Transistor Current - Radiant Technologies, Inc.

Transcript

Radiant Technologies, Inc. 2835D Pan American Freeway NE Albuquerque, NM 87107 Tel: 505-842-8007 Fax: 505-842-0366 e-mail: [email protected] Table of Contents TABLE OF FIGURES .................................................................................................... III A - DISCUSSION ...............................................................................................................1 B - MAIN CONFIGURATION.........................................................................................5 B.1 - Setup Dialog ............................................................................................................... 5 B.2 - Description ................................................................................................................. 6 B.3 - Controls ...................................................................................................................... 7 B.4 - 48-Channel Multiplexer Configuration .................................................................... 10 B.5 - Controls .................................................................................................................... 10 B.6 - Mux Loop Adjust Dialog ......................................................................................... 11 B.7 - Description ............................................................................................................... 12 B.8 - Controls .................................................................................................................... 12 B.9 - Parameter Adjustment Dialog .................................................................................. 13 B.10 – Discussion .............................................................................................................. 13 B.11 - Controls .................................................................................................................. 14 B.12 – Amplifier Selection ................................................................................................ 17 B.13 - Sample Identifying Information ............................................................................. 18 B.14 - Controls .................................................................................................................. 18 B.15 - Sensor Configuration .............................................................................................. 19 C – QUIKLOOK SETUP ................................................................................................21 C.1 - Setup Dialog ............................................................................................................. 21 C.2 - Discussion ................................................................................................................ 22 C.3 - Controls .................................................................................................................... 23 C.4 – 48-Channel Multiplexer Configuration ................................................................... 26 C.5 - Controls .................................................................................................................... 26 C.6 - Amplifier Selection .................................................................................................. 27 C.7 – Controls.................................................................................................................... 27 C.8 - Sample Identifying Information ............................................................................... 28 I VII.D.12 - i – Transistor Current Last Update – 7/27/10 C.9 - Controls .................................................................................................................... 28 C.10 – Sensor Configuration ............................................................................................. 29 C.11 – Controls.................................................................................................................. 29 D - QUIKLOOK PLOT CONFIGURATION ...............................................................31 D.1 - Setup Dialog ............................................................................................................. 31 D.2 - Discussion ................................................................................................................ 31 D.3 - Controls .................................................................................................................... 32 E - RESULTS AND DATA PRESENTATION .............................................................33 E.1 – Transistor Current Execution ................................................................................... 33 E.2 – Sensor Data .............................................................................................................. 38 E.3 - Create a DataSet ....................................................................................................... 40 E.4 – Administrative Information ..................................................................................... 42 E.5 - Archive Regraph ....................................................................................................... 42 E.6 – Exporting.................................................................................................................. 47 E.7 – Controls .................................................................................................................... 49 E.8 - Discussion................................................................................................................. 50 F – USER VARIABLES ..................................................................................................60 G - CHANGE AND VERSION RECORD ....................................................................61 II VII.D.12 - i – Transistor Current Last Update – 7/27/10 Table of Figures Figure A.1 - Transistor Current Hardware Configuration and Sample Connection. ........ 2 Figure A.2 - Transistor Current Test Stimulus and Measurement Profile. ....................... 2 Figure B.1.1 - Transistor Current Task Main Configuration Dialog. ............................... 