S-176E, MS-176F, MS-176G, MS-176H, MS-176I, MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, S-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank), GXzzzz(z=0~9,a~z,A~Z or blank) Company Name : MICRO-STAR INT’L Co., LTD. This product, which has been issued the test report listed as above in QuieTek Laboratory, is based on a single evaluation of one sample and confirmed to comply with the requirements of the following EMC standard. EN 55022:2006+A1: 2007, Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006+A2: 2009
IEC 61000-4-2: 2008
EN 61000-3-3:2008
IEC 61000-4-3: 2008 IEC 61000-4-4: 2004 IEC 61000-4-5: 2005 IEC 61000-4-6: 2008 IEC 61000-4-8: 2009 IEC 61000-4-11: 2004
TEST LABORATORY
Vincent Lin / Manager
No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:
[email protected]
http://www.quietek.com
Test Report
Product Name ： Notebook Model No. ： MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, MS-176E, MS-176F, MS-176G, MS-176H, MS-176I, MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, MS-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank), GXzzzz(z=0~9,a~z,A~Z or blank)
Applicant ： MICRO-STAR INT’L Co., LTD. Address ： No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan
Date of Receipt ： 2011/01/28 Issued Date
： 2011/03/03
Report No.
： 112040R-ITCEP07V06
Report Version ： V1.0
The test results relate only to the samples tested. The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity We herewith confirm the following designated products to comply with the requirements set out in the Council Directive on the approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC) with applicable standards listed below.
Product
: Notebook
Trade name
: msi : MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, S-176E, MS-176F, MS-176G, MS-176H, MS-176I, MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, S-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank),GXzzzz(z=0~9,a~z,A~Z or blank)
Model Number
: EN 55022: 2006+A1: 2007, Class B
Applicable Harmonized Standards under Directive
EN 55024: 1998+A1: 2001+A2: 2003
2004/108/EC
EN 61000-3-2:2006+A2: 2009 EN 61000-3-3:2008
Company Name
:
Company Address : Telephone
:
Facsimile :
Person in responsible for marking this declaration:
Name (Full Name)
Title/ Department
Date
Legal Signature
Date: March 03, 2011
Accredited by NVLAP, TAF-CNLA, DNV, TUV, Nemko QTK No.: 112040R-ITCEP07V06
Statement of Conformity This statement is to certify that the designated product below. Product Trade name
: Notebook : msi MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, S-176E, MS-176F, MS-176G, MS-176H, MS-176I, Model Number : MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, S-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank),GXzzzz(z=0~9,a~z,A~Z or blank) Company Name : MICRO-STAR INT’L Co., LTD. Applicable Standards : EN 55022: 2006+A1: 2007, Class B EN 55024: 1998+A1: 2001+A2: 2003 EN 61000-3-2:2006+A2: 2009 EN 61000-3-3:2008
One sample of the designated product has been tested and evaluated in our laboratory to find in compliance with the applicable standards above. The issued test report(s) show(s) it in detail. Report Number
:
112040R-ITCEP07V06
TEST LABORATORY
Vincent Lin / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
Quietek Corporation / No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. Tel: 866-2-8601-3788, Fax: +886-2-8601-3789, E-mail:
[email protected]
Report No：112040R-ITCEP07V06
Test Report Certification Issued Date Report No.
Product Name Applicant Address Manufacturer Model No.
: : : : :
EUT Rated Voltage EUT Test Voltage Trade Name Applicable Standard
: : : :
Test Result Performed Location
: :
Documented By
:
: 2011/03/03 : 112040R-ITCEP07V06
Notebook MICRO-STAR INT’L Co., LTD. No. 69, Li-De St., Jung-He District, New Taipei City, Taiwan MICRO-STAR INT’L Co., LTD. MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, MS-176E, MS-176F, MS-176G, MS-176H, MS-176I, MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, MS-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank), GXzzzz(z=0~9,a~z,A~Z or blank) AC 100-240V, 50-60Hz AC 230 V / 50 Hz msi EN 55022: 2006+A1: 2007, Class B EN 55024: 1998+A1: 2001+A2: 2003 EN 61000-3-2:2006+A2: 2009 EN 61000-3-3:2008 Complied Quietek Corporation (Linkou Laboratory) No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
( Senior Adm. Specialist / Rita Huang ) Reviewed By
: ( Senior Engineer / Leo Lin )
Approved By
: ( Manager / Vincent Lin ) Page: 2 of 173
Report No：112040R-ITCEP07V06
Laboratory Information We, QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes: Taiwan R.O.C.
:
BSMI, NCC, TAF
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site : http://www.quietek.com/tw/ctg/cts/accreditations.htm The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory : No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail :
[email protected]
LinKou Testing Laboratory : No.5-22, Ruishukeng, Linkou Dist., New Taipei City 24451, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail :
[email protected]
Suzhou (China) Testing Laboratory : No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China. TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail :
[email protected]
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Report No：112040R-ITCEP07V06
TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7 1.1. EUT Description ...................................................................................................... 7 1.2. Mode of Operation .................................................................................................. 9 1.3. Tested System Details........................................................................................... 13 1.4. Configuration of Tested System ............................................................................ 14 1.5. EUT Exercise Software ......................................................................................... 15 2. Technical Test ........................................................................................................... 16 2.1. Summary of Test Result ........................................................................................ 16 2.2. List of Test Equipment ........................................................................................... 17 2.3. Measurement Uncertainty ..................................................................................... 20 2.4. Test Environment .................................................................................................. 22 3. Conducted Emission (Main Terminals)...................................................................... 23 3.1. Test Specification .................................................................................................. 23 3.2. Test Setup ............................................................................................................. 23 3.3. Limit....................................................................................................................... 23 3.4. Test Procedure ...................................................................................................... 24 3.5. Deviation from Test Standard ................................................................................ 24 3.6. Test Result ............................................................................................................ 25 3.7. Test Photograph .................................................................................................... 43 4. Conducted Emissions (Telecommunication Ports).................................................... 46 4.1. Test Specification .................................................................................................. 46 4.2. Test Setup ............................................................................................................. 46 4.3. Limit....................................................................................................................... 46 4.4. Test Procedure ...................................................................................................... 47 4.5. Deviation from Test Standard ................................................................................ 47 4.6. Test Result ............................................................................................................ 48 4.7. Test Photograph .................................................................................................... 75 5. Radiated Emission.................................................................................................... 78 5.1. Test Specification .................................................................................................. 78 5.2. Test Setup ............................................................................................................. 78 5.3. Limit....................................................................................................................... 79 5.4. Test Procedure ...................................................................................................... 80 5.5. Deviation from Test Standard ................................................................................ 80 5.6. Test Result ............................................................................................................ 81 5.7. Test Photograph .................................................................................................... 93 6. Harmonic Current Emission ...................................................................................... 98 Page: 4 of 173
Report No：112040R-ITCEP07V06
6.1. Test Specification .................................................................................................. 98 6.2. Test Setup ............................................................................................................. 98 6.3. Limit....................................................................................................................... 98 6.4. Test Procedure .................................................................................................... 100 6.5. Deviation from Test Standard .............................................................................. 100 6.6. Test Result .......................................................................................................... 101 6.7. Test Photograph .................................................................................................. 107 7. Voltage Fluctuation and Flicker ............................................................................... 109 7.1. Test Specification ................................................................................................ 109 7.2. Test Setup ........................................................................................................... 109 7.3. Limit..................................................................................................................... 109 7.4. Test Procedure .................................................................................................... 110 7.5. Deviation from Test Standard .............................................................................. 110 7.6. Test Result ...........................................................................................................111 7.7. Test Photograph .................................................................................................. 114 8. Electrostatic Discharge ........................................................................................... 116 8.1. Test Specification ................................................................................................ 116 8.2. Test Setup ........................................................................................................... 116 8.3. Limit..................................................................................................................... 116 8.4. Test Procedure .................................................................................................... 117 8.5. Deviation from Test Standard .............................................................................. 117 8.6. Test Result .......................................................................................................... 118 8.7. Test Photograph .................................................................................................. 121 9. Radiated Susceptibility ........................................................................................... 123 9.1. Test Specification ................................................................................................ 123 9.2. Test Setup ........................................................................................................... 123 9.3. Limit..................................................................................................................... 123 9.4. Test Procedure .................................................................................................... 124 9.5. Deviation from Test Standard .............................................................................. 124 9.6. Test Result .......................................................................................................... 125 9.7. Test Photograph .................................................................................................. 128 10. Electrical Fast Transient/Burst............................................................................. 130 10.1. Test Specification ............................................................................................. 130 10.2. Test Setup........................................................................................................ 130 10.3. Limit ................................................................................................................. 130 10.4. Test Procedure ................................................................................................ 131 10.5. Deviation from Test Standard........................................................................... 131 10.6. Test Result....................................................................................................... 132 Page: 5 of 173
Report No：112040R-ITCEP07V06
10.7. Test Photograph .............................................................................................. 135 11. Surge................................................................................................................... 138 11.1. Test Specification ............................................................................................. 138 11.2. Test Setup........................................................................................................ 138 11.3. Limit ................................................................................................................. 138 11.4. Test Procedure ................................................................................................ 139 11.5. Deviation from Test Standard........................................................................... 139 11.6. Test Result....................................................................................................... 140 11.7. Test Photograph .............................................................................................. 143 12. Conducted Susceptibility ..................................................................................... 145 12.1. Test Specification ............................................................................................. 145 12.2. Test Setup........................................................................................................ 145 12.3. Limit ................................................................................................................. 146 12.4. Test Procedure ................................................................................................ 146 12.5. Deviation from Test Standard........................................................................... 146 12.6. Test Result....................................................................................................... 147 12.7. Test Photograph .............................................................................................. 150 13. Power Frequency Magnetic Field ........................................................................ 153 13.1. Test Specification ............................................................................................. 153 13.2. Test Setup........................................................................................................ 153 13.3. Limit ................................................................................................................. 153 13.4. Test Procedure ................................................................................................ 153 13.5. Deviation from Test Standard........................................................................... 153 13.6. Test Result....................................................................................................... 154 13.7. Test Photograph .............................................................................................. 157 14. Voltage Dips and Interruption .............................................................................. 159 14.1. Test Specification ............................................................................................. 159 14.2. Test Setup........................................................................................................ 159 14.3. Limit ................................................................................................................. 159 14.4. Test Procedure ................................................................................................ 160 14.5. Deviation from Test Standard........................................................................... 160 14.6. Test Result....................................................................................................... 161 14.7. Test Photograph .............................................................................................. 164 15. Attachment .......................................................................................................... 166 EUT Photograph.................................................................................................. 166
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Report No：112040R-ITCEP07V06
1. General Information 1.1. EUT Description Product Name
Notebook
Trade Name
msi
Model No.
