Transcript
PRODUCT INTRODUCTION
MU860x20A Demodulation Unit
MX860x20A W-CDMA BER/BLER Measurement Software
ANRITSU CORPORATION
CONFIDENTIAL
Copyright 2003 by ANRITSU CORPORATION The contents of this manual shall not be disclosed in any way or reproduced in any media without the express written permission of Anritsu Corporation.
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MS860xA Transmitter Tester MU860x20A Demodulation Unit MX860x20A W-CDMA BER/BLER Measurement Software
Product Introduction (Ver.2.0)
Product Marketing Dept. Wireless Measurement Div. Anritsu Corporation Slide 1
MU860x20A/MX860x20A-E-I-1
Product concept Conventional RF Rx part + BB Rx part are needed
for BER Test.
RFRx Rx RF
BB Rx Rx BB
BER test item TS 34 .1 2 1 V3.0.1 6 6.2 6.3 6.4 6.5 6.6 6.7 6.8 7 7.2
Terminal Conformance Specification Receiver Test Reference Sensitivity Level Maximum Input Level Adjacent Channel Selectivity (ACS) Blocking Characteristics Spurious Response Intermodulation Characteristics Spurious Emissions Pe rform an c e Re q uirem en t D em od ula tion in Sta tic Pro pagation C onditio ns
Measurement Method BER BER BER BER BER BER Spectrum BLER
BER Test can be performed only in RF Rx part by New proposal substituting BB function of Tx tester.
Merits
RF RFRx Rx
MU860x20A/MX860x20A-E-I-1
•Able to continue the development of RF part even if the BB part is not available for some reasons. •Able to use it as a reference receiver of BB Rx part. •Able to perform fault isolation in RF Rx part and BB Rx potion.
Tx Tx tester tester
Slide 2
1
Configuration
*Preinstalled in a PC card for W-CDMA BER/BLER measurement software.
Evaluation waveform (3GPP TS25.101)
MU860820A/MU860920A Demodulation unit
insta
ll
tall ins
MX860820A/MX860920A W-CDMA BER/BLER measurement software
in st al l
Tx tester (MS860xA)
Digital modulation SG (MG3681A)
Features X RF Rx part of W-CDMA UE can be evaluated by BER/BLER. X BER can be measured with/without Error correcting function. X Demodulation data(Data,Clock,Enable,Error) is outputted from the rear of MS860xA. (The development of data logging and analyzing application is being considered.)
Slide 3
MU860x20A/MX860x20A-E-I-1
System summary
Tx Tester (MS860xA) PN9 or PN15 generated within Tx tester.
MG3681A
compare
Calculates BER
synchronize
Evaluation waveform (3GPP TS25.101)
PN9 or PN15 which have passed the tests. (Data part of DTCH or DCCH)
RF signal
IQ signal
W-CDMA UE
BB part
RF part RF Rx
A/D
Despread
QPSK demod.
D/A
Spread
QPSK mod.
CPU Deinter leave
CH decoding
Rx Data
Bit interleave
CH coding
Tx Data
Skipped in Decode OFF.
Decode ON/OFF function Minute error status can be observed by eliminating error correcting function in Decode OFF. (Error correcting function is capable of correcting errors of max.1.0 x E-3(approx.). If error correcting function is ON, it is unable to identify the generation of error less than 1.0 x E-3.)
MU860x20A/MX860x20A-E-I-1
2
Slide 4
Connections Tx tester (MS860xA)
Digital modulation SG (MG3681A) Reference(10MHz)
Evaluation waveform
Super Frame Clock(40 x N ms)
(3GPP TS25.101)
Demodulation unit (MU860x20A) BER/BLER measurement S/W (MX860x20A)
Reference (10MHz) Detection level signal (12Bit,serial) Jig (if necessary) to generate reference frequency within the module and output control
RF signal
Jig
Corresponding to IQ input only. Input range : 0.1Vp-p to 1.0Vp-p
I signal
RF Rx part
Q signal
Reference frequency generation : required when the reference crystal accuracy inside Rx module is low. (Normally the crystal accuracy within Rx module is low because reference frequency is provided by BB part.) Output control : required when module output is out of Tx tester’s input range, 0.1Vp-p to 1.0Vp-p.