5 Figure B.1.2 - Transistor Task Main Configuration Dialog w/Vision Data File Input. ... 6 Figure B.4.1 - 48-Channel Multiplexer Configuration Subdialog. ................................. 10 Figure B.6.1 - Configure the Multiplexer for Adjustment in a Branch Loop. ................ 11 Figure B.9.1 – Transistor Current Parameter Branch Loop Adjustment Configuration Dialog. .................................................................................................................. 13 Figure B.12.1 - Internal Amplifier Selection or External Amplifier Configuration. ...... 17 Figure B.13.1 - Sample Documentation Subdialog. ....................................................... 18 Figure B.15.1 - Sensor Configuration Subdialog. ............................................................ 19 Figure C.1.1 - Transistor Current Task QuikLook Configuration Main Dialog Tab. .... 21 Figure C.1.2 - Transistor Current Task QuikLook Configuration Main Dialog Tab w/Vision Data File. .............................................................................................. 22 Figure C.4.1 - 8-Channel Multiplexer Configuration Subdialog. ................................... 26 Figure C.6.1 - Internal Amplifier Selection or External Amplifier Configuration. ........ 27 Figure C.8.1 - Sample Documentation Subdialog. ......................................................... 28 Figure C.10.1 - Sensor Configuration Subdialog. .......................................................... 29 Figure D.1.1 - Transistor Current Task QuikLook Plot Configuration Tab. .................. 31 Figure E.1.1 - Transistor Current Measurement Data Displayed in a QuikLook Results Dialog. .................................................................................................................. 34 Figure E.1.2 - Error Report Indicators and Detailed Error Report Subdialog. ............... 36 Figure E.1.3 - Tabbed View Tab 1 - Plotted Data and Error Reporting. ........................ 37 Figure E.1.4 - Tabbed View Tab 2 - Configuration and Data Parameters. .................... 38 Figure E.2.1 - Transistor Current Data w/Sensor Enabled. ............................................ 39 Figure E.3.1 - DataSet Selection Dialog for DataSet Storage of QuikLook data. .......... 40 Figure E.3.2 - Standard DataSet Creation Dialog. .......................................................... 41 Figure E.3.3 - CTD Rename Dialog. .............................................................................. 41 Figure E.3.4 - New DataSet Created from the QuikLook Execution. ............................ 42 Figure E.4.1 - Administrative Information Subdialog. ................................................... 42 Figure E.5.1 - Recovering the Transistor Current Task from the DataSet Archive. ...... 43 Figure E.5.2 - Transistor Current Task Configuration Dialog Recalled from a DataSet Archive. ................................................................................................................ 44 Figure E.5.3 - Transistor Current Task Plot Configuration Dialog for Archived Data. . 45 Figure E.5.4 - Transistor Current Task Data Recalled from a DataSet Archive. ........... 46 Figure E.5.5 - Tabbed Data Recalled from a DataSet Archive. ...................................... 47 Figure E.6.1 - Export Configuration Dialog. .................................................................. 48 Figure E.6.2 - Standard Windows File Browser Dialog. ................................................ 49 Figure E.8.1 - Export Configuration Dialog - Printer Option. ........................................ 51 Figure E.8.2 - Standard Windows Printer Configuration Dialog. .................................. 51 Figure E.8.3 - Sample Transistor Current Task Text Export File - Upper Portion. ....... 52 Figure E.8.4 - Sample Transistor Current Task Text Export File - Lower Portion. ....... 53 Figure E.8.5 - Sample Transistor Current Task Excel Export Output - Upper Portion. . 54 III VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.6 - Sample Transistor Current Task Excel Export Output - Lower Portion. 55 Figure E.8.7 - Sample Transistor Current Task Word Export Output - Upper Portion. . 56 Figure E.8.8 - Sample Transistor Current Task Word Export Output - Lower Portion. 57 Figure E.8.9 – Utility of the Vision Data File. ............................................................... 59 IV VII.D.12 - i – Transistor Current Last Update – 7/27/10 Radiant Technologies, Inc. 2835D Pan American Freeway NE Albuquerque, NM 87107 Tel: 505-842-8007 Fax: 505-842-0366 e-mail: [email protected] A - Discussion NOTE: The Transistor Current Task is a member of a suite of three Vision Transistor Tasks - including Transistor Current, Transistor I/V and Transistor Curve Trace - that are provided as a unit at additional cost. The Task suite is distributed freely to all users of Vision and all users may review the Task configuration and recover Task data. However, the Task suite must be purchased in order to make measurements with any of the Tasks. The user who purchases the Task suite will receive an additional distribution disk that will install a file named Security.Sec into the file path C:\Program Files\Radiant Technologies\Vision\System. That file is keyed to a code written into the tester EEPROM and also keyed to the Transistor Task Suite. The Task suite must be operated with the tester for which the Tasks were purchased. The Security.sec file must be present, and the tester must be powered, for any of the Transistor Tasks to make measurements. The Security.sec file, along with all Vision installations, may be moved to any computer. However, the Security.sec file is not transferrable to users of other testers. NOTE: The Transistor Current Tasks is available only for the Precision Premier II, Precision PMF and the Precision LC II (when it is available) testers. The Task makes use of a second voltage source, provided by an I2C Digital-to-Analog Converter (DAC), that is connected to the I2C port at the rear of the tester. The I2C port is only available on the specified testers. The I2C DAC device is manufactured by Radiant Technologies, Inc. and is provided with the purchase of the Transistor Task Suite. The Transistor Current Task is a