MS-1761, MS-1762, MS-1763, MS-1764, MS-1765, MS-1766, MS-1767, MS-1768, MS-1769, MS-176A, MS-176B, MS-176C, MS-176D, S-176E, MS-176F, MS-176G, MS-176H, MS-176I, MS-176J, MS-176K, MS-176L, MS-176M, MS-176O, MS-176N, MS-176P, MS-176Q, MS-176R, S-176S, MS-176T, MS-176U, MS-176V, MS-176W, MS-176X, MS-176Y, MS-176Z, GTzzzz(z=0~9,a~z,A~Z or blank),GXzzzz(z=0~9,a~z,A~Z or blank)
Component Power Adapter (1) MFR: DELTA, M/N: ADP-150NB D Input: AC 100-240V ~ 2.0A, 50-60Hz Output: DC 19.5V, 7.7A Cable Out: Non-Shielded, 1.8m, with two ferrite cores bonded. Power Cord: Non-Shielded, 1.8m Power Adapter (2) MFR: DELTA, M/N: ADP-120ZB BB Input: AC 100-240V ~ 2.0A, 50-60Hz Output: DC 19V, 6.32A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m Power Adapter (3) MFR: LITEON, M/N: PA-1121-04 Input: AC 100-240V ~ 2.0A, 50-60Hz Output: DC 19V, 6.3A Cable Out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m
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Report No：112040R-ITCEP07V06
Keyparts List Item CPU
Vendor
Model Name
Intel
MXM Graphics Panel
HDD
ODD
DRAM Battery AC Adapter
Touch Pad WLAN
BT Camera Module
QUAD-CORE I7-2820QM,INTEL/I7-2820QM(Q1NC),2.3GHz,PGA-988pin QUAD-CORE I7-2720QM,INTEL/I7-2720QM(Q1NN),2.2GHz,PGA-988pin QUAD-CORE I7-2630QM,INTEL/I7-2630QM(Q1NS),2.0GHz,PGA-988pin QUAD-CORE,INTEL/2.3GHz (Q1CG),2.3GHz,rPGA-988pin QUAD-CORE,INTEL/2.2GHz (Q1CL),2.2GHz,rPGA-988pin QUAD-CORE I7-2630QM,INTEL/FF8062700837005(SR02Y),2.0GHz,PGA-988pin QUAD-CORE,2.0GHz (Q1CN),2.0GHz,rPGA-988pin QUAD-CORE,INTEL/1.8GHz (Q15M),1.8GHz,rPGA-988pin DUAL-CORE,INTEL/2.7GHz(Q16M),2.7GHz,PGA-988pin DUAL-CORE,INTEL/2.6GHz(Q16P),2.6GHz,PGA-988pin DUAL-CORE I5-2410M,INTEL/FF8062700845205(SR04B),2.3GHz,PGA-988pin DUAL-CORE I3-2310M,INTEL/FF8062700999405(SR04R),2.1GHz,PGA-988pin DUAL-CORE I5-2620M,INTEL/I5-2620M(Q1S2),2.7GHz,PGA-988pin DUAL-CORE I5-2540M,INTEL/I5-2540M(Q1S6),2.6GHz,PGA-988pin DUAL-CORE I5-2520M,INTEL/I5-2520M(Q1RX),2.5GHz,PGA-988pin DUAL-CORE,INTEL/2.5GHz(Q1TX),2.5GHz,PGA-988pin DUAL-CORE,INTEL/1.6GHz (Q0KU),1.6GHz,PGA-988pin nVIDIA N12E-GE-B Hannstar 17.3 inch,HSD173PUW1-A00 LG 17.3 inch, LP173WF1-TLB2 17.3 inch, LP173WF1-TLB3 AU 17.3 inch, B173HW01 V5 WD 2.5 inch,750GB,5400RPM,WD7500BPVT 2.5 inch,640GB,5400RPM/ WD6400BEVT 2.5 inch,500GB,7200RPM, WD5000BEKT 2.5 inch,500GB,5400RPM,WD5000BPVT Hitachi 2.5 inch,750GB,5400RPM,HTS547575A9E384 2.5 inch,640GB,5400RPM,HTS547564A9E384 2.5 inch,500GB,5400RPM,HTS545050B9A300 Seagate 2.5 inch,750GB,5400RPM,SEAGATE/ST9750423AS 2.5 inch,640GB,5400RPM,ST9640320AS 2.5 inch,500GB,7200RPM,ST9500420AS 2.5 inch,500GB,5400RPM,ST9500325AS Samsung 2.5inch/128GB/MZ5PA128HMCD-010 Panasonic UJ240AFPK-B TSST TS-L633F HLDS CT30N GT40N DDR3 SDRAM,4GB,800(1600)MHz Mitac 9-Cell 11.1V,7800MAH,BTY-M6D Delta ADP-120ZB BB LITEON PA-1121-04 Delta ADP-150NB D Sentelic MEPPRUDSC989M1 Intel 130BNHMW 112BNHMW Atheros AR5B95 (AW-NE785H) Azurewave AW-BT280(MS-3801)(CSR- BSMAN1) BISON BN29M6SS2-010 Azurewave AM-1H006
Note: The EUT is including thirty-seven models for different marketing requirement.
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Report No：112040R-ITCEP07V06
1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Mode 7 Mode 8 Mode 9 Mode 10 Final Test Mode Emission
Immunity
ITEM
Mode 11 Mode 12 Mode 13 Mode 14 Mode 15 Mode 16 Mode 17 Mode 18 Mode 19
Mode 1 Mode 2 Mode 3 Mode 1 Mode 2 Mode 3 Mode 1
Mode 2
Display
LCD+HDMI 1920*1080/60Hz
LCD+HDMI 1920*1080/60Hz
CPU
INTEL/I7-2820QM(Q1NC),2.3GHz
INTEL/I7-2820QM(Q1NC),2.3GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Hitachi/HTS547575A9E384
Hitachi/HTS547575A9E384
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-120ZB BB
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
BT Camera Module
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Report No：112040R-ITCEP07V06
ITEM
Mode 3
Mode 4
Display
LCD+HDMI 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/I7-2820QM(Q1NC),2.3GHz
INTEL/I7-2720QM(Q1NN),2.2GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
LG / 17.3 inch, LP173WF1-TLB2
HDD
Hitachi/HTS547575A9E384
Hitachi/HTS547564A9E384
ODD
Panasonic/UJ240AFPK-B
HLDS/CT30N
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
LITEON/PA-1121-04
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
Azurewave/AM-1H006
ITEM
Mode 5
Mode 6
Display
LCD+D-SUB 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/I7-2630QM(Q1NS),2.0GHz
INTEL/2.3GHz (Q1CG),2.3GHz
Panel
AU/17.3 inch, B173HW01 V5
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Hitachi/HTS545050B9A300
WD/WD5000BPVT
ODD
HLDS/GT40N
TSST / TS-L633F
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Intel/130BNHMW
Intel/112BNHMW
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
ITEM
Mode 7
Mode 8
Display
LCD+HDMI 1920*1080/60Hz
LCD+HDMI 1920*1080/60Hz
CPU
INTEL/2.2GHz (Q1CL),2.2GHz
INTEL/ I7-2630QM,2.0GHz
Panel
LG / 17.3 inch, LP173WF1-TLB3
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
WD/WD7500BPVT
WD/WD6400BEVT
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
BT
BT
BT Camera Module
Page: 10 of 173
Report No：112040R-ITCEP07V06
ITEM
Mode 9
Mode 10
Display
LCD+HDMI 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/2.0GHz (Q1CN),2.0GHz
INTEL/1.8GHz (Q15M),1.8GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
WD/WD5000BEKT
Hitachi/HTS547575A9E384
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
ITEM
Mode 11
Mode 12
Display
LCD+D-SUB 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/2.7GHz(Q16M),2.7GHz
INTEL/2.6GHz(Q16P),2.6GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Hitachi/HTS547575A9E384
Hitachi/HTS547575A9E384
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
ITEM
Mode 13
Mode 14
Display
LCD+HDMI 1920*1080/60Hz
LCD+HDMI 1920*1080/60Hz
CPU
INTEL/ I5-2410M,2.3GHz
INTEL/I3-2310M,2.1GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Seagate/ST9750423AS
Seagate/ST9640320AS
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
BT
BT
BT Camera Module
Page: 11 of 173
Report No：112040R-ITCEP07V06
ITEM
Mode 15
Mode 16
Display
LCD+HDMI 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/I5-2620M(Q1S2),2.7GHz
INTEL/I5-2540M(Q1S6),2.6GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Seagate/ST9500420AS
Seagate/ST9500325AS
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
ITEM
Mode 17
Mode 18
Display
LCD+D-SUB 1920*1080/60Hz
LCD+D-SUB 1920*1080/60Hz
CPU
INTEL/I5-2520M(Q1RX),2.5GHz
INTEL/2.5GHz(Q1TX),2.5GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Samsung/MZ5PA128HMCD-010
Hitachi/HTS547575A9E384
ODD
Panasonic/UJ240AFPK-B
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
Atheros/AR5B95 (AW-NE785H)
Azurewave/AW-BT280(MS-3801)
Azurewave/AW-BT280(MS-3801)
(CSR- BSMAN1)
(CSR- BSMAN1)
Camera Module
BISON/BN29M6SS2-010
BISON/BN29M6SS2-010
ITEM
Mode 19
Display
LCD+HDMI 1920*1080/60Hz
CPU
INTEL/1.6GHz (Q0KU),1.6GHz
Panel
Hannstar/17.3 inch,HSD173PUW1-A00
HDD
Hitachi/HTS547575A9E384
ODD
Panasonic/UJ240AFPK-B
DRAM
DDR3 SDRAM,4GB,800(1600)MHz
Battery
Mitac/9-Cell 11.1V,7800MAH,BTY-M6D
AC Adapter
DELTA/ADP-150NB D
WLAN
Atheros/AR5B95 (AW-NE785H)
BT
BT
BT Camera Module
Azurewave/AW-BT280(MS-3801) (CSR- BSMAN1) BISON/BN29M6SS2-010
Page: 12 of 173
Report No：112040R-ITCEP07V06
1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product
Manufacturer Model No.
Serial No.
