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Sws16102

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Product Bulletin SWS15100/16100 Swept Wavelength Systems Applications The swept wavelength system is the solution for characterizing the wavelength dependence of passive optical components. The SWS is available in two wavelength ranges: the SWS15100 system scans the Cband from 1520-1570 nm and the SWS16100 offers extended L-band coverage from 1541-1630 nm. Both systems provide a very high wavelength accuracy of ± 3 pm (± 0.003 nm) and a speed considerably faster than a broadband source/OSA or a tunable laser source/power meter system. The SWS can completely characterize the insertion loss of a 40-channel DWDM in less than 90 seconds. Where full coverage of the C and L-bands in a single trace is desired, the signals from the transmitters can be combined with an optional dual band selector switch located in the receiver. The standard SWS package consists of; a tunable laser source and source optics module in a transmitter cabinet, receiver chassis, a parallel port connector or optional data acquisition board, application software, and a user-supplied computer. The tunable laser provides a narrow line width source in the wavelength range of interest. The source optics module performs real-time wavelength measurements and transmits them to the receiver. At the receiver, a portion of the light is sent to a reference detector while the rest is sent to the device under test (DUT). This process provides an accurate ratio measurement. One of the essential benefits of the SWS is the ability to simultaneously test multiple outputs of a component. As the number of outputs increases, the test time per component decreases significantly compared to more conventional measurement techniques. Each receiver comes standard with one control module and a dual detector module. With additional chassis and detector modules, up to 128 channels can be tested simultaneously. A single transmitter unit can support nominally four independent receiver stations. As the SWS is a modular system with a distributed architecture, only a single optical fiber is needed to connect the transmitter to each receiver. Key Features & Benefits · · · · · · · · · Absolute wavelength accuracy ± 3 pm Simultaneous testing of multiple outputs of a component Compared to more conventional measurement techniques, reduction in test time per component becomes significant as the number of outputs increases Up to 128 channels can be tested at the same time, resulting in significant reduction in test instrument costs Distributed architecture, a single tunable laser source serves multiple receivers Intuitive and powerful graphical user interface Integrated tunable laser source 24/7 service and support CE compliant Can be used in both research and development and manufacturing settings to test a full range of devices: · · · · · · · · DWDM demultiplexers Bandpass filters Fiber Bragg gratings Isolators Switches Attenuators Broadband couplers/splitters Interleavers Parameters Measured: Polarization dependent loss (PDL) (using optional controller) Insertion loss (IL) Bandwidth Center wavelength Parameters from Analysis: Passband Crosstalk Flatness Isolation · · · · · · · · Safety Information LabVIEW is a registered trademark of National Instruments Corporation. National Instruments is a trademark of National Instruments. ST is a registered trademark of Lucent Technologies. Visual Basic is a registered trademark of Microsoft Corporation. Optical Component Environmental Test System | 2 Swept Wavelength System Components PDL Controller (optional) The SWS15104 four-state polarization controller allows for the PDL and average loss to be measured quickly as a function of wavelength. The Mueller matrix method is used, whereby PDL is determined by measuring the IL of the input light for four specific polarization states. The four states consist of three linear polarizations at 0, 90, and - 45°, and one circular polarization of the input light. The controller takes one IL measurement at each of the four polarization states, then the SWS software calculates PDL using this input. The measurable PDL range is 0-5 dB. SWS Software w ith 16-Channel Demux Version 3.0 Software (standard with system) The latest version of the software introduces considerable upgrades in terms of program usability, flexibility, and robustness. The software is designed to work seamlessly with the dual band selector switch (optional) for combining C and L-band traces, and is backward-compatible with the data acquired with earlier software versions. File handling and data presentation tools are flexible. Analytical tools enable the user to specify bandwidth, passband, crosstalk, and flatness parameters for up to 128 channels simultaneously. Compact Receiver If custom applications are required, the software is packaged with welldocumented