Vision Measurement Task that samples the steady state current through the test element connected to the Precision tester. Sampling is done by placing a constant DC DRIVE port bias voltage to the transistor gate. (V DRIVE = VGS). A second constant voltage is provided by the I2C DAC to the transistor drain (VI2C = VDS). The transistor source is connected to the tester RETURN port at which the current through the transistor induced by the VGS and VDS voltages is sampled. The test configuration is shown in Figure A.1. The figure shows the DRIVE (Vgs) and RETURN signals connected to the tester rear panel. These signals can also be connected to the tester front panel. A programmable delay or "Soak" period passes before the measurement begins. This is intended to allow any currents induced by the application of the voltages to settle so that the sample is in steady state. After the delay period, a measurement period begins in which the current through the device under test is regularly sampled and recorded. The duration of this period is user-programmable. The profile is shown in Figure A.2. 1 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure A.1 - Transistor Current Hardware Configuration and Sample Connection. Figure A.2 - Transistor Current Test Stimulus and Measurement Profile. 2 VII.D.12 - i – Transistor Current Last Update – 7/27/10 The current is sampled as frequently as possible during the Measurement Time. Sampling is restricted by the duration of the measurement and is adjusted to be the maximum number of possible points given minimum and maximum per-point sample times and the maximum number of possible points. Only the final 90% of the measurement is plotted during QuikLook Measurement or Archive Regraph. This is to allow noise introduced by the physical closing of the measuring integrator to dampen before data are displayed. The Current, in Amps, through the device under test is measured directly by the Precision circuitry. Two other parameters - Resistance () and Resistivity (•cm) are derived simply from the Current measurement. These are given by: Resistance () = DC Volts / Current (Amps) (A.1) and Resistivity (•cm) = (Resistance () x Area (cm2)) / (Thickness (µm) / 10000 (µm/cm)) (A.2) The main parameters specified by the user to configure the Transistor Current Task are the DRIVE Vgs, the I2C Vds, the Soak Time (ms) and the Measurement Time (ms). If the Task is programmed into a Branch Look, each of these values can be independently adjusted from loop iteration-to-iteration to provide a family of related experiments. In this case, the initially-specified values are used to configure the first measurement and are used as a baseline from which to compute the values of subsequent executions of the Task. After the first measurement, subsequent parameter values are computed either by incrementing the previous value by a constant increment or scaling the previous value by a constant scale factor. Increments may take on any value and may be negative, while scale factors may be fractional so that the parameter is reduced over time as looping continues. The voltage scale factor may also be negative, in which case Vgs and/or Vds will alternate between positive and negative as its magnitude is scaled from instance-toinstance. Soak Time and Measurement Time scale factors must be strictly greater than zero. In the example shown in the table, all Vgs, Soak Time and Measurement Time parameters start with their default values: Vgs voltage is 5.0 Volts, and Soak and Measurement Times are both 1000.0 ms. The voltage is adjusted by scaling by -1.1 at each iteration. Soak Time is incremented by 93.2 ms each iteration and Measurement Time is scaled by 0.78. The example shows the conditions for the first six iterations. Parameter Vgs Soak Time (ms) Measurement Time (ms) Loop 1 5.0 1000.0 1000.0 Loop 2 -5.5 1093.2 780.0 Loop 3 6.05 1186.4 608.4 Loop 4 -6.755 1279.6 474.552 Loop 5 7.321 1372.8 370.1506 Loop 6 -8.053 1466.0 288.7174 Note that extreme care must be taken by the researcher when programming Branch Loop adjustment. It must be ensured that, for all parameters, the combination of initial parameter value, parameter adjustment value and possible number of Branch Loops will not combine to produce, over time, any parameter value that lies outside of the capabilities of the hardware as it is configured. For example a Vgs value that come to exceed a magni3 VII.D.12 - i – Transistor Current Last Update – 7/27/10 tude of ±200.0 Volts when no external High Voltage Amplifier (HVA) or High Voltage Interface (HVI) is available is an error condition. Note that as of Version 4.0.0 an internal reference ferroelectric sample has been added to the Precision Premier II tester and is planned in the Precision LC II tester. The ferroelectric test element includes two switchable capacitors in a single package inserted into a user-accessible connector. A variety of capacitors are available from Radiant Technologies, Inc. and this test element may be easily changed to adjust the type or to replace fatigued samples. Just as with the internal reference capacitor and resistor, the ferroelectric test sample may be switched into the test signal path in parallel with any externallyconnected test sample and/or the internal reference capacitor and/or resistor. More information is available in the Version 4.0.0 What's New page. 4 VII.D.12 - i – Transistor Current Last Update – 7/27/10 B - Main Configuration Task Name: Version: Last Update: In QuikLook Menu: Folder: Subfolder: Subsubfolder: Window Name: Change Record: Known Bugs: User Variables Added: Transistor Current 4.5.0 30 June 10 Yes Hardware Measurement Transistor Transistor Current Task Setup Go to Change Record None Go To User VariablesUser Variables B.1 - Setup Dialog Figure B.1.1 - Transistor Current Task Main Configuration Dialog. 