Monitor (EMI)
DELL
Monitor (EMS)
LG
U2410 W2261VT
CN-0J257M-728-01I-04NL Non-Shielded, 1.8m 907YHZK07373 Non-Shielded, 1.8m
USB 3.0
BUFFALO
HD-H1.0TU3 15476991119601
Shielded, 1.5m
3
USB 3.0
BUFFALO
HD-H1.0TU3 15476991119984
Shielded, 1.5m
4
Microphone Earphone Microphone Earphone
& Ergotech
ET-E201
N/A
N/A
& Ergotech
ET-E201
N/A
N/A
1 2
5 6
7
8 9
Power Cord
IPod nano (EMI)
Apple
A1236
7K823E7AY0P
N/A
IPod nano (EMS)
Apple
A1199
SU7047UXVQ5
N/A
IPod nano (EMI)
Apple
A1236
7K823DY3Y0P
N/A
IPod nano (EMS)
Apple
A1199
YM709R27VQ5
N/A
Notebook PC
ASUS
S1300
26NP018680
SATA HDD
Onnto
ST-M10
A01926-F03-0001
Logitech
M-UV83
LNA34515336
Non-Shielded, 1.8m Non-Shielded, 1.8m With Core*1 N/A
10 USB Mouse
Page: 13 of 173
Report No：112040R-ITCEP07V06
1.4. Configuration of Tested System Connection Diagram
Signal Cable Type
Signal cable Description
A
D-SUB Cable
Shielded, 1.8m, with two ferrite cores bonded
B
HDMI Cable
Shielded, 1.0m
C
USB 3.0 Cable
Shielded, 1.0m, two PCS.
D
Earphone & Microphone Cable
Non-Shielded, 1.6m, two PCS.
E
USB Cable
Shielded, 1.2m
F
USB Mouse Cable
Shielded, 1.8m
G
E-Sata Cable
Shielded, 1.0m
H
LAN Cable
Non-Shielded, 7.0m
Page: 14 of 173
Report No：112040R-ITCEP07V06
1.5. EUT Exercise Software 1
Setup the EUT and peripheral as shown on Figure
2
Connect the power to EUT and peripherals, then turn on the power of all equipments.
3 4 5
Waiting for EUT to enter Window Operating System, and adjust the display resolution to the test mode. Connect LAN and Telecom to Notebook PC for transmitting data. Activate Wireless interface and Bluetooth function, and perform the wireless data communication with the other Notebook (write/delete action).
6
Run Windows Media Player program and play a disk with color Bar pattern
7
Run “H＂ pattern.
8
Begin to test and repeat the above procedure (4)~(7)
Page: 15 of 173
Report No：112040R-ITCEP07V06
2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviations from the test standards as below description: Emission Test
Performed Item
Normative References
Conducted Emission
EN 55022: 2006+A1: 2007
Yes
No
Impedance Stabilization Network
EN 55022: 2006+A1: 2007
Yes
No
Radiated Emission
EN 55022: 2006+A1: 2007
Yes
No
Power Harmonics
EN 61000-3-2:2006+A2: 2009
Yes
No
Voltage Fluctuation and Flicker
EN 61000-3-3:2008
Yes
No
Performed
Deviation
Immunity Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2: 2008
Yes
No
Radiated susceptibility
IEC 61000-4-3: 2008
Yes
No
Electrical fast transient/burst
IEC 61000-4-4: 2004
Yes
No
Surge
IEC 61000-4-5: 2005
Yes
No
Conducted susceptibility
IEC 61000-4-6: 2008
Yes
No
Power frequency magnetic field
IEC 61000-4-8: 2009
Yes
No
Voltage dips and interruption
IEC 61000-4-11: 2004
Yes
No
Page: 16 of 173
Performed
Deviation
Report No：112040R-ITCEP07V06
2.2. List of Test Equipment Conducted Emission / SR1 Instrument EMI Test Receiver LISN LISN Pulse Limiter
Manufacturer R&S R&S R&S R&S
Type No. ESCS 30 ENV4200 ENV216 ESH3-Z2
Serial No 100366 833209/007 100085 357.88.10.52
Cal. Date 2010/10/29 2010/08/14 2011/02/17 2010/09/10
Type No. CVP2200A ESCS 30 ENV216 ENV4200 ESH3-Z2 F-65 10KHz~1GHz FCC-TLISN-T2-02 FCC-TLISN-T4-02 FCC-TLISN-T8-02
Serial No 18331 100366 100085 833209/007 357.88.10.52 198 20316 20317 20319
Cal. Date 2010/11/16 2010/10/29 2011/02/17 2010/08/14 2010/09/10 2010/11/13 2010/11/22 2010/11/22 2010/11/22
Type No. CBL6112B BBHA9170 ESCS 30 BBHA9120D N/A R3162
Serial No 2921 209 100123 305 N/A 01700040
Cal. Date 2010/08/02 2010/10/27 2010/05/27 2010/08/26 2010/08/01 2010/11/18
Type No.
Serial No
Cal. Date
E4408B
MY45102743
2010/08/12
9120D AP-180C
576 CHM/071920
2010/10/21 2010/08/01
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2010/08/11
Schaffner
CCN 1000-1
X7 1887
2010/08/11
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2010/08/11
CCN 1000-1
X7 1887
2010/08/11
Impedance Stabilization Network / SR1 Instrument Manufacturer Capacitive Voltage Probe Schaffner EMI Test Receiver R&S LISN R&S LISN R&S Pulse Limiter R&S RF Current Probe FCC BALANCED TELECOM ISN FCC BALANCED TELECOM ISN FCC BALANCED TELECOM ISN FCC Radiated Emission / Site2 Instrument Bilog Antenna Broadband Horn Antenna EMI Test Receiver Horn Antenna Pre-Amplifier Spectrum Analyzer
Manufacturer Schaffner Chase Schwarzbeck R&S Schwarzbeck QTK Advantest
Radiated Emission / 9x6x6_Chamber Instrument Manufacturer Spectrum Analyzer Agilent (9K-26.5GHz) Horn Antenna Schwarzbeck Pre-Amplifier QuieTek Power Harmonics / SR3 Instrument AC Power Source(Harmonic) IEC1000-4-X Analyzer(Flicker)
Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer AC Power Schaffner Source(Harmonic) IEC1000-4-X Schaffner Analyzer(Flicker)
Page: 17 of 173
Report No：112040R-ITCEP07V06
Electrostatic Discharge / SR6 Instrument Manufacturer ESD Simulator System Noiseken Horizontal Coupling QuieTek Plane(HCP) Vertical Coupling QuieTek Plane(VCP)
Type No. TC-815R
Serial No ESS0929097
Cal. Date 2010/07/06
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Type No. AF-BOX ACCUST UPL 16 3149 DC 6180 5935 4227 30S1G3 100W10000M7 CBA9413B 75A250A NRVD(P.M) 150A220 4182 SML03
Serial No
Cal. Date
100007
N/A
100137 00071675 22735 2426784 2439692 309453 A285000010 4020 0325371 100219 23067 2278070 103330
2010/04/15 N/A N/A 2010/04/16 2010/04/16 N/A N/A N/A N/A 2010/04/16 N/A 2010/04/16 2010/04/16
Electrical fast transient/burst / SR3 Instrument Manufacturer TRANSIENT TEST EMC PARTNET SYSTEM
Type No. TRA2000IN6
Serial No 1138
Cal. Date 2010/03/21
Surge / SR3 Instrument TRANSIENT TEST SYSTEM
Type No. TRA2000IN6
Serial No 1138
Cal. Date 2010/03/21
Type No.
Serial No
Cal. Date
N/A
N/A
2010/04/21
Type No. INA 2141 INA 702
Serial No 6002 160
Cal. Date N/A N/A
4090
114135
2010/03/27
Type No. TRA2000IN6
Serial No 1138
Cal. Date 2010/03/21
Radiated susceptibility / CB5 Instrument Manufacturer AF-BOX
R&S
Audio Analyzer Biconilog Antenna Directional Coupler Dual Microphone Supply Mouth Simulator Power Amplifier Power Amplifier Power Amplifier Power Amplifier Power Meter Pre-Amplifier Probe Microphone Signal Generator
R&S EMCO A&R B&K B&K A&R A&R SCHAFFNER AR R&S A&R B&K R&S
Manufacturer EMC PARTNET
Conducted susceptibility / SR6 Instrument Manufacturer Schaffner NSG 2070 Schaffner RF-Generator Power frequency magnetic field / SR3 Instrument Manufacturer Induction Coil Interface Schaffner Magnetic Loop Coil Schaffner Triaxial ELF Magnetic Field F.B.BELL Meter Voltage dips and interruption / SR3 Instrument Manufacturer TRANSIENT TEST EMC PARTNET SYSTEM
Page: 18 of 173
Report No：112040R-ITCEP07V06
Schaffner NSG 2070 RF-Generator Instrument Manufacturer CDN Schaffner CDN Schaffner CDN M016S Schaffner CDN M016S Schaffner CDN T002 Schaffner CDN T002 Schaffner CDN T400 Schaffner CDN T400 Schaffner Coupling Decoupling Schaffner Network Coupling Decoupling Schaffner Network Coupling Decoupling Schaffner Network EM-CLAMP Schaffner
Type No. CAL U100A TRA U150 CAL U100A TRA U150 CAL U100 TRA U150 CAL U100 TRA U150
Serial No 20405 20454 20410 21167 20491 21169 17735 21166
Cal. Date N/A N/A N/A N/A N/A N/A N/A N/A
CDN M016S
20823
2010/04/02
CDN T002
19018
2010/04/02
CDN T400
21226
2010/04/02
KEMZ 801
21024
2010/04/02
Page: 19 of 173
Report No：112040R-ITCEP07V06
2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26 dB. Impedance Stabilization Network The measurement uncertainty is evaluated as ± 2.26 dB. Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB. Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.0 % and 0.1%. Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 3.57 dB. Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 4 %, and 2.5%. Surge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%.
Page: 20 of 173
Report No：112040R-ITCEP07V06
Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 2.0 dB and 2.61 dB. Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2.0 %. Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 3.5 % and 0.1%.
Page: 21 of 173
Report No：112040R-ITCEP07V06
2.4. Test Environment Performed Item Conducted Emission
Impedance Stabilization Network
Radiated Emission
Electrostatic Discharge
Radiated susceptibility
Electrical fast transient/burst
Surge
Conducted susceptibility
Power frequency magnetic field
Voltage dips and interruption
Items
Required
Actual
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
30-60
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
10-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Temperature (°C)
15-35
21
Humidity (%RH)
25-75
51
Barometric pressure (mbar)
860-1060
950-1000
Page: 22 of 173
Report No：112040R-ITCEP07V06
3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 55022
3.2. Test Setup
3.3. Limit Limits Frequency (MHz)
QP (dBuV)
AV (dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 23 of 173
Report No：112040R-ITCEP07V06
3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard No deviation.