MU860x20A/MX860x20A-E-I-1
Slide 5
•Evaluation waveform (for MG3681A) File name
Contents
P12v1 P12Nv1
3GPP TS25.101 A.3.1 DL reference measurement channel(12.2 kbps)
P64v1 P64Nv1
3GPP TS25.101 A.3.2 DL reference measurement channel(64 kbps)
P144v1 P144Nv1
3GPP TS25.101 A.3.3 DL reference measurement channel(144 kbps)
P384v1 P384Nv1
3GPP TS25.101 A.3.4 DL reference measurement channel(384 kbps)
RSv1 RSNv1
For testing 6.2 Reception sensitivity
MAXv1 MAXNv1
For testing 6.3 Max. input level
(Transmitter Tester measures by setting to 12.2kbps)
•Evaluation waveforms with N are without decoding.
MU860x20A/MX860x20A-E-I-1
Slide 6
3
•Terminal test item(Rx) TS 34.121 V3.0.1 6 6.2 6.3 6.4 6.5 6.6 6.7 6.8 7 7.2 7.3 7.4 7.5 7.6 7.6.1 7.6.2 7.6.3 7.7 7.7.1 7.8 7.9 7.10
Meas . function
Term inal C onform anc e Spec ification Receiver Tes t Reference Sensitivity Level Maxim um Input Level Adjac ent C hannel Selec tivity (ACS) Blocking Charac teris tic s Spurious Response Interm odulation Charac teristics Spurious Em iss ions Perform anc e Requirem ent Dem odulation in Static Propagation Conditions Dem odulation of DCH in Multi-path Fading Propagation Conditions Dem odulation of DCH in Moving Propagation Conditions Dem odulation of DCH in Birth-death Propagation Conditions Dem odulation in of DCH in Bas e Station Trans m it Divers ity Mode Dem odulation of DCH in O pen-loop Transm it Divers ity Mode Dem odulation of DCH in Clos ed Loop Trans m it D ivers ity Mode Dem odulation of DCH in Site Selec tion Divers ity Trans m iss ion Mode Dem odulation in Handover Conditions Inter-Cell Soft Handover Perform ance Inner Loop Power Control in D ownlink O uter Loop Power Control in Downlink D ow nlink C om pres sed Mode
Re altime BER supporting ite m
√ BER √ BER √ BER √ BER √ BER √ BER Spec trum Unnec es sary for m odule √
BLER BLER BLER BLER
× × ×
BLER BLER BLER
× × ×
BLER BLER
× × × ×
Performance tests (7.2~7.10) are not supported because they are performed under multi-path fading environment and BB performance affects the test result.
Slide 7
MU860x20A/MX860x20A-E-I-1
•Down link 6.2 Reception sensitivity 6.3 Max. input level
MG3681A Digital Modulation Signal Generator
MS8609A Transmitter Tester Reference
Eva. waveform (3GPP TS25.101)
Demodulation Board Super Frame Clock
+ BER Measurement S/W
Reference Detection level signal (only when demod. Board is operated)
Jig
I signal RF signal
Rx module
Q signal
Tests are performable at SG output level set to module’s reception sensitivity level or max. input level !! MU860x20A/MX860x20A-E-I-1
4
Slide 8
BER display
•Down link
6.4 Adjacent CH selectivity 6.5 Blocking characteristic 6.6 Spurious response
MG3681A Digital Modulation Signal Generator
MS8609A Transmitter Tester Reference
Demodulation Board
Eva. waveform
Super Frame Clock
(3GPP TS25.101)
+ BER Measurement S/W
Reference
Wanted signal
Detection level signal (only when demod. Board
Function
Cursor
I signal
Edit
MG3681A
Step Set
Digital Modulation Signal Ge ne rator 250kHz -3GHz 3-6GHz (Optio n)
F1
Preset
Frequency
F2
Canc el
Lev el
Resolution
Contrast
Screen Copy Display Off/On
Panel Lock
F3
Digital Mod
F4
Analog Mod
F5
Memory
CE BS
Shift
F6
E
F
dB
7
8
9
GHz/dBm
A
B
C
%
4
5
6
MHz/mW
1
Config
0 I/Q Input / I/Q Output
Digital Input
I/Q Output
2
3
kHz/nW
・
-/+
Hz / fW
Analog
ms / V
RF Output rad / mV
RPP Reset Off>○< On●
1
2
3
4
5
I / Wide AM
Q
I
Q
Pulse
AM
TTL
TTL
TTL
TTL
50Ω
50Ω
50Ω
50Ω
TTL
600Ω
Output !