5 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure B.1.2 - Transistor Task Main Configuration Dialog w/Vision Data File Input. B.2 - Description The Transistor Current Task configuration dialog, setup as in the example on the Discussion page, is shown Figure B.1.1. The dialog is used to configure the Task for inclusion into a Test Definition and execution within a DataSet. The upper portion of the dialog is used to specify the the two DC Bias voltages - the Gate-Source (Vgs) voltage provided by the tester DRIVE port and the Drain-Source (Vds) voltage generate by the RTI Digital-toAnalog Converter (DAC) connected to the tester's I2C port. Also unique to the Transistor Current Task are the Soak Time (ms) and the Measure Time (ms). The remaining controls are common to the configuration of all Measurement Tasks. Internal Reference Element refer to various samples, internal to the tester, that may be switched into the signal path and measured in parallel to each other and to any sample attached to the tester DRIVE and RETURN ports. A 1.0 nF linear internal reference capacitor and a 2.5 M internal reference resistor are available to all testers except the RT66B. A selectable pair of internal reference ferroelectric elements may be switched in, individually or together, if the customer is using a Precision Premier II or Precision LC II tester. 6 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Amp Level, Start with Last Amp Level and Auto Amp refer to the software switching options when setting the RETURN signal transimpedence amplifier that adjusts the signal level to one appropriate for measurement. With Auto Amp unchecked, Amp Level is enabled and the user may select the amplification level to be used. In this case the measurement is made exactly once, and the data are returned whether or not the correct amplification level is returned. With Auto Amp checked, the driver will start either at the amplification level selected in Amp Level (if Start with Last Amp Level is unchecked) or at the last determined amplification level (if Start with Amp Level is checked). After the first measurement, the RETURN signal level is evaluated and the data may be returned if the level is appropriate. Otherwise the amplification level will be increased or decreased as appropriate and the measurement repeated and the signal reevaluated. The measurement-evaluation cycle will be repeated until an appropriate amplification level is reached or the driver determines that it is incapable of making the measurement. In these cases, all data are discarded except for the final, valid measurement. Set Sample Info, Set Multiplexer, Set Sensor, Set Adjust Parameters and Set Amplifier are buttons that open subdialogs whose functions are described in detail below. Read Data From Vision File is normally unchecked. When checked, most controls are disabled and Browse to File and File Name become visible (Figure B.1.2). In this case, Browse to File is used to navigate to a Vision Data File (VDF), exported by a previous execution of the Transistor Current Task. Once identified, the file path and file name are shown in the read-only File Name control. On Task execution, the specified file will be opened and the data read rather than having the Task make a new measurement. The Task configuration values are read from the file, and so the controls are disabled. If Respond to Nesting Branch Reset is checked it will cause the Task to reset any parameters that are being adjusted in a Branch Loop to be reset to their initial programmed state if the "Nesting Branch Task: Reset" User Variable is set to "true". This allows the Nesting Branch Task to be used in a resourceful way as discussed in the Nesting Branch Task Tutorial under the main Vision help pages. B.3 - Controls Control Task Name Type Default Description Text “Trans Cur.- This serves as a root identifier for this instance of the Transistor #” Current Task. The Task will be identified with this value in the Editor and the Current Test Definition (CTD). Executed Tasks will be displayed and stored with this name with a „.‟ and an execution number appended to it. Each new instance of a Transistor Current Task within the Editor should have a unique Task Name assigned. 30-character limit. DRIVE Volts Real 4.0 The DC Bias to be applied to the tester's DRIVE port and to the (Vgs) samples gate electrode during the first Task instance. This also serves as a base from which to derive subsequent execution values when the Task is programmed into a Branch Loop and V gs is programmed for Branch Loop adjustment. I2C Volts (Vds) Real 1.0 The DC Bias to be applied to the by the RTI DAC connected to the 7 VII.D.12 - i – Transistor Current Last Update – 7/27/10 I2C Address Soak Time Integer Real 1 1000.0 Measure Time Real 1000.0 Sample Area Real 0.0001 Sample Thick- Real ness Set Sample Info Button Set Multiplexer Button Adjust Mux in a Check Loop Box Set Sensor Button Sensor Enable Check Box Set Adjust Pa- Button rams Adjust Parame- Check ters in a Loop Box Set Amplifier Button Amplifier Text 0.3 I2C port and to the samples drain electrode during the first Task instance. This also serves as a base from which to derive subsequent execution values when the Task is programmed into a Branch Loop and Vds is programmed for Branch Loop adjustment. The I2C Address that has been assigned to the RTI DAC. In milliseconds. The initial duration for which V gs and Vds are to be applied before current sampling begins during the first Task instance. This also serves as a base from which to derive subsequent execution values when the Task is programmed into a Branch Loop and Soak Time is programmed for Branch Loop adjustment. In milliseconds. The initial duration for during which the sample current is measured during the first Task instance. This also serves as a base from which to derive subsequent execution values when the Task is programmed into a Branch Loop and Measure Time is programmed for Branch Loop adjustment. In cm2. The surface area of the ferroelectric sample electrode. This value is used in calculating the measured Polarization. In µm. The depth of the ferroelectric material in the sample. Unpressed This button opens a subdialog that allows the Sample under test to be described. Unpressed Clicking this button opens a subdialog that allows DRIVE and RETURN signal multiplexer channels and ports to be specified for one or two attached 48-channel multiplexers. This is discussed in detail below. If Branch Loop adjustment is enabled in the subdialog, Adjust Mux in a Loop will be checked when the dialog is closed. Otherwise it will be unchecked. Unchecked Boolean - This control is disabled and is an indicator only - Indicates