Page: 24 of 173
Report No：112040R-ITCEP07V06
3.6. Test Result Site : SR_1
Time : 2011/02/22 - 00:14
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 25 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:16
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.185
9.790
42.060
51.850
-13.150
65.000
QUASIPEAK
0.275
9.790
41.200
50.990
-11.439
62.429
QUASIPEAK
3
0.400
9.790
33.520
43.310
-15.547
58.857
QUASIPEAK
4
0.630
9.790
33.920
43.710
-12.290
56.000
QUASIPEAK
5
0.861
9.800
28.010
37.810
-18.190
56.000
QUASIPEAK
6
3.736
9.820
32.520
42.340
-13.660
56.000
QUASIPEAK
2
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 26 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:16
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.185
9.790
32.140
41.930
-13.070
55.000
AVERAGE
2
0.275
9.790
24.610
34.400
-18.029
52.429
AVERAGE
3
0.400
9.790
16.100
25.890
-22.967
48.857
AVERAGE
4
0.630
9.790
15.020
24.810
-21.190
46.000
AVERAGE
5
0.861
9.800
14.830
24.630
-21.370
46.000
AVERAGE
6
3.736
9.820
16.200
26.020
-19.980
46.000
AVERAGE
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 27 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:17
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
Page: 28 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:18
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.181
9.780
35.220
45.000
-20.114
65.114
QUASIPEAK
2
0.291
9.784
37.810
47.594
-14.377
61.971
QUASIPEAK
3
0.357
9.790
31.620
41.410
-18.676
60.086
QUASIPEAK
4
0.552
9.790
33.040
42.830
-13.170
56.000
QUASIPEAK
0.591
9.790
33.450
43.240
-12.760
56.000
QUASIPEAK
0.834
9.790
29.010
38.800
-17.200
56.000
QUASIPEAK
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 29 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:18
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.181
9.780
31.260
41.040
-14.074
55.114
AVERAGE
2
0.291
9.784
21.600
31.384
-20.587
51.971
AVERAGE
3
0.357
9.790
17.590
27.380
-22.706
50.086
AVERAGE
4
0.552
9.790
18.410
28.200
-17.800
46.000
AVERAGE
5
0.591
9.790
15.700
25.490
-20.510
46.000
AVERAGE
6
0.834
9.790
15.140
24.930
-21.070
46.000
AVERAGE
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 30 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:03
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
Page: 31 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:04
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.974
9.800
19.300
29.100
-26.900
56.000
QUASIPEAK
2.212
9.810
28.480
38.290
-17.710
56.000
QUASIPEAK
3
2.654
9.810
28.360
38.170
-17.830
56.000
QUASIPEAK
4
5.564
9.840
20.720
30.560
-29.440
60.000
QUASIPEAK
5
9.701
9.880
22.430
32.310
-27.690
60.000
QUASIPEAK
6
15.841
10.110
23.040
33.150
-26.850
60.000
QUASIPEAK
2
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 32 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:04
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.974
9.800
10.040
19.840
-26.160
46.000
AVERAGE
2
2.212
9.810
22.460
32.270
-13.730
46.000
AVERAGE
2.654
9.810
22.580
32.390
-13.610
46.000
AVERAGE
4
5.564
9.840
15.280
25.120
-24.880
50.000
AVERAGE
5
9.701
9.880
16.990
26.870
-23.130
50.000
AVERAGE
6
15.841
10.110
17.860
27.970
-22.030
50.000
AVERAGE
3
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 33 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:05
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 2
Page: 34 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:06
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.478
9.790
23.510
33.300
-22.700
56.000
QUASIPEAK
2.345
9.800
28.350
38.150
-17.850
56.000
QUASIPEAK
3
2.802
9.810
27.730
37.540
-18.460
56.000
QUASIPEAK
4
5.861
9.841
20.520
30.361
-29.639
60.000
QUASIPEAK
5
9.365
9.890
22.350
32.240
-27.760
60.000
QUASIPEAK
6
12.052
10.012
22.380
32.392
-27.608
60.000
QUASIPEAK
2
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 35 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:06
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.478
9.790
16.350
26.140
-19.860
46.000
AVERAGE
2.345
9.800
22.520
32.320
-13.680
46.000
AVERAGE
3
2.802
9.810
21.950
31.760
-14.240
46.000
AVERAGE
4
5.861
9.841
14.930
24.771
-25.229
50.000
AVERAGE
5
9.365
9.890
17.010
26.900
-23.100
50.000
AVERAGE
6
12.052
10.012
17.190
27.202
-22.798
50.000
AVERAGE
2
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 36 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:10
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 3
Page: 37 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:11
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 3
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.150
9.790
37.070
46.860
-19.140
66.000
QUASIPEAK
2
0.173
9.790
31.500
41.290
-24.053
65.343
QUASIPEAK
3
0.521
9.790
28.280
38.070
-17.930
56.000
QUASIPEAK
0.763
9.800
29.400
39.200
-16.800
56.000
QUASIPEAK
5
1.052
9.800
28.440
38.240
-17.760
56.000
QUASIPEAK
6
1.845
9.810
27.920
37.730
-18.270
56.000
QUASIPEAK
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 38 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:11
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_L1 - Line1
Power : AC 230V/50Hz
Note : Mode 3
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.150
9.790
19.040
28.830
-27.170
56.000
AVERAGE
2
0.173
9.790
17.120
26.910
-28.433
55.343
AVERAGE
3
0.521
9.790
18.220
28.010
-17.990
46.000
AVERAGE
4
0.763
9.800
17.660
27.460
-18.540
46.000
AVERAGE
5
1.052
9.800
20.620
30.420
-15.580
46.000
AVERAGE
1.845
9.810
21.340
31.150
-14.850
46.000
AVERAGE
6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 39 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:11
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 3
Page: 40 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:12
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 3
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.232
9.780
31.870
41.650
-22.007
63.657
QUASIPEAK
0.380
9.790
36.310
46.100
-13.329
59.429
QUASIPEAK
3
0.513
9.790
29.040
38.830
-17.170
56.000
QUASIPEAK
4
0.650
9.790
27.940
37.730
-18.270
56.000
QUASIPEAK
5
1.138
9.790
29.070
38.860
-17.140
56.000
QUASIPEAK
6
3.908
9.820
25.940
35.760
-20.240
56.000
QUASIPEAK
2
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 41 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:12
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV_216_N - Line2
Power : AC 230V/50Hz
Note : Mode 3
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.232
9.780
18.430
28.210
-25.447
53.657
AVERAGE
2
0.380
9.790
21.140
30.930
-18.499
49.429
AVERAGE
3
0.513
9.790
16.380
26.170
-19.830
46.000
AVERAGE
4
0.650
9.790
18.560
28.350
-17.650
46.000
AVERAGE
1.138
9.790
20.990
30.780
-15.220
46.000
AVERAGE
3.908
9.820
20.490
30.310
-15.690
46.000
AVERAGE
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 42 of 173
Report No：112040R-ITCEP07V06
3.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Front View of Conducted Test
: Mode 1 : Back View of Conducted Test
Page: 43 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 2 : Front View of Conducted Test
: Mode 2 : Back View of Conducted Test
Page: 44 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 3 : Front View of Conducted Test
: Mode 3 : Back View of Conducted Test
Page: 45 of 173
Report No：112040R-ITCEP07V06
4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard: EN 55022
4.2. Test Setup
4.3. Limit Limits Frequency (MHz)
QP (dBuV)
AV (dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50 MHz.
Page: 46 of 173
Report No：112040R-ITCEP07V06
4.4. Test Procedure Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150 ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB LCL ISN is used for cat. 3.
4.5. Deviation from Test Standard No deviation.
Page: 47 of 173
Report No：112040R-ITCEP07V06
4.6. Test Result Site : SR_1
Time : 2011/02/22 - 00:25
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 10MB
Page: 48 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:27
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
3.701
9.990
42.870
52.860
-21.140
74.000
QUASIPEAK
2
5.052
9.980
42.280
52.260
-21.740
74.000
QUASIPEAK
3
6.252
9.976
48.110
58.086
-15.914
74.000
QUASIPEAK
7.502
9.970
52.790
62.760
-11.240
74.000
QUASIPEAK
5
11.252
9.960
46.080
56.040
-17.960
74.000
QUASIPEAK
6
12.502
10.073
50.060
60.133
-13.867
74.000
QUASIPEAK
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 49 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:27
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
3.701
9.990
30.400
40.390
-23.610
64.000
AVERAGE
2
5.052
9.980
33.170
43.150
-20.850
64.000
AVERAGE
3
6.252
9.976
37.810
47.786
-16.214
64.000
AVERAGE
7.502
9.970
42.020
51.990
-12.010
64.000
AVERAGE
5
11.252
9.960
34.140
44.100
-19.900
64.000
AVERAGE
6
12.502
10.073
37.210
47.283
-16.717
64.000
AVERAGE
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 50 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:23
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 100MB
Page: 51 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:24
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.595
9.990
37.980
47.970
-26.030
74.000
QUASIPEAK
2
3.744
9.990
41.710
51.700
-22.300
74.000
QUASIPEAK
3
7.923
9.970
45.860
55.830
-18.170
74.000
QUASIPEAK
4
16.228
10.130
50.940
61.070
-12.930
74.000
QUASIPEAK
18.244
10.120
51.000
61.120
-12.880
74.000
QUASIPEAK
23.127
10.100
50.910
61.010
-12.990
74.000
QUASIPEAK
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 52 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:24
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.595
9.990
29.660
39.650
-24.350
64.000
AVERAGE
2
3.744
9.990
27.470
37.460
-26.540
64.000
AVERAGE
3
7.923
9.970
42.740
52.710
-11.290
64.000
AVERAGE
4
16.228
10.130
49.070
59.200
-4.800
64.000
AVERAGE
5
18.244
10.120
49.300
59.420
-4.580
64.000
AVERAGE
23.127
10.100