AF
FM/φM
RF
Reverse Power 50W Max≦1GHz 25W Max>1GHz ±50V DC Ma x
600Ω
600Ω
Σ
deg / µV
Input
TTL
RF signal
Digital
s /dBµV
Rec all
Local
Stby On
Knob Hold
Modulation
D
S ave
Remote
BER display
is operated)
Jig
50Ω
Interfering signal
Rx module
Q signal e.g. Setting of adjacent CH selectivity -52dBm
Adjacent CH selectivity and blocking performance of the module are tested by mixing interfering signals from other SGs!!
Interfering signal
-92.7dBm
Wanted signal +5MHz
Slide 9
MU860x20A/MX860x20A-E-I-1
•Down link
6.7 Inter-modulation characteristic
MG3681A Digital Modulation Signal Generator
MS8609A Transmitter Tester Reference
Eva. waveform
Demodulation Board Super Frame Clock
(3GPP TS25.101)
+ BER Measurement S/W
Reference Wanted signal
Detection level signal (only when demod. board is operated)
BER display
Jig
Function
Cursor
Step Set
Frequency
F1
Preset
Canc el
Lev el
F2
Resolution
Contrast
Screen Copy Display Off/On
F3
Digital Mod
F4
Analog Mod
F5
Memory
F6
Config
CE BS
Shift
D
7
Panel Lock
E
8
dB
GHz/dBm
C
%
6
MHz/mW
2
3
kHz/nW
0
・
-/+
Hz / fW
4
B
5
Digital
s /dBµV
Analog
ms / V
RF Output rad / mV
RPP Reset Off>○< On●
Rec all
Local
TTL
2
TTL
3
TTL
I/Q Output
I/Q Input / I/Q Output
Digital Input 1
4
TTL
5
TTL
I / Wide AM
50Ω
Q
I
50Ω
50Ω
deg / µV
Input Q
50Ω
Pulse
Output
AM
TTL
Knob Hold
Modulation
F
9
1
A
S ave
Remote
Stby On
I signal
Edit
MG3681A Digital Modulation Signal Ge ne rator 250kHz -3GHz 3-6GHz (Optio n)
AF
FM/φM
600Ω
600Ω
600Ω
RF
! Reverse Power 50W Max≦1GHz 25W Max>1GHz ±50V DC Ma x
50Ω
Interfering signal 1 Function
Cursor
Σ
RF signal
Rx module
Q signal
-46dBm
Edit
MG3681A
Step Set
Digital Modulation Signal Ge ne rator 250kHz -3GHz 3-6GHz (Optio n)
F1
Preset
Frequency
F2
Canc el
Lev el
Resolution
Contrast
Screen Copy Display Off/On
Panel Lock
F3
Digital Mod
F4
Analog Mod
F5
Memory
F6
Config
Shift
CE BS E
F
dB
7
8
9
GHz/dBm
A
B
C
%
4
5
6
MHz/mW
Digital
s /dBµV
Analog
ms / V
S ave
Remote
1
2
3
kHz/nW
0
・
-/+
Hz / fW
RF Output rad / mV
RPP Reset Off>○< On●
Rec all
Local I/Q Input / I/Q Output
Digital Input
Stby On
I/Q Output
deg / µV
Input
1
2
3
4
5
I / Wide AM
Q
I
Q
Pulse
AM
TTL
TTL
TTL
TTL
TTL
50Ω
50Ω
50Ω
50Ω
TTL
600Ω
Knob Hold
Modulation
D
Output FM/φM
600Ω
AF
600Ω
e.g. Setting of IM characteristic
! Reverse Power 50W Max≦1GHz 25W Max>1GHz ±50V DC Ma x
RF
50Ω
Interfering signal 2
Sensitivity deterioration due to module IM is tested by mixing interfering signals from other SGs!!