that, if the Transistor Current Task is programmed into a Branch Loop, a new set of multiplexer channels and ports is to be used for the DRIVE and RETURN signals at each iteration. The status of this box is set by configuring Branch Loop Mux adjustment by clicking the Set Adjust Mux control in the Set Multiplexer subdialog. Unpressed This button opens a subdialog in which the signal-capture of the Sensor port can be enabled and configured or disabled. The status of the Sensor port is reflected in the Sensor Enable control. Unchecked Boolean - This control is disabled and is an indicator only - Indicates if the capture of the Sensor port signal is enabled (control is checked) or disabled (control is unchecked). Unpressed This button opens a subdialog in which the adjustment of V gs, Vds, Soak Time and/or Measurement Time can be enabled and configured or disabled. If any of these are enabled, Adjust Parameters in a Loop will be checked. Otherwise the control will be unchecked. Unchecked Boolean - This control is disabled and is an indicator only - Indicates if the Branch Loop adjustment of V gs, and/or Vds and/or Soak Time and/or Measurement Time is enabled (control is checked) or disabled (control is unchecked). Unpressed This button opens a subdialog in which the sample drive signal can be switched from low voltage ("Internal") to high voltage ("High Voltage") or back. The subdialog allows the user to identify the tester port and High Voltage Interface channel to which the signal will be directed. The selected amplifier is indicated in the Amplifier control. "Internal" Read-Only. This indicator shows if the measurement is low voltage 8 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Enable Ref. Cap Enable Ref. Resistor Boolean Unchecked Enable Ref. Boolean Unchecked Ferroelectric Cap A Enable Boolean Unchecked Cap B Enable Auto Amplifica- Boolean tion True Start with Last Check Amp Level Box Amp Level List Checked Internal Amplifier Read Data from Check Unchecked Vision File Box File Name Text “” Browse to File Button Unpressed Respond to Check Nesting Branch Box Reset Checked ("Internal") or high voltage ("High Voltage"). It is adjusted by opening the amplifier subdialog using Set Amplifier. Two independently switchable internal test sample of known value are built into the Precision tester. These are arranged in parallel and may be switched into the drive/return test loop in any order. If a sample is attached to the external DRIVE and RETURN BNCs these will be added in parallel to the sample. A third internal reference (ferroelectric) sample has been added to the Precision Premier II tester and is planned in the Precision LC II tester. The ferroelectric test element includes two switchable capacitors in a single package inserted into a user-accessible connector. A variety of capacitors are available from Radiant Technologies, Inc. and this test element may be easily changed to adjust the type or to replace fatigued samples. Just as with the internal reference capacitor and resistor, the ferroelectric test sample may be switched into the test signal path in parallel with any externally-connected test sample and/or the internal reference capacitor and/or resistor. More information is available in the Version 4.0.0 What's New page. Checking this control enables Cap A Enable and Cap B Enable. Otherwise those controls are disabled. When the internal reference ferroelectric is selected, these controls are activated to allow the user to select the capacitor to be measured. Cap A, Cap B or both may be selected. When both are selected, the capacitors are measured in parallel. Both may also be disabled, though this has little practical value. Tells the tester to automatically adjust the sample RETURN signal gain to an acceptable level. This is done by repeatedly measuring the sample using the configured conditions and adjusting the gain. Selecting this control disables Amp. Level and enables Start with Last Amp Level. See the discussion under Description above. This control is disabled if Auto Amplification is not selected. If Auto Amplification is disabled, this control is used to select the amplification level to be used by the hardware to make the measurement. Checking this box indicates that the Transistor Current data are to be read from a Vision Data File, exported by a previous execution of the Transistor Current Task, and not taken by measuring a sample. Checking this box causes File Name and Browse to File to be shown. It also causes all controls except Task Name, Comments, Help, OK and Cancel/Plot to be disabled. This control is normally hidden. It is shown when Read Data From Vision File is checked. The control is a read-only indicator. It shows the file path and file name of the Vision Data File to be used to produce the Task's data on execution. This control is normally hidden. It is shown when Read Data From Vision File is checked. The button opens a standard Windows file browser dialog that is to be used to identify the name and location of the Vision Data File, exported by a previous Transistor Current Task execution, which will produce the Task's data on execution. Causes the Task to reset any parameters that are being adjusted in a Branch Loop to be reset to their initial programmed state if the "Nesting Branch Task: Reset" User Variable is set to "true". This allows the Nesting Branch Task to be used in a resourceful way as discussed in the Nesting Branch Task Tutorial under the main Vi- 9 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Comments Text Help OK Cancel Button Button Button sion help pages. A string of up to 511 characters to be written at the user‟s discretion. Intended to allow a detailed description of the design decision to include the Transistor Current Task. Unpressed Read this Help page. Unpressed Accept the configured Transistor Current values Unpressed Do not add the Transistor Current Task to the list in the Editor “” B.4 - 48-Channel Multiplexer Configuration With the release of Version 4.1.x, the 48-channel multiplexer Drive and Return Port and Channel controls have been moved to a subdialog to reduce clutter and confusion on the main dialog. The subdialog is accessed through the Set Multiplexer button on the main dialog. A Set Mux Adjust button