49.460
59.560
-4.440
64.000
AVERAGE
6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 53 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:21
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 1G
Page: 54 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:22
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.818
10.130
39.850
49.980
-24.020
74.000
QUASIPEAK
2
0.959
10.110
40.610
50.720
-23.280
74.000
QUASIPEAK
3
1.599
10.090
40.630
50.720
-23.280
74.000
QUASIPEAK
2.224
10.070
43.630
53.700
-20.300
74.000
QUASIPEAK
5
3.767
10.060
42.800
52.860
-21.140
74.000
QUASIPEAK
6
7.787
10.060
41.140
51.200
-22.800
74.000
QUASIPEAK
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 55 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:22
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1: ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.818
10.130
37.030
47.160
-16.840
64.000
AVERAGE
2
0.959
10.110
31.930
42.040
-21.960
64.000
AVERAGE
3
1.599
10.090
32.580
42.670
-21.330
64.000
AVERAGE
2.224
10.070
40.320
50.390
-13.610
64.000
AVERAGE
5
3.767
10.060
29.130
39.190
-24.810
64.000
AVERAGE
6
7.787
10.060
35.760
45.820
-18.180
64.000
AVERAGE
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 56 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:58
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 10MB
Page: 57 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:59
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
3.752
9.990
41.510
51.500
-22.500
74.000
QUASIPEAK
2
6.252
9.976
47.940
57.916
-16.084
74.000
QUASIPEAK
7.498
9.970
52.320
62.290
-11.710
74.000
QUASIPEAK
4
8.752
9.968
47.480
57.448
-16.552
74.000
QUASIPEAK
5
11.252
9.960
46.520
56.480
-17.520
74.000
QUASIPEAK
6
12.502
10.073
50.440
60.513
-13.487
74.000
QUASIPEAK
3
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 58 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 00:59
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
3.752
9.990
32.890
42.880
-21.120
64.000
AVERAGE
2
6.252
9.976
37.880
47.856
-16.144
64.000
AVERAGE
7.498
9.970
41.380
51.350
-12.650
64.000
AVERAGE
4
8.752
9.968
37.650
47.618
-16.382
64.000
AVERAGE
5
11.252
9.960
35.340
45.300
-18.700
64.000
AVERAGE
6
12.502
10.073
38.390
48.463
-15.537
64.000
AVERAGE
3
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 59 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:00
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 100MB
Page: 60 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:00
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.998
9.980
41.880
51.860
-22.140
74.000
QUASIPEAK
2
5.236
9.980
43.830
53.810
-20.190
74.000
QUASIPEAK
3
7.923
9.970
46.080
56.050
-17.950
74.000
QUASIPEAK
4
13.357
10.150
47.330
57.480
-16.520
74.000
QUASIPEAK
16.228
10.130
49.370
59.500
-14.500
74.000
QUASIPEAK
28.685
10.090
47.850
57.940
-16.060
74.000
QUASIPEAK
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 61 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:00
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.998
9.980
39.390
49.370
-14.630
64.000
AVERAGE
2
5.236
9.980
40.880
50.860
-13.140
64.000
AVERAGE
3
7.923
9.970
43.560
53.530
-10.470
64.000
AVERAGE
4
13.357
10.150
45.350
55.500
-8.500
64.000
AVERAGE
16.228
10.130
47.090
57.220
-6.780
64.000
AVERAGE
28.685
10.090
45.490
55.580
-8.420
64.000
AVERAGE
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 62 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:01
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 1G
Page: 63 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:02
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.818
10.130
39.680
49.810
-24.190
74.000
QUASIPEAK
2
0.994
10.110
41.820
51.930
-22.070
74.000
QUASIPEAK
3
1.111
10.108
41.690
51.798
-22.202
74.000
QUASIPEAK
4
1.630
10.084
41.620
51.704
-22.296
74.000
QUASIPEAK
2.224
10.070
44.300
54.370
-19.630
74.000
QUASIPEAK
8.908
10.070
37.100
47.170
-26.830
74.000
QUASIPEAK
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 64 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:02
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2: ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.818
10.130
36.360
46.490
-17.510
64.000
AVERAGE
2
0.994
10.110
37.850
47.960
-16.040
64.000
AVERAGE
3
1.111
10.108
38.490
48.598
-15.402
64.000
AVERAGE
4
1.630
10.084
38.430
48.514
-15.486
64.000
AVERAGE
2.224
10.070
40.900
50.970
-13.030
64.000
AVERAGE
8.908
10.070
31.650
41.720
-22.280
64.000
AVERAGE
5 6
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 65 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:22
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 10MB
Page: 66 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:23
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 10MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.111
9.980
44.800
54.780
-19.220
74.000
QUASIPEAK
2
3.752
9.990
41.250
51.240
-22.760
74.000
QUASIPEAK
3
6.248
9.977
47.260
57.237
-16.763
74.000
QUASIPEAK
7.498
9.970
53.600
63.570
-10.430
74.000
QUASIPEAK
5
8.748
9.970
49.030
59.000
-15.000
74.000
QUASIPEAK
6
12.498
10.073
49.080
59.153
-14.847
74.000
QUASIPEAK
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 67 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:23
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 10MB
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.111
9.980
41.860
51.840
-12.160
64.000
AVERAGE
2
3.752
9.990
32.220
42.210
-21.790
64.000
AVERAGE
3
6.248
9.977
36.370
46.347
-17.653
64.000
AVERAGE
4
7.498
9.970
41.700
51.670
-12.330
64.000
AVERAGE
5
8.748
9.970
37.960
47.930
-16.070
64.000
AVERAGE
6
12.498
10.073
37.590
47.663
-16.337
64.000
AVERAGE
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 68 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:17
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 100MB
Page: 69 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:21
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.111
9.980
44.970
54.950
-19.050
74.000
QUASIPEAK
2
7.923
9.970
46.570
56.540
-17.460
74.000
QUASIPEAK
3
9.388
9.960
45.280
55.240
-18.760
74.000
QUASIPEAK
16.228
10.130
49.440
59.570
-14.430
74.000
QUASIPEAK
5
18.244
10.120
48.910
59.030
-14.970
74.000
QUASIPEAK
6
23.130
10.100
45.890
55.990
-18.010
74.000
QUASIPEAK
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 70 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:21
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T4 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 100MB
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
1.111
9.980
42.510
52.490
-11.510
64.000
AVERAGE
2
7.923
9.970
43.810
53.780
-10.220
64.000
AVERAGE
3
9.388
9.960
42.900
52.860
-11.140
64.000
AVERAGE
16.228
10.130
47.190
57.320
-6.680
64.000
AVERAGE
5
18.244
10.120
46.450
56.570
-7.430
64.000
AVERAGE
6
23.130
10.100
43.410
53.510
-10.490
64.000
AVERAGE
4
*
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 71 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:14
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 1G
Page: 72 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:15
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 1G
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.111
10.108
45.990
56.098
-17.902
74.000
QUASIPEAK
2
1.423
10.090
40.940
51.030
-22.970
74.000
QUASIPEAK
3
1.627
10.085
41.680
51.765
-22.235
74.000
QUASIPEAK
4
2.224
10.070
42.170
52.240
-21.760
74.000
QUASIPEAK
5
3.334
10.060
39.170
49.230
-24.770
74.000
QUASIPEAK
6
9.115
10.070
34.870
44.940
-29.060
74.000
QUASIPEAK
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 73 of 173
Report No：112040R-ITCEP07V06
Site : SR_1
Time : 2011/02/22 - 01:15
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN_T8 - Line1
Power : AC 230V/50Hz
Note : Mode 3: ISN 1G
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1.111
10.108
42.410
52.518
-11.482
64.000
AVERAGE
2
1.423
10.090
34.060
44.150
-19.850
64.000
AVERAGE
3
1.627
10.085
36.270
46.355
-17.645
64.000
AVERAGE
4
2.224
10.070
38.030
48.100
-15.900
64.000
AVERAGE
5
3.334
10.060
33.990
44.050
-19.950
64.000
AVERAGE
6
9.115
10.070
29.390
39.460
-24.540
64.000
AVERAGE
Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 74 of 173
Report No：112040R-ITCEP07V06
4.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Front View of ISN Test
: Mode 1 : Back View of ISN Test
Page: 75 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 2 : Front View of ISN Test
: Mode 2 : Back View of ISN Test
Page: 76 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 3 : Front View of ISN Test
: Mode 3 : Back View of ISN Test
Page: 77 of 173
Report No：112040R-ITCEP07V06
5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN 55022
5.2. Test Setup Under 1GHz Test Setup:
Above 1GHz Test Setup:
Page: 78 of 173
Report No：112040R-ITCEP07V06
5.3. Limit Limits Frequency
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
(MHz)
Limits Frequency
Distance
Peak
Average
(GHz)
(m)
(dBuV/m)
(dBuV/m)
1–3
3
70
50
3–6
3
74
54
Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument
antenna and the closed point of any part of the device or system. Highest frequency generated or used in the device or on which the device
Upper frequency of measurement range (MHz)
operates or tunes (MHz) Below 108
1000
108 – 500
2000
500 – 1000
5000
Above 1000
5th harmonic of the highest frequency or 6 GHz, whichever is lower
Page: 79 of 173
Report No：112040R-ITCEP07V06
5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 3/10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz and above 1GHz using a receiver bandwidth of 1MHz. 30MHz to1GHz Radiated was performed at an antenna to EUT distance of 10 meters. Above1GHz Radiated was performed at an antenna to EUT distance of 3 meters. It is placed with absorb on the ground between EUT and Antenna.