CW Interfering signal
-103.7dBm Wanted signal
+10MHz +20MHz CW : Continuous Wave
MU860x20A/MX860x20A-E-I-1
Slide 10
5
•Down link
7.2 Performance test
MG3681A Digital Modulation Signal Generator
MS8609A Transmitter Tester Reference
Eva. waveform (3GPP TS25.101)
Demodulation Board + BER Measurement S/W
Super Frame Clock Reference
Wanted signal
Detection level signal (only when demod. board is operated)
BLER display
Jig
Function
Cursor
I signal
Edit
MG3681A
Step Set
Digital Modulation Signal Ge ne rator 250kHz -3GHz 3-6GHz (Optio n)
Frequency
F1
Preset
F2
Canc el
Lev el
Resolution
Contrast
Screen Copy Display Off/On
F3
Digital Mod
F4
Analog Mod
F5
Memory
F6
Config
CE BS
Shift
D
7
Panel Lock
E
8
dB
GHz/dBm
C
%
6
MHz/mW
2
3
kHz/nW
0
・
-/+
Hz / fW
4
B
5
Digital
s /dBµV
Analog
ms / V
RF Output rad / mV
RPP Reset Off>○< On●
Rec all
Local I/Q Input / I/Q Output
Digital Input
Stby On 1
TTL
2
TTL
3
TTL
4
TTL
5
TTL
I / Wide AM
50Ω
Q
50Ω
I/Q Output I
50Ω
50Ω
Pulse
TTL
AM
600Ω
Σ
deg / µV
Input Q
Knob Hold
Modulation
F
9
1
A
S ave
Remote
Output FM/φM
600Ω
AF
600Ω
! Reverse Power 50W Max≦1GHz 25W Max>1GHz ±50V DC Ma x
RF
50Ω
AWGN
RF signal
Rx module
Q signal
Module performance test is realized through BLER measurement by mixing AWGN from other SGs!! Slide 11
MU860x20A/MX860x20A-E-I-1
•Terminal test items (Tx) Measured by MX860x01B W-CDMA Measurement Software. *Both W-CDMA BER/BLER software and demodulation unit are not necessary. TS 34.121 V3.0.1
Meas .func tion
M X 860x01B supporting ite ms
Trans m itter Tes t Maxim um O utput P ow er Frequenc y S tability O utput P ow er D ynam ic s in the Uplink O pen Loop P ow er C ontrol in the Uplink Inner Loop P ow er C ontrol in the Uplink Minim um O utput P ow er
P ow er Level Frequenc y
√
P ow er Level P ow er Level P ow er Level
Unnec es s ary for m odule Unnec es s ary for m odule
5.5 5.5.1 5.5.2 5.6 5.7 5.8
Trans m it O N/O FF P ow er Trans m it O FF P ow er Trans m it O N/O FF Tim e Mas k C hange of TFC P ow er S etting in Uplink C om pres s d Mode O c c upied B andw idth
P ow er Level P ow er Level P ow er Level P ow er Level S pec trum
Unnec es s ary Unnec es s ary Unnec es s ary Unnec es s ary
5.9 5.10 5.11 5.12 5.13 5.13.1 5.13.2
S pec trum E m is s ion Mas k Adjac ent C hannel Leakage P ow er R atio (AC LR ) S purious E m is s ions Trans m it Interm odulation Trans m it Modulation Modulation Ac c urac y P eak C ode D om ain E rror
MU860x20A/MX860x20A-E-I-1
6
Term inal C onform anc e S pec ific ation
5 5.2 5.3 5.4 5.4.1 5.4.2 5.4.3
Slide 12
S pec trum S pec trum S pec trum S pec trum E VM PC DE
√
√
for for for for
m odule m odule m odule m odule
√ √ √ √
Unnec es s ary for m odule √ √
•Up link MS8609A Transmitter Tester
MG3681A Digital Modulation Signal Generator Reference
W-CDMA Measurement S/W (MX860x01B) Reference
Jig
Q signal RF signal
Tx module
I signal
Ex.power supply variable
Slide 13
MU860x20A/MX860x20A-E-I-1
Example of measurement result (12.2kbps) BER,BLER vs Eb/N0(Performance test 12.2kbps,Viterbi) 1.E+00