dynamic link libraries (DLLs) that integrate with your LabVIEW, C/C++, or Visual Basic application. Interface Options The SWS receiver is delivered with a parallel printer port interface to connect with the user's computer. As an option, a fast parallel port interface with a National Instruments data acquisition card is available. Compact Receiver (optional) To save cost and space on your desktop, a smaller version of the receiver is available. The compact receiver has two detector channels built into a mini-chassis. User Manual The user manual is supplied with the software on CD-ROM and as a hard copy. System Setup with L and C-band Transmitters and Dual Band Selector Switch Optical Component Environmental Test System | 3 Specifications PARAMETER SPECIFICATION SWS WITHOUT POLARIZATION CONTROLLER Simultaneous channels up to 128 Scan range 1520-1570 nm (C-band), 1541-1630 nm (L-band) Scan time 6 s + 1 s/channel (C-band), 8 s + 2 s/channel (L-band) for optional data acquisition card 6 s + 1.5 s/channel (C-band), 8 s + 3 s/channel (L-band) for parallel port interface Slope accuracy 10 dB/pm (0-30 dB) Wavelength resolution 0.003 nm Absolute wavelength accuracy ± 0.003 nm Dynamic range of loss measurements > 50 dB (> - 15 dBm input to device) Loss measurement accuracy (25 ± 5 °C, - 15 dBm input device) ± 0.1 dB (0 to < 20 dB) ± 0.2 dB (20 to < 40 dB) ± 0.3 dB (40 to < 50 dB) Dimensions ( W x H x D) source optics module 48.26 x 13.26 x 35.56 cm tunable laser source 48.26 x 13.34 x 43.18 cm receiver chassis 1 48.26 x 13.26 x 42.24 cm transmitter cabinet 55.5 x 73.7 x 68.6 cm compact receiver 21.2 x 8.9 x 35.5 cm Operating temperature 15-30 °C Storage temperature - 40-70 °C Humidity maximum 80 % RH from 10-35 °C SWS WITH POLARIZATION CONTROLLER AVERAGE LOSS MEASUREMENTS Loss measurement resolution 0.01 dB Accuracy 2 (device loss) 0 to < 10 dB ± 0.10 dB 10 to < 20 dB ± 0.15 dB 20 to < 30 dB ± 0.20 dB 30 to < 40 dB ± 0.25 dB Repeatability 3 ± 0.03 nm Dynamic range of loss > 45 dB (> - 20 dBm input to DUT ) Return loss > 40 dB PDL MEASUREMENTS Accuracy 3 (device loss) 0 to < 10 dB ± 0.05 dB 10 to < 20 dB ± 0.10 dB 20 to < 30 dB ± 0.20 dB 30 to < 45 dB ± 0.50 dB Accuracy with 13 point smoothing and four averages3 0 to < 10 dB ± 0.02 dB 10 to < 20 dB ± 0.04 dB 20 to < 30 dB ± 0.05 dB 30 to < 45 dB ± 0.06 dB PDL resolution ± 0.01 dB PDL range 0-5 dB Dimensions ( W x H x D) controller 21.2 x 8.9 x 35.5 cm 1. 2. 3. Allow 10 cm front and 8 cm rear clearance. At 25 ± 5 °C, > - 20 dBm input to DUT. Repeatability refers to measuring changes in PDL or average loss without disconnecting the test component or moving fibers. Optical Component Environmental Test System | 4 Ordering Information For more information on this or other products and their availability, contact your local JDS Uniphase sales representative or JDS Uniphase directly. Sample System: SWS15100+C4 SWS +C CODE SYSTEM T YPE CODE 151 161 C-band L-band 1 2 4 N SYSTEM T YPE 01 One output Two outputs Four outputs Not applicable for system add-ons CODE SYSTEM 00 Basic complete system CODE SYSTEM ADD - ONS Tunable laser source Dual waveband selector switch module (C-band to L-band switching) Four-state polarization controller Receiver control module (C and L-bands) Receiver detector module with two channels (C and L-bands) Two-channel receiver with software (C and L-bands) Calibration kit, including acetylene cell and HA9 Attenuator (C-band only) Compact two-channel receiver (C and L-bands) Parallel port converter Calibration kit, including gas cell and HA9 attenuator (L-band only) L-band gas cell (for customer wavelength calibration) 01 03 04 06 07 10 13 15 16 17 18 Optional Accessories Part Numbers A0103979 AC100 AC101 AC102 AC103 AC115 AC118 AC120 AC121 J-FAFP-B-001 J-FASP-B-001 J-FASC-B-001 J-FASU-B-001 OWB10001 OWB10002 Description Data acquisition card Detector cap FC detector adapter ST detector adapter SC detector adapter E2000 detector adapter LC detector adapter Magnetic detector adapter Bare fiber holder (requires AC120) FC/APC to FC/PC jumper cable, 1 m FC/APC to ST/PC jumper cable, 1 m FC/APC to SC/PC jumper cable, 1 m FC/APC to SC/APC jumper cable, 1 m Transmitter cabinet for the transmitter unit Receiver chassis JDS Uniphase Corporation 570 West Hunt Club Road Nepean (Ottawa), Ontario K2G 5W8 Canada Tel 613 727-1303 Fax 613 727-8284 [email protected] www.jdsuniphase.com All information contained herein is believed to be accurate and is subject to change without notice. No responsibility is assumed for its use. JDS Uniphase Corporation, its subsidiaries and affiliates, or manufacturer, reserve the right to make changes, without notice, to product design, product components, and product manufacturing methods. Some specific combinations of options may not be available. Please contact JDS Uniphase for more information. ©JDS Uniphase Corporation. All rights reserved. MKT-DS-0131 Rev. 500 01/03/01