5.5. Deviation from Test Standard No deviation.
Page: 80 of 173
Report No：112040R-ITCEP07V06
5.6. Test Result Site : OATS-2
Time : 2011/02/22 - 23:21
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
147.300
13.755
11.200
24.955
-5.045
30.000
QUASIPEAK
2
159.750
12.817
11.800
24.617
-5.383
30.000
QUASIPEAK
3
197.825
12.210
13.500
25.710
-4.290
30.000
QUASIPEAK
4
240.000
15.210
15.100
30.310
-6.690
37.000
QUASIPEAK
5
314.320
17.542
14.900
32.442
-4.558
37.000
QUASIPEAK
6
455.210
21.004
12.000
33.004
-3.996
37.000
QUASIPEAK
7
696.010
24.506
7.200
31.706
-5.294
37.000
QUASIPEAK
8
720.017
24.804
8.000
32.804
-4.196
37.000
QUASIPEAK
840.045
26.401
7.000
33.401
-3.599
37.000
QUASIPEAK
9
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 81 of 173
Report No：112040R-ITCEP07V06
Site : OATS-2
Time : 2011/02/22 - 23:19
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - VERTICAL
Power : AC 230V/50Hz
Note : Mode 1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
104.467
14.381
11.000
25.381
-4.619
30.000
QUASIPEAK
2
116.280
14.758
11.400
26.158
-3.842
30.000
QUASIPEAK
3
144.046
14.000
12.300
26.300
-3.700
30.000
QUASIPEAK
4
172.000
12.378
12.400
24.778
-5.222
30.000
QUASIPEAK
5
240.000
15.210
10.900
26.110
-10.890
37.000
QUASIPEAK
6
313.530
17.526
15.300
32.826
-4.174
37.000
QUASIPEAK
7
480.000
21.507
6.800
28.308
-8.692
37.000
QUASIPEAK
593.980
23.378
10.200
33.578
-3.422
37.000
QUASIPEAK
9
662.000
24.140
7.200
31.340
-5.660
37.000
QUASIPEAK
10
935.000
27.910
4.500
32.410
-4.590
37.000
QUASIPEAK
8
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 82 of 173
Report No：112040R-ITCEP07V06
Site : OATS-2
Time : 2011/02/22 - 23:32
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
147.200
13.762
11.400
25.162
-4.838
30.000
QUASIPEAK
2
159.700
12.820
12.200
25.020
-4.980
30.000
QUASIPEAK
3
197.800
12.210
13.600
25.810
-4.190
30.000
QUASIPEAK
4
240.000
15.210
15.000
30.210
-6.790
37.000
QUASIPEAK
5
314.300
17.542
14.800
32.342
-4.658
37.000
QUASIPEAK
6
455.200
21.004
12.100
33.104
-3.896
37.000
QUASIPEAK
7
696.000
24.506
7.300
31.806
-5.194
37.000
QUASIPEAK
8
720.000
24.803
7.700
32.503
-4.497
37.000
QUASIPEAK
840.000
26.401
6.800
33.201
-3.799
37.000
QUASIPEAK
9
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 83 of 173
Report No：112040R-ITCEP07V06
Site : OATS-2
Time : 2011/02/22 - 23:30
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - VERTICAL
Power : AC 230V/50Hz
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
104.500
14.382
12.400
26.782
-3.218
30.000
QUASIPEAK
2
116.000
14.750
12.000
26.750
-3.250
30.000
QUASIPEAK
144.000
14.003
12.900
26.903
-3.097
30.000
QUASIPEAK
4
172.000
12.378
13.600
25.978
-4.022
30.000
QUASIPEAK
5
240.000
15.210
12.100
27.310
-9.690
37.000
QUASIPEAK
6
313.500
17.525
15.000
32.525
-4.475
37.000
QUASIPEAK
7
480.000
21.507
7.200
28.708
-8.292
37.000
QUASIPEAK
8
594.000
23.378
10.100
33.479
-3.521
37.000
QUASIPEAK
9
662.000
24.140
7.300
31.440
-5.560
37.000
QUASIPEAK
10
935.000
27.910
4.200
32.110
-4.890
37.000
QUASIPEAK
3
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 84 of 173
Report No：112040R-ITCEP07V06
Site : OATS-2
Time : 2011/02/22 - 23:44
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - VERTICAL
Power : AC 230V/50Hz
Note : Mode 3
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
104.540
14.383
12.500
26.884
-3.116
30.000
QUASIPEAK
115.800
14.744
12.200
26.944
-3.056
30.000
QUASIPEAK
3
144.000
14.003
12.900
26.903
-3.097
30.000
QUASIPEAK
4
172.000
12.378
13.800
26.178
-3.822
30.000
QUASIPEAK
5
240.000
15.210
12.400
27.610
-9.390
37.000
QUASIPEAK
6
313.500
17.525
15.100
32.625
-4.375
37.000
QUASIPEAK
7
480.000
21.507
7.600
29.108
-7.892
37.000
QUASIPEAK
8
594.000
23.378
9.800
33.179
-3.821
37.000
QUASIPEAK
9
662.000
24.140
7.600
31.740
-5.260
37.000
QUASIPEAK
10
935.000
27.910
4.500
32.410
-4.590
37.000
QUASIPEAK
2
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor Page: 85 of 173
Report No：112040R-ITCEP07V06
Site : OATS-2
Time : 2011/02/22 - 23:46
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : Site2_CBL6112_10M_0811 - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 3
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
1
147.300
13.755
12.100
25.855
-4.145
30.000
QUASIPEAK
2
159.800
12.813
12.300
25.113
-4.887
30.000
QUASIPEAK
3
197.800
12.210
13.400
25.610
-4.390
30.000
QUASIPEAK
4
240.000
15.210
14.900
30.110
-6.890
37.000
QUASIPEAK
5
314.300
17.542
15.200
32.742
-4.258
37.000
QUASIPEAK
455.200
21.004
12.600
33.604
-3.396
37.000
QUASIPEAK
7
696.000
24.506
7.100
31.606
-5.394
37.000
QUASIPEAK
8
720.000
24.803
7.600
32.403
-4.597
37.000
QUASIPEAK
9
840.000
26.401
6.300
32.701
-4.299
37.000
QUASIPEAK
6
*
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
Page: 86 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 02:49
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Horizontal
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 1
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1010.000
55.273
61.840
-14.727
2
1010.000
42.193
48.760
2503.000
62.636
2503.000
39.316
3
*
4
Factor
Type
70.000
-6.566
PK
-7.807
50.000
-6.566
AV
64.170
-7.364
70.000
-1.535
PK
40.850
-10.684
50.000
-1.535
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 87 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 02:48
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Vertical
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 1
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1040.000
53.805
60.260
-16.195
2
1040.000
40.925
47.380
2503.000
64.956
2503.000
42.036
3
*
4
Factor
Type
70.000
-6.455
PK
-9.075
50.000
-6.455
AV
66.490
-5.044
70.000
-1.535
PK
43.570
-7.964
50.000
-1.535
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 88 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 02:58
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Horizontal
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 2
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1010.000
54.253
60.820
-15.747
1010.000
42.503
49.070
3
2503.000
62.056
4
2503.000
39.726
1 2
*
Factor
Type
70.000
-6.566
PK
-7.497
50.000
-6.566
AV
63.590
-7.944
70.000
-1.535
PK
41.260
-10.274
50.000
-1.535
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 89 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 02:57
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Vertical
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 2
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1040.000
53.825
60.280
-16.175
2
1040.000
41.665
48.120
2503.000
63.436
2503.000
41.336
3
*
4
Factor
Type
70.000
-6.455
PK
-8.335
50.000
-6.455
AV
64.970
-6.564
70.000
-1.535
PK
42.870
-8.664
50.000
-1.535
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 90 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 03:11
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Horizontal
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 3
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1020.000
55.639
62.170
-14.361
1020.000
41.899
48.430
3
1290.000
55.920
4
1290.000
40.740
1 2
*
Factor
Type
70.000
-6.531
PK
-8.101
50.000
-6.531
AV
61.440
-14.080
70.000
-5.520
PK
46.260
-9.260
50.000
-5.520
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 91 of 173
Report No：112040R-ITCEP07V06
Site: 9x6x6_Chamber
Time: 2011/02/22 - 03:11
Limit: EN55022_B_(Above_1G)
Margin: 0
Probe: 9120D_1-18G_Horn
Polarity: Vertical
EUT: Notebook
Power: AC 230V/50Hz
Note: Mode 3
No
Flag Mark Frequency
Measure Level
Reading Level
Over Limit
Limit
(MHz)
(dBuV/m)
(dBuV)
(dB)
(dBuV/m)
1
1030.000
53.778
60.270
-16.222
2
1030.000
41.018
47.510
2503.000
63.876
2503.000
41.636
3
*
4
Factor
Type
70.000
-6.492
PK
-8.982
50.000
-6.492
AV
65.410
-6.124
70.000
-1.535
PK
43.170
-8.364
50.000
-1.535
AV
Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Factor(Probe+Cable-Amp).
Page: 92 of 173
Report No：112040R-ITCEP07V06
5.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Front View of Radiated Test
: Mode 1 : Back View of Radiated Test
Page: 93 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 1 : Front View of High Frequency Radiated Test
: Mode 2 : Front View of Radiated Test
Page: 94 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 2 : Back View of Radiated Test
: Mode 2 : Front View of High Frequency Radiated Test
Page: 95 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 3 : Front View of Radiated Test
: Mode 3 : Back View of Radiated Test
Page: 96 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : Front View of High Frequency Radiated Test
Page: 97 of 173
Report No：112040R-ITCEP07V06
6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit (a) Limits of Class A Harmonics Currents Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8 ≤ n ≤ 40
0.23 * 8/n
11
0.33
13
0.21
15 ≤ n ≤ 39
0.15 * 15/n
Page: 98 of 173
Report No：112040R-ITCEP07V06
(b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents Harmonics Order
Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency
n
％
2
2
3
30．λ
5
10
7
7
9
5
11 ≤ n ≤ 39
＊
3
(odd harmonics only) ＊λ is the circuit power factor
(d) Limits of Class D Harmonics Currents Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11 ≤ n ≤ 39 (odd harmonics only)
Page: 99 of 173
Report No：112040R-ITCEP07V06
6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.
6.5. Deviation from Test Standard No deviation.
Page: 100 of 173
Report No：112040R-ITCEP07V06
6.6. Test Result Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 1
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
3
300
2
200
1
100
0
0
-1
-100
-2
-200
-3
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 4
Test result: Pass
8
12
16 20 24 Harmonic #
28
Worst harmonic was #7 with 13.47% of the limit.
Page: 101 of 173
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No：112040R-ITCEP07V06 Test Result: Pass Source qualification: Normal THC(A): 0.07 I-THD(%): 14.10 POHC(A): 0.005 Highest parameter values during test: V_RMS (Volts): 229.65 Frequency(Hz): I_Peak (Amps): 1.676 I_RMS (Amps): I_Fund (Amps): 0.561 Crest Factor: Power (Watts): 153.1 Power Factor: Harm#
Harms(avg)
2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
0.000 0.056 0.000 0.036 0.000 0.021 0.000 0.009 0.000 0.006 0.000 0.006 0.000 0.005 0.000 0.003 0.000 0.002 0.000 0.002 0.000 0.002 0.000 0.002 0.000 0.002 0.000 0.002 0.000 0.002 0.000 0.001 0.000 0.001 0.000 0.001 0.000 0.001 0.000
POHC Limit(A): 0.066 50.00 0.714 2.583 0.960
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.521
10.7
0.064
0.762
8.40
Pass
0.291
12.4
0.041
0.426
9.64
Pass
0.153
13.4
0.022
0.224
9.73
Pass
0.077
12.2
0.012
0.112
11.07
Pass
0.054
10.9
0.009
0.078
11.55
Pass
0.046
12.2
0.007
0.066
11.30
Pass
0.040
11.9
0.006
0.057
10.51
Pass
0.035
9.9
0.005
0.051
9.28
Pass
0.031
7.6
0.003
0.047
7.22
Pass
0.028
6.8
0.003
0.042
7.09
Pass
0.026
7.1
0.003
0.038
7.67
Pass
0.024
7.7
0.003
0.034
8.58
Pass
0.022
7.8
0.002
0.032
7.52
Pass
0.020
7.7
0.002
0.030
7.80
Pass
0.019
8.1
0.002
0.028
7.65
Pass
0.018
8.3
0.002
0.027
7.64
Pass
0.017
7.7
0.002
0.025
7.25
Pass
0.016
7.6
0.002
0.023
7.49
Pass
0.015
7.9
0.002
0.022
8.07
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass.
Page: 102 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 2
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
1.5
300
1.0
200
0.5
100
0.0
0
-0.5
-100
-1.0
-200
-1.5
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 4
Test result: Pass
8
12
16 20 24 Harmonic #
28
Worst harmonic was #3 with 29.04% of the limit.