Sufficient margin
1.E-01
Better BER
BER,BLER
1.E-02
1.E-03
1.E-04
Performance deterioration
1.E-05
BER actual value BER simulation value BLER actual value
1.E-06
BLER simulation value BLER,3GPP spec.value
1.E-07 0
1
2
3
4
5
6
Eb/N0(dB)
Better S/N
*BER performance deteriorates 0.3dB(12.2kbps) to 1dB(384kbps) in comparison with simulation value. Normally, however, BB part of mobile equipment has deterioration of approx. 1dB in its BER performance. Therefore, satisfactory performance is maintained. MU860x20A/MX860x20A-E-I-1
Slide 14
7
•Parameter setup screen
IQ-AC IQ-DC IQ-balance
50Ω 1MΩ
Go to P18 Go to P16 No Filter Normal ACP Used together with the Scrambling Code Number of evaluation signals. Error correction function ON/OFF 1 : DTCH 2 : DCCH Go to P19 for 12.2kbps for 64.0kbps for 144.0kbps for 384 kbps
MU860x20A/MX860x20A-E-I-1
Slide 15
•BER/BLER measurement screen (1)
Resynchronized
Count Every:Refreshed at every timing (100ms) of entire screen’s refresh. Once:Refreshed when count reaches the preset value.
MU860x20A/MX860x20A-E-I-1
8
Slide 16
•BER/BLER measurement screen (2)
(1) Upper count setting
Display switching of Error Rate/Error Count
PN pattern setting ① (2) Upper count setting ② Display switching of Error Rate/Error Count
MU860x20A/MX860x20A-E-I-1
Slide 17
•Parameter package list screen
for 12.2kbps for 64.0kbps for 144.0kbps for 384 kbps •Detail parameters for each of above 4 types are displayed.
MU860x20A/MX860x20A-E-I-1
Slide 18
9
•Confirmation screen of rear connector’s pin assignment •Pin assignment for signals outputted from the rear can be confirmed.
Slide 19
MU860x20A/MX860x20A-E-I-1
Merits of Real-time BER • Estimation of BER by NF and EVM, etc. Merit
Real-time BER
Accuracy in meas. result allows for deteriorating the performance to the threshold of required level. As a result, cheaper components can be adopted .
Cost reduced
• Measurement of BER X Measured by the BB Rx part of conventional model. Merit
Error correct OFF function enables to observe minute errors less than 1.0 x E-3, thus, more reliable quality assurance is achieved.
Real-time BER More reliable quality assurance
Real-time BER X Measured by the BB Rx part of newly-developed model. Developed at its Not affected by the development status Merit of BB Rx part. own pace Able to identify in which bugs are caused, Easy to perform Merit RF Rx part or BB Rx part. fault isolation Real-time BER X Measured by simulation with a PC. BER measurement is performed in real time, Dev. efficiency which has ever taken extremely long time Merit is improved. due to simulation. MU860x20A/MX860x20A-E-I-1
10
Slide 20
MU860x20A/MX860x20A PRODUCT INTRODUCTION
Confidential
Specifications are subject to change without notice.
ANRITSU CORPORATION 1800 Onna, Atsugi-shi, Kanagawa, 243-8555 Japan Phone: +81-46-223-1111 Fax: +81-46-296-1264
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No.MU860x20A/MX860x20A-E-I-1-(2.00)
030617
Printed in Japan 2003-8 AGKD