on the subdialog opens a subsubdialog to configure the adjustment of Drive and Return Port and Channels settings in a Branch Loop as described in the next section. The status of Branch Loop adjustment is reflected in the readonly Adjust Mux in a Branch Loop check box on the subdialog. Set Mux Adjust is disabled in QuikLook. Figure B.4.1 - 48-Channel Multiplexer Configuration Subdialog. B.5 - Controls Name Type Drive/Return Integer Channel Default 0/0 Description 0-48. One or two 48-channel mulitplexers may be connected to the Precision tester using DB-25 connectors on the rear of the unit (limit one for the Precision LC). These accessories allow up to 95 samples (with a single common return) to be connected to the tester. These controls designate the channel to apply the drive signal to and to receive the return signal from. Values of 0 through 48 may be entered. A value of 0 indicates that no multiplexer is present or that it should not be selected. In this case, the signal will be routed through the normal BNC connector on the tester front panel. Setting a non-zero value in Drive Channel and/or Return Channel enables Drive Port and/or Return Port and sets the value in the control(s) to a default of 10 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Drive/Return Integer Port 0/0 Adjust Mux Button Adjust Mux in a Loop Check Unchecked Box Help OK Cancel Button Button Button Unpressed Unpressed Unpressed Unpressed '1'. Setting '0' in Drive Channel and/or Return Channel disables Drive Port and/or Return Port and sets the value in the control(s) to a default of '0'. 0-2 (0-1 for the Precision LC tester). The DB-25 connector on the rear of the Precision Tester to which is connected the multiplexer to be used for the Drive/Return Signal. These controls are disabled and forced to a value of '0' if the Drive/Return Channel controls are set to '0'. Otherwise they will be enabled and initially set to a default value of '1'. A value of '0' in this control indicates that no multiplexer is to be used. Clicking this button opens a subdialog that allows Drive and Return signal multiplexer channels and ports to be specified for each iteration, up to fifteen iterations, in a Branch Loop. This is discussed in detail below. If Branch Loop adjustment is enabled, Adjust Mux in a Loop will be checked when the dialog is closed. Otherwise it will be unchecked. This control is disabled and used solely to indicate if the Task is configured to adjust multiplexer signal channels and ports in a Branch Loop. Read this Help page. Accept the configured 48-channel multiplexer configuration. Close the dialog. Make no changes to the 48-channel multiplexer configuration. B.6 - Mux Loop Adjust Dialog Figure B.6.1 - Configure the Multiplexer for Adjustment in a Branch Loop. 11 VII.D.12 - i – Transistor Current Last Update – 7/27/10 B.7 - Description Note that this dialog is inaccessible in QuikLook. Clicking the Set Mux Adjust control opens the subdialog of Figure B.6.1 that allows the C/V Task to change the Multiplexer channels provided it is located within a Branch Loop. This, in turn, allows multiple capacitors to be fully measured automatically without reconfiguring the program or adjusting hardware. When the control is clicked, the dialog in the Figure above appears, Allowing up to fifteen loop cycles to be independently programmed. (Loop cycles exceeding fifteen will repeat the channel sequencing.). In the example samples 1 through 4 have their Drive Signal Connected to a common mux attached to DB-25 port 1. Sample 5 is connected to a separate multiplexer attached to Port 2. Return signals for samples 1, 2 and 5 are common and connected to the same channel (2) of the mux at port 1. Samples 3 and 4 also have common return signals connected to channel 2 of the second multiplexer at port 2. B.8 - Controls Name Loop Count Type Integer Default 0 Description 0-15. Indicates the number of unique Drive and Return Channel and Port sequences to be iterated. The value entered here enables or disables the Drive Channel n, Drive Port n, Return Channel n and Return Port n controls depending on n and the Loop Count selected. Drive Integer 0 The Drive Channel on the multiplexer to be enabled when the Branch Channel n Loop iteration mod n = 0. This control is disabled unless Loop Count >= n. Drive Port Integer 0 The DB-25 connector on the rear of the Precision tester to which the n multiplexer is connected whose channel is to be attached to the Drive Signal when the Branch Loop iteration mod n = 0. This control is disabled unless Loop Count >= n. Return Integer 0 The Return Channel on the multiplexer to be enabled when the Branch Channel n Loop iteration mod n = 0. This control is disabled unless Loop Count >= n. Return Integer 0 The DB-25 connector on the rear of the Precision tester to which the Port n multiplexer is connected whose channel is to be attached to the Return Signal when the Branch Loop iteration mod n = 0. This control is disabled unless Loop Count >= n. Help Button Unpressed Call up a dialog-specific help page. Okay Button Unpressed Accept the programmed values and enable the Branch Loop update. Cancel Button Unpressed Close the dialog and disable the Branch Loop update. 12 VII.D.12 - i – Transistor Current Last Update – 7/27/10 B.9 - Parameter Adjustment Dialog Figure B.9.1 – Transistor Current Parameter Branch Loop Adjustment Configuration Dialog. B.10 – Discussion The figure above shows the subdialog that appears when Adjust Parameters in a Loop is clicked. This dialog is used to independently configure the adjustment of DRIVE Volts (Vgs), I2C DAC Volts (Vds), Soak Time (ms) and Measurement Time (ms) for any of the enabled pulses when the Task is programmed into a Branch Loop. When a particular parameter for a particular pulse is selected for adjustment, Adjust by Scaling and Adjust by Incrementing controls are enabled for that parameter. Selecting either of these deselects the other and enables the edit box control associated with the adjustment type. Parameters are adjusted from Branch Loop iteration-to-iteration by either scaling the previous value by a constant scale factor or incrementing the previous value by a constant increment to arrive at the value to be applied in the current Task instance. If Respond to Nesting Branch Reset is selected on the main dialog, these four defining values will be reset to their initial condition when the "Nesting Branch Task: Reset" User Variable is "true". 