Transcript
QED121/122/123 PLASTIC INFRARED LIGHT EMITTING DIODE PACKAGE DIMENSIONS 0.195 (4.95)
FEATURES • D= 880 nm REFERENCE SURFACE
• Chip material = AlGaAs
0.305 (7.75)
• Package type: T-1 3/4 (5mm lens diameter) • Matched Photosensor: QSD122/123/124 • Narrow Emission Angle, 18°
0.040 (1.02) NOM
• High Output Power
0.800 (20.3) MIN
• Package material and color: Clear, peach tinted, plastic 0.050 (1.25)
CATHODE 0.100 (2.54) NOM
1. Derate power dissipation linearly 2.67 mW/°C above 25°C. 2. RMA flux is recommended. 3. Methanol or isopropyl alcohols are recommended as cleaning agents. 4. Soldering iron 1/16” (1.6mm) minimum from housing.
0.240 (6.10) 0.215 (5.45)
NOTES:
0.020 (0.51) SQ. (2X)
SCHEMATIC
ANODE
1. Dimensions for all drawings are in inches (mm). 2. Tolerance of ± .010 (.25) on all non-nominal dimensions unless otherwise specified.
ABSOLUTE MAXIMUM RATINGS
CATHODE
(TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Unit
Operating Temperature
TOPR
-40 to +100
°C
Storage Temperature
TSTG
-40 to +100
°C
(Iron)(2,3,4)
Soldering Temperature
TSOL-I
240 for 5 sec
°C
Soldering Temperature (Flow)(2,3)
TSOL-F
260 for 10 sec
°C
Continuous Forward Current
IF
100
mA
Reverse Voltage
VR
5
V
PD
200
mW
Power
Dissipation(1)
ELECTRICAL / OPTICAL CHARACTERISTICS PARAMETER
(TA =25°C)
TEST CONDITIONS
SYMBOL
MIN
TYP
Peak Emission Wavelength
IF = 20 mA
Emission Angle
IF = 100 mA
Forward Voltage Reverse Current
DPE
—
880
—
nm
0
—
±9
—
Deg.
IF = 100 mA, tp = 20 ms
VF
—
—
1.7
V
VR = 5 V
IR
—
—
10
µA
Radiant Intensity QED121
IF = 100 mA, tp = 20 ms
IE
16
—
40
mW/sr
Radiant Intensity QED122
IF = 100 mA, tp = 20 ms
IE
32
—
100
mW/sr
Radiant Intensity QED123
IF = 100 mA, tp = 20 ms
IE
50
—
—
mW/sr
tr
—
800
—
ns
tf
—
800
—
ns
Rise Time Fall Time
IF = 100 mA
2001 Fairchild Semiconductor Corporation DS300336 4/19/01
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MAX
UNITS
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QED121/122/123 PLASTIC INFRARED LIGHT EMITTING DIODE TYPICAL PERFORMANCE CURVES
NORMALIZED COLLECTOR CURRENT
NORMALIZED RADIANT INTENSITY
10 Normalized to: IF= 100 mA, TA = 25˚C Pulse Width = 100 µs 1
0.1
0.01
0.001 1
10
100
1 Normalized to: Pulse Width = 100 µs Duty Cycle = 0.1% VCC = 5 V RL = 100 1 TA = 25˚C
IF = 100 mA
0.8
0.6 IF = 20 mA
0.4
0.2
0
1000
0
1
IF - INPUT CURRENT (mA)
2
3
4
5
6
LENS TIP SEPERATION (INCHES)
Fig. 1 Normalized Radiant Intensity vs. Input Current
Fig. 2 Coupling Characteristics of QED12X and QSD12X
NORMALIZED RADIANT INTENSITY
1.0
VF - FORWARD VOLTAGE (V)
2.5 IF = 100 mA
IF = 50 mA 2
1.5
1
IF = 10 mA
0.5
IF = 20 mA
Pulse Width = 100 µs Duty Cycle = 0.1%
0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1
0 -40
-30
-20
-10
0
10
20
30
40
50
60
70
80
775
90 100
800
825
850
TA - TEMPERATURE (˚C)
875
900
925
950
D (nm)
Fig. 3 Forward Voltage vs. Temperature
Fig. 4 Normalized Radiant Intensity vs. Wavelength
Fig. 5 Radiation Pattern 20
10
0˚
-10
-20
30
-30
40
-40
50
-50
60
-60
70
-70
80
-80
90
-90 100
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80
60
40
20
0
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20
40
60
80
100
4/19/01
DS300336
QED121/122/123 PLASTIC INFRARED LIGHT EMITTING DIODE DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body,or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in labeling, can be reasonably expected to result in a significant injury of the user.
DS300336
4/19/01
2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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