Page: 103 of 173
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No：112040R-ITCEP07V06 Test Result: Pass Source qualification: Normal THC(A): 0.16 I-THD(%): 35.01 POHC(A): 0.014 Highest parameter values during test: V_RMS (Volts): 229.65 Frequency(Hz): I_Peak (Amps): 1.424 I_RMS (Amps): I_Fund (Amps): 0.546 Crest Factor: Power (Watts): 158.7 Power Factor: Harm#
Harms(avg)
2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
0.001 0.153 0.000 0.033 0.000 0.019 0.000 0.011 0.000 0.008 0.000 0.007 0.000 0.005 0.000 0.008 0.001 0.006 0.001 0.007 0.000 0.005 0.000 0.005 0.000 0.004 0.000 0.004 0.000 0.003 0.000 0.003 0.000 0.003 0.001 0.003 0.000 0.003 0.001
POHC Limit(A): 0.068 50.00 0.741 2.821 0.932
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.539
28.3
0.138
0.809
21.84
Pass
0.301
10.8
0.033
0.452
8.00
Pass
0.159
11.8
0.021
0.238
8.70
Pass
0.079
14.5
0.008
0.119
15.11
Pass
0.056
14.8
0.011
0.083
13.03
Pass
0.048
14.5
0.009
0.070
12.18
Pass
0.041
12.8
0.007
0.061
12.09
Pass
0.036
21.1
0.012
0.054
20.85
Pass
0.032
19.7
0.005
0.048
20.42
Pass
0.029
25.6
0.007
0.044
21.76
Pass
0.026
20.0
0.010
0.040
23.91
Pass
0.024
21.9
0.007
0.037
20.10
Pass
0.023
17.2
0.006
0.034
17.32
Pass
0.021
16.9
0.004
0.032
16.02
Pass
0.020
17.1
0.003
0.030
18.48
Pass
0.018
16.3
0.005
0.028
16.94
Pass
0.017
19.3
0.005
0.026
18.27
Pass
0.017
16.9
0.004
0.025
14.67
Pass
0.016
19.1
0.004
0.023
17.73
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass.
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Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 3
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
1.5
300
1.0
200
0.5
100
0.0
0
-0.5
-100
-1.0
-200
-1.5
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 4
Test result: Pass
8
12
16 20 24 Harmonic #
28
32
Worst harmonic was #27 with 37.75% of the limit. Page: 105 of 173
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No：112040R-ITCEP07V06 Test Result: Pass Source qualification: Normal THC(A): 0.14 I-THD(%): 34.70 POHC(A): 0.013 Highest parameter values during test: V_RMS (Volts): 229.64 Frequency(Hz): I_Peak (Amps): 1.278 I_RMS (Amps): I_Fund (Amps): 0.532 Crest Factor: Power (Watts): 148.9 Power Factor: Harm#
Harms(avg)
2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
0.001 0.134 0.000 0.031 0.001 0.016 0.000 0.015 0.000 0.008 0.000 0.006 0.000 0.008 0.000 0.004 0.000 0.007 0.000 0.005 0.000 0.007 0.000 0.003 0.000 0.006 0.000 0.004 0.000 0.003 0.000 0.003 0.000 0.004 0.000 0.003 0.000 0.002 0.000
POHC Limit(A): 0.064 50.00 0.686 2.789 0.945
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.506
26.6
0.133
0.759
20.46
Pass
0.283
11.1
0.032
0.424
7.88
Pass
0.149
11.0
0.014
0.223
9.14
Pass
0.074
20.6
0.015
0.112
20.00
Pass
0.052
15.1
0.008
0.078
12.82
Pass
0.045
13.9
0.007
0.066
10.30
Pass
0.039
19.7
0.007
0.057
15.94
Pass
0.034
13.1
0.004
0.051
13.72
Pass
0.030
22.7
0.007
0.045
19.02
Pass
0.027
16.7
0.004
0.041
13.19
Pass
0.025
26.2
0.007
0.037
28.26
Pass
0.023
13.3
0.002
0.034
19.46
Pass
0.021
28.1
0.006
0.032
28.63
Pass
0.020
20.1
0.003
0.030
14.43
Pass
0.018
18.8
0.004
0.028
21.94
Pass
0.017
16.4
0.002
0.026
30.74
Pass
0.016
24.0
0.004
0.025
24.01
Pass
0.015
19.4
0.003
0.023
16.63
Pass
0.015
16.0
0.002
0.022
16.80
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as the maximum harmonics/limit ratio. 2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others the result should be pass.
Page: 106 of 173
Report No：112040R-ITCEP07V06
6.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Power Harmonics Test Setup
: Mode 2 : Power Harmonics Test Setup
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Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : Power Harmonics Test Setup
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Report No：112040R-ITCEP07V06
7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit The following limits apply: － the value of Pst shall not be greater than 1.0; － the value of Plt shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500 ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed; a) 4 ％ without additional conditions; b)
6 ％ for equipment which is: － switched manually, or － switched automatically more frequently than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per hour will give a P1t of about 0.65. Page: 109 of 173
Report No：112040R-ITCEP07V06
c)
7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or － switched on automatically, or is intended to be switched on manually, no more than twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.
7.5. Deviation from Test Standard No deviation.
Page: 110 of 173
Report No：112040R-ITCEP07V06
7.6. Test Result Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 1
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00 Pst
0.75 0.50 0.25 3:58:31
Plt and limit line
Plt
0.50 0.25
3:58:31
Parameter values recorded during the test: Vrms at the end of test (Volt): 229.48 Highest dt (%): 0.00 Time(mS) > dt: 0.00 Highest dc (%): 0.00 Highest dmax (%): 0.00 Highest Pst (10 min. period): 0.196 Highest Plt (2 hr. period): 0.086
Test limit (%): Test limit (mS): Test limit (%): Test limit (%): Test limit: Test limit:
Page: 111 of 173
3.30 500.0 3.30 4.00 1.000 0.650
Pass Pass Pass Pass Pass Pass
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 2
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00
Pst
0.75 0.50 0.25 3:22:07
Plt and limit line
Plt
0.50 0.25
3:22:07
Parameter values recorded during the test: Vrms at the end of test (Volt): 229.33 Highest dt (%): 0.00 Time(mS) > dt: 0.0 Highest dc (%): 0.00 Highest dmax (%): 0.00 Highest Pst (10 min. period): 0.083 Highest Plt (2 hr. period): 0.036
Test limit (%): Test limit (mS): Test limit (%): Test limit (%): Test limit: Test limit: Page: 112 of 173
3.30 500.0 3.30 4.00 1.000 0.650
Pass Pass Pass Pass Pass Pass
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 3
Date of Test
2011/02/24
Test Result: Pass
Test Site
No.3 Shielded Room
Status: Test Completed
Psti and limit line
European Limits
1.00 Pst
0.75 0.50 0.25 3:03:48
Plt and limit line
Plt
0.50 0.25
3:03:48
Parameter values recorded during the test: Vrms at the end of test (Volt): 229.44 Highest dt (%): 0.00 Time(mS) > dt: 0.0 Highest dc (%): 0.00 Highest dmax (%): 0.00 Highest Pst (10 min. period): 0.083 Highest Plt (2 hr. period): 0.036
Test limit (%): Test limit (mS): Test limit (%): Test limit (%): Test limit: Test limit:
Page: 113 of 173
3.30 500.0 3.30 4.00 1.000 0.650
Pass Pass Pass Pass Pass Pass
Report No：112040R-ITCEP07V06
7.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Flicker Test Setup
: Mode 2 : Flicker Test Setup
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Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : Flicker Test Setup
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Report No：112040R-ITCEP07V06
8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit Item Environmental
Units
Test Specification
Phenomena
Performance Criteria
Enclosure Port Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge ±4 Contact Discharge
Page: 116 of 173
B
Report No：112040R-ITCEP07V06
8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT. Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.
8.5. Deviation from Test Standard No deviation.
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Report No：112040R-ITCEP07V06
8.6. Test Result Product
Notebook
Test Item
Electrostatic Discharge
Test Mode
Mode 1
Date of Test
2011/02/04
Item
Amount of Discharge
Test Site
Voltage
No.6 Shielded Room
Required Criteria
Complied To Criteria
Results
(A,B,C)
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(HCP)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Front)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Left)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Back)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Right)
25
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 118 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Electrostatic Discharge
Test Mode
Mode 2
Date of Test
2011/02/04
Item
Amount of Discharge
Test Site
Voltage
No.6 Shielded Room
Required Criteria
Complied To Criteria
Results
(A,B,C)
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(HCP)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Front)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Left)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Back)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Right)
25
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 119 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Electrostatic Discharge
Test Mode
Mode 3
Date of Test
2011/02/04
Item
Amount of Discharge
Test Site
Voltage
No.6 Shielded Room
Required Criteria
Complied To Criteria
Results
(A,B,C)
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
A
Pass
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(HCP)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Front)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Left)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Back)
25
-4kV
B
A
Pass
Indirect Discharge
25
+4kV
B
A
Pass
(VCP Right)
25
-4kV
B
A
Pass
Air Discharge
Contact Discharge
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test. Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.
Page: 120 of 173
Report No：112040R-ITCEP07V06
8.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : ESD Test Setup
: Mode 2 : ESD Test Setup
Page: 121 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : ESD Test Setup
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Report No：112040R-ITCEP07V06
9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3
9.2. Test Setup
9.3. Limit Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port 80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 123 of 173
80
A
Report No：112040R-ITCEP07V06
9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen. All the scanning conditions are as follows: Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
∆ f :
1% 1.5 x 10-3 decades/s
9.5. Deviation from Test Standard No deviation.
Page: 124 of 173
Report No：112040R-ITCEP07V06
9.6. Test Result Product
Notebook
Test Item
Radiated susceptibility
Test Mode
Mode 1
Date of Test
2011/02/23
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength (V/m)
Criteria
Criteria
Results
(A,B,C)
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at MHz. at frequency No false alarms or other malfunctions were observed during or after the test.
Page: 125 of 173
V/m
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Radiated susceptibility
Test Mode
Mode 2
Date of Test
2011/02/23
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength (V/m)
Criteria
Criteria
Results
(A,B,C)
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at MHz. at frequency No false alarms or other malfunctions were observed during or after the test.
Page: 126 of 173
V/m
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Radiated susceptibility
Test Mode
Mode 3
Date of Test
2011/02/23
Test Site
Field
Chamber5
Required
Complied To
Frequency
Position
Polarity
(MHz)
(Angle)
(H or V)
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Strength (V/m)
Criteria
Criteria
Results
(A,B,C)
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at MHz. at frequency No false alarms or other malfunctions were observed during or after the test.
Page: 127 of 173
V/m
Report No：112040R-ITCEP07V06
9.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Radiated Susceptibility Test Setup
: Mode 2 : Radiated Susceptibility Test Setup
Page: 128 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : Radiated Susceptibility Test Setup
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Report No：112040R-ITCEP07V06
10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4-4
10.2. Test Setup
10.3. Limit Item Environmental Units Phenomena I/O and communication ports Fast Transients Common kV (Peak) Mode Tr/Th ns Rep. Frequency kHz Input DC Power Ports Fast Transients Common kV (Peak) Mode Tr/Th ns Rep. Frequency kHz Input AC Power Ports Fast Transients Common kV (Peak) Mode Tr/Th ns Rep. Frequency kHz
Page: 130 of 173
Test Specification Performance Criteria +0.5 5/50 5
B
+0.5 5/50 5
B
+1 5/50 5
B
Report No：112040R-ITCEP07V06
10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m.