13 VII.D.12 - i – Transistor Current Last Update – 7/27/10 B.11 - Controls Name Loop DRIVE Volts (Vgs) Adjust: Adjust Volts Type Check Box Default Unchecked Loop DRIVE Volts (Vgs) Adjust: Adjust by Scaling Check Box Checked Loop DRIVE Volts (Vgs) Adjust: Adjust by Incrementing Check Box Unchecked Loop DRIVE Volts (Vgs) Adjust: Scale Factor Real 1.0 Loop DRIVE Volts (Vgs) Adjust: Increment (Volts) Real 0.0 Loop I2C Volts (Vds) Adjust: Adjust Volts Check Box Unchecked Loop I2C Volts (Vds) Adjust: Adjust by Scaling Check Box Checked Description Enables the adjustment of the DRIVE V gs Voltage in a Branch Loop. When this control is checked, Adjust by Scaling and Adjust by Incrementing are enabled. Scale Factor or Increment (Volts) are enabled when this control is checked and depending on the state of Adjust by Scaling and Adjust by Incrementing. Unchecking this control disables all associated controls. When Loop DRIVE Volts (Vgs) Adjust: Adjust Volts is enabled, selecting this control will cause the Vgs to update in a Branch Loop by scaling it by Scale Factor. This control is enabled when Loop DRIVE Volts (Vgs) Adjust: Adjust Voltis enabled, and selecting it enables Scale Factor. Checking this control unchecks Adjust by Incrementing and disables Increment (Volts). This control is disabled if Loop DRIVE Volts (Vgs) Adjust: Adjust Volt is unchecked. When Loop DRIVE Volts (Vgs) Adjust: Adjust Volts is enabled, selecting this control will cause the Vgs to update in a Branch Loop by incrementing it by Increment (Volts). This control is enabled when Loop DRIVE Volts (Vgs) Adjust: Adjust Volts is enabled, and selecting it enables Increment (Volts). Checking this control unchecks Adjust by Scaling and disables Scale Factor. This control is disabled if Loop DRIVE Volts (Vgs) Adjust: Adjust Volts is unchecked. This control is enabled when both Loop DRIVE Volts (Vgs) Adjust: Adjust Volts and Adjust by Scaling are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Vgs will be scaled to determine the voltage of the current iteration. This value is unrestricted. This control is enabled when both Loop DRIVE Volts (Vgs) Adjust: Adjust Volts and Adjust by Incrementing are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration V gs will be incremented to determine the voltage of the current iteration. This value is unrestricted. Enables the adjustment of the I2C DAC V ds Voltage in a Branch Loop. When this control is checked, Adjust by Scaling and Adjust by Incrementing are enabled. Scale Factor or Increment (Volts) are enabled when this control is checked and depending on the state of Adjust by Scaling and Adjust by Incrementing. Unchecking this control disables all associated controls. When Loop I2C Volts (Vds) Adjust: Adjust Volts is enabled, selecting this control will cause the 14 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Loop I2C Volts (Vds) Adjust: Adjust by Incrementing Check Box Unchecked Loop I2C Volts (Vds) Adjust: Scale Facto Real 1.0 Loop I2C Volts (Vds) Adjust: Increment (Volts) Real 0.0 Adjust Soak Time (ms) Check Box Unchecked Adjust by Scaling Check Box Checked Adjust by Incrementing Check Box Unchecked Vds to update in a Branch Loop by scaling it by Scale Factor. This control is enabled when Loop I2C Volts (Vds) Adjust: Adjust Volts is enabled, and selecting it enables Scale Factor. Checking this control unchecks Adjust by Incrementing and disables Increment (Volts). This control is disabled if Loop I2C Volts (Vds) Adjust: Adjust Volts is unchecked. When Loop I2C Volts (Vds) Adjust: Adjust Volts is enabled, selecting this control will cause the Vds to update in a Branch Loop by incrementing it by Increment (Volts). This control is enabled when Loop I2C Volts (Vds) Adjust: Adjust Volts is enabled, and selecting it enables Increment (Volts). Checking this control unchecks Adjust by Scaling and disables Scale Factor. This control is disabled if Loop I2C Volts (Vds) Adjust: Adjust Volts is unchecked. This control is enabled when both Adjust Volts and Adjust by Scaling are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Vds will be scaled to determine the voltage of the current iteration. This value is unrestricted. This control is enabled when both Loop I2C Volts (Vds) Adjust: Adjust Volts and Adjust by Incrementing are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Vds will be incremented to determine the voltage of the current iteration. This value is unrestricted. Enables the adjustment of the Transistor Current Soak Time in a Branch Loop. When this control is checked, Adjust by Scaling and Adjust by Incrementing are enabled. Scale Factor or Increment (ms) are enabled when this control is checked and depending on the state of Adjust by Scaling and Adjust by Incrementing. Unchecking this control disables all associated controls. When Adjust Soak Time (ms) is enabled, selecting this control will cause the Soak Time to update in a Branch Loop by scaling it by Scale Factor. This control is enabled when Adjust Soak Time (ms) is enabled, and selecting it enables Scale Factor. Checking this control unchecks Adjust by Incrementing and disables Increment (ms). This control is disabled if Adjust Soak Time (ms) is unchecked. When Adjust Soak Time (ms) is enabled, selecting this control will cause the Soak Time to update in a Branch Loop by incrementing it by Increment (ms). This control is enabled when Adjust Soak Time (ms) is enabled, and selecting it enables Increment (ms). Checking this control unchecks Adjust by Scaling and disables Scale 15 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Scale Factor Real 1.0 Increment (ms) Real 0.0 Adjust Measurement Time (ms) Check Box Unchecked Adjust by Scaling Check Box Checked Adjust by Incrementing Check Box Unchecked Scale Factor Real 1.0 Increment (ms) Real 0.0 Factor. This control is disabled if Adjust Soak Time (ms) is unchecked. This control is enabled when both Adjust Soak Time (ms) and Adjust by Scaling are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Soak Time will be scaled to determine the voltage of the current iteration. This