10.5. Deviation from Test Standard No deviation.
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Report No：112040R-ITCEP07V06
10.6. Test Result Product
Notebook
Test Item
Electrical fast transient/burst
Test Mode
Mode 1
Date of Test
2011/02/23
Inject Line
Polarity
Voltage kV
Test Site Inject Time (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N-PE
±
1kV
60
Direct
B
A
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line . No false alarms or other malfunctions were observed during or after the test.
Page: 132 of 173
kV of
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Electrical fast transient/burst
Test Mode
Mode 2
Date of Test
2011/02/23
Inject Line
Polarity
Voltage kV
Test Site Inject Time (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N-PE
±
1kV
60
Direct
B
A
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line . No false alarms or other malfunctions were observed during or after the test.
Page: 133 of 173
kV of
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Electrical fast transient/burst
Test Mode
Mode 3
Date of Test
2011/02/23
Inject Line
Polarity
Voltage kV
Test Site Inject Time (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N-PE
±
1kV
60
Direct
B
A
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line . No false alarms or other malfunctions were observed during or after the test.
Page: 134 of 173
kV of
Report No：112040R-ITCEP07V06
10.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : EFT/B Test Setup
: Mode 1 : EFT/B Test Setup-Clamp
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Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 2 : EFT/B Test Setup
: Mode 2 : EFT/B Test Setup-Clamp
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Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 3 : EFT/B Test Setup
: Mode 3 : EFT/B Test Setup - Clamp
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Report No：112040R-ITCEP07V06
11. Surge 11.1. Test Specification According to Standard : IEC 61000-4-5
11.2. Test Setup
11.3. Limit Item Environmental Phenomena Units
Test Specification Performance Criteria Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Tr/Th us 1.2/50 (8/20) B Line to Ground kV ±1 Input DC Power Ports Surges Tr/Th us 1.2/50 (8/20) B Line to Ground kV ± 0.5 AC Input and AC Output Power Ports Surges Tr/Th us 1.2/50 (8/20) Line to Line kV B ±1 Line to Ground kV ±2 Notes: 1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required.
Page: 138 of 173
Report No：112040R-ITCEP07V06
11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.
11.5. Deviation from Test Standard No deviation.
Page: 139 of 173
Report No：112040R-ITCEP07V06
11.6. Test Result Product
Notebook
Test Item
Surge
Test Mode
Mode 1
Date of Test
2011/02/23
Inject Line
Polarity
Angle
Test Site
Voltage kV
Time Interval (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at . Line No false alarms or other malfunctions were observed during or after the test.
Page: 140 of 173
kV of
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Surge
Test Mode
Mode 2
Date of Test
2011/02/23
Inject Line
Polarity
Angle
Test Site
Voltage kV
Time Interval (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line . No false alarms or other malfunctions were observed during or after the test.
Page: 141 of 173
kV of
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Surge
Test Mode
Mode 3
Date of Test
2011/02/23
Inject Line
Polarity
Angle
Test Site
Voltage kV
Time Interval (Second)
No.3 Shielded Room
Inject
Required
Method
Criteria
Complied to
Result
Criteria
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at Line . No false alarms or other malfunctions were observed during or after the test.
Page: 142 of 173
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Report No：112040R-ITCEP07V06
11.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : SURGE Test Setup
: Mode 2 : SURGE Test Setup
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Test Mode Description
: Mode 3 : SURGE Test Setup
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Report No：112040R-ITCEP07V06
12. Conducted Susceptibility 12.1. Test Specification According to Standard : IEC 61000-4-6
12.2. Test Setup CDN Test Mode
EM Clamp Test Mode
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12.3. Limit Item Environmental Phenomena Units Signal Ports and Telecommunication Ports Radio-Frequency MHz Continuous Conducted V (rms, Un-modulated) % AM (1kHz) Input DC Power Ports Radio-Frequency MHz Continuous Conducted V (rms, Un-modulated) % AM (1kHz) Input AC Power Ports Radio-Frequency MHz Continuous Conducted V (rms, Un-modulated) % AM (1kHz)
Test Specification 0.15-80 3 80 0.15-80 3 80 0.15-80 3 80
Performance Criteria
A
A
A
12.4. Test Procedure The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test 1. Field Strength 2. Radiated Signal 3. Scanning Frequency 4 Dwell Time 5. Frequency step size ∆ f : 6. The rate of Swept of Frequency
Remarks 130dBuV(3V) Level 2 AM 80% Modulated with 1kHz 0.15MHz – 80MHz 3 Seconds 1% 1.5 x 10-3 decades/s
12.5. Deviation from Test Standard No deviation.
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Report No：112040R-ITCEP07V06
12.6. Test Result Product
Notebook
Test Item
Conducted susceptibility
Test Mode
Mode 1
Date of Test
2011/02/23
Test Site
No.6 Shielded Room Result
Frequency
Voltage
Inject
Tested Port
Required
Performance
Range
Applied
Method
of
Criteria
Criteria
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
Complied To
EUT
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
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Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Conducted susceptibility
Test Mode
Mode 2
Date of Test
2011/02/23
Test Site
No.6 Shielded Room Result
Frequency
Voltage
Inject
Tested Port
Required
Performance
Range
Applied
Method
of
Criteria
Criteria
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
Complied To
EUT
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Page: 148 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Conducted susceptibility
Test Mode
Mode 3
Date of Test
2011/02/23
Test Site
No.6 Shielded Room Result
Frequency
Voltage
Inject
Tested Port
Required
Performance
Range
Applied
Method
of
Criteria
Criteria
(MHz)
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
Complied To
EUT
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz. No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Page: 149 of 173
Report No：112040R-ITCEP07V06
12.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Conducted Susceptibility Test Setup
: Mode 1 : Conducted Susceptibility Test Setup-CDN
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Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 2 : Conducted Susceptibility Test Setup
: Mode 2 : Conducted Susceptibility Test Setup-CDN
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Report No：112040R-ITCEP07V06
Test Mode Description
Test Mode Description
: Mode 3 : Conducted Susceptibility Test Setup
: Mode 3 : Conducted Susceptibility Test Setup - CDN
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Report No：112040R-ITCEP07V06
13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-8
13.2. Test Setup
13.3. Limit Item
Environmental Phenomena Enclosure Port Power-Frequency Magnetic Field
Units
Test Specification Performance Criteria
Hz A/m (r.m.s.)
50 1
A
13.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT. And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations).
13.5. Deviation from Test Standard No deviation. Page: 153 of 173
Report No：112040R-ITCEP07V06
13.6. Test Result Product
Notebook
Test Item
Power frequency magnetic field
Test Mode
Mode 1
Date of Test
2011/02/23
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Page: 154 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Power frequency magnetic field
Test Mode
Mode 2
Date of Test
2011/02/23
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Page: 155 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Power frequency magnetic field
Test Mode
Mode 3
Date of Test
2011/02/23
Polarization
Test Site
No.3 Shielded Room
Frequency
Magnetic
Required
Performance
(Hz)
Strength
Performance
Criteria
(A/m)
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.
Page: 156 of 173
Report No：112040R-ITCEP07V06
13.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Power Frequency Magnetic Field Test Setup
: Mode 2 : Power Frequency Magnetic Field Test Setup
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Test Mode Description
: Mode 3 : Power Frequency Magnetic Field Test Setup
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Report No：112040R-ITCEP07V06
14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-11
14.2. Test Setup
14.3. Limit Item Environmental
Units
Test Specification Performance
Phenomena Input AC Power Ports Voltage Dips
Criteria % Reduction
30
Period
25
% Reduction
>95
Period Voltage Interruptions
0.5
% Reduction
> 95
Period
250
Page: 159 of 173
C B C
Report No：112040R-ITCEP07V06
14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the voltage.
14.5. Deviation from Test Standard No deviation.
Page: 160 of 173
Report No：112040R-ITCEP07V06
14.6. Test Result Product
Notebook
Test Item
Voltage dips and interruption
Test Mode
Mode 1
Date of Test
2011/02/23
Voltage Dips and
Angle
Interruption
Test Site Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C C C C C C C C B B B B B B B B C C C C C C C C
A A A A A A A A A A A A A A A A B B B B B B B B
Reduction(%) 30 30 30 30 30 30 30 30 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95
0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315
No.3 Shielded Room
25 25 25 25 25 25 25 25 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 250 250 250 250 250 250 250 250
Test Result
PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 161 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Voltage dips and interruption
Test Mode
Mode 2
Date of Test
2011/02/23
Voltage Dips and
Angle
Interruption
Test Site Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C C C C C C C C B B B B B B B B C C C C C C C C
A A A A A A A A A A A A A A A A B B B B B B B B
Reduction(%) 30 30 30 30 30 30 30 30 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95
0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315
No.3 Shielded Room
25 25 25 25 25 25 25 25 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 250 250 250 250 250 250 250 250
Test Result
PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 162 of 173
Report No：112040R-ITCEP07V06
Product
Notebook
Test Item
Voltage dips and interruption
Test Mode
Mode 3
Date of Test
2011/02/23
Voltage Dips and
Angle
Interruption
Test Site Test Duration
Required
Performance
(Periods)
Performance
Criteria
Criteria
Complied To
C C C C C C C C B B B B B B B B C C C C C C C C
A A A A A A A A A A A A A A A A B B B B B B B B
Reduction(%) 30 30 30 30 30 30 30 30 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95 >95
0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315 0 45 90 135 180 225 270 315
No.3 Shielded Room
25 25 25 25 25 25 25 25 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 250 250 250 250 250 250 250 250
Test Result
PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test. Page: 163 of 173
Report No：112040R-ITCEP07V06
14.7. Test Photograph Test Mode Description
Test Mode Description
: Mode 1 : Voltage Dips Test Setup
: Mode 2 : Voltage Dips Test Setup
Page: 164 of 173
Report No：112040R-ITCEP07V06
Test Mode Description
: Mode 3 : Voltage Dips Test Setup
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Report No：112040R-ITCEP07V06
15. Attachment EUT Photograph (1) EUT Photo
(2) EUT Photo
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(3) EUT Photo
(4) EUT Photo
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(5) EUT Photo
(6) EUT Photo
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Report No：112040R-ITCEP07V06
(7) EUT Photo
(8) EUT Photo
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(9) EUT Photo
(10) EUT Photo
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Report No：112040R-ITCEP07V06
(11) EUT Photo
(12) EUT Photo
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Report No：112040R-ITCEP07V06
(13) EUT Photo
(14) EUT Photo
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Report No：112040R-ITCEP07V06
(15) EUT Photo
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