value must be strictly greater than 0.0. This control is enabled when both Adjust Soak Time (ms) and Adjust by Incrementing are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Soak Time will be incremented to determine the voltage of the current iteration. This value is unrestricted. Enables the adjustment of the Transistor Current Measurement Time in a Branch Loop. When this control is checked, Adjust by Scaling and Adjust by Incrementing are enabled. Scale Factor or Increment (ms) are enabled when this control is checked and depending on the state of Adjust by Scaling and Adjust by Incrementing. Unchecking this control disables all associated controls. When Adjust Measurement Time (ms) is enabled, selecting this control will cause the Measurement Time to update in a Branch Loop by scaling it by Scale Factor. This control is enabled when Adjust Measurement Time (ms) is enabled, and selecting it enables Scale Factor. Checking this control unchecks Adjust by Incrementing and disables Increment (ms). This control is disabled if Adjust Measurement Time (ms) is unchecked. When Adjust Measurement Time (ms) is enabled, selecting this control will cause the Measurement Time to update in a Branch Loop by incrementing it by Increment (ms). This control is enabled when Adjust Measurement Time (ms) is enabled, and selecting it enables Increment (ms). Checking this control unchecks Adjust by Scaling and disables Scale Factor. This control is disabled if Adjust Measurement Time (ms) is unchecked. This control is enabled when both Adjust Measurement Time (ms) and Adjust by Scaling are checked. Otherwise it is disabled. This control is used to specify the value by which the previous Branch Loop iteration Measurement Time will be scaled to determine the voltage of the current iteration. This value must be strictly greater than 0.0. This control is enabled when both Adjust Measurement Time (ms) and Adjust by Incrementing are checked. Otherwise it is disabled. This con- 16 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Help OK Button Button Unpressed Unpressed Cancel Button Unpressed trol is used to specify the value by which the previous Branch Loop iteration Measurement Time will be incremented to determine the voltage of the current iteration. This value is unrestricted. Read these Help pages. Accept the configured values and close the dialog. Close the dialog. Do not accept any changes to configured values. B.12 – Amplifier Selection Selecting either the internal ±200 Volt amplifier (±10 Volts or ±100.0 Volts for some Precision NGS models) or an external High Voltage Amplifier (HVA) connected to the tester through a High Voltage Interface (HVI) is accomplished by clicking Set Amplifier, opening the subdialog of Figure B.12.1. The "Internal" amplifier is set by default. In Version 4.1.x High Voltage configuration has been simplified by allowing only two amplifier selections - "Internal Amplifier" or "External Amplifier". "Internal Amplifier" refers to the ±10.0-Volt, ±100.0-Volt or ±200.0-Volt amplifier (depending on tester model) that the Precision Tester can produce with no externally-attached accessories. "External Amplifier" refers to any amplifier connected to the Precision Tester through an HVI. The type of external amplifier is no longer specified. The software recognizes the type of amplifier through the ID module that accompanies the delivery of the High Voltage accessories. With an "External Amplifier" specified, the user must choose an HVI Comm Port ('1' or '2' for the Precision Premier or Workstation, '1' for the Precision LC) and an HVI Channel ('1' or '2' for the 10 kV HVI, '1' for the 4 kV unit). Figure B.12.1 - Internal Amplifier Selection or External Amplifier Configuration. Name Type Internal Radio Amplifier Button Default Selected Description Selecting this control instructs Vision to use the Tester's internal amplifier to generate a signal of up to ±200.0 Volts (depending on tester model). 17 VII.D.12 - i – Transistor Current Last Update – 7/27/10 HVI Comm Port and HVI Channel will be forced to values of '0' and disabled. External Radio Unselected Selecting this control instructs Vision to use an external High Voltage Amplifier Button Amplifier (HVA), connected to the tester through a High Voltage Interface (HVI). Voltages of up to ±10,000 Volts can be switched to the sample HVI Comm Port and HVI Channel will be set to default values of '1' and enabled. HVI Comm Integer 0/1 0, 1 or 2. This is the DB-25 connector at the rear of the tester to which Port the external HVI is connected. For Precision Workstations and Premiers, this may take a value of '1' or '2', allowing two HVIs to be connected and switched in software. Precision NGS testers have only a single comm port, selected by '1'. A '0' indicates that the signal is to be taken from the Tester's internal amplifier. If Internal Amplifier is selected, this control is forced to '0' and disabled. If External Amplifier is selected, this control is set to '1' by default and enabled. HVI Integer 0/1 0, 1 or 2. This is the channel at the rear of the HVI to which the HVAs Channel connected. For 10 kV HVIs, this may take a value of '1' or '2', allowing two HVAs to be connected and switched in software. 4 kV HVIs have only a single channel, selected by '1'. A '0' indicates that the signal is to be taken from the Tester's internal amplifier. If Internal Amplifier is selected, this control is forced to '0' and disabled. If External Amplifier is selected, this control is set to '1' by default and enabled. B.13 - Sample Identifying Information Clicking Set Sample Info opens a subdialog in which several sample identifying parameters may be configured. The purpose is strictly for documentation and most identifiers are not generic enough to apply to all cases. Figure B.13.1 - Sample Documentation Subdialog. B.14 - Controls Name Sample Name Type Text Default Description "" 24 Characters Maximum. A unique description of the sample being measured 18 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Lot ID Text Wafer ID Text Die Row Integer Die Column Integer Capacitor Number Integer OK Button Cancel Button "" 12 Characters Maximum. A unique description of the the lot from which the sample under test is taken. "" 12 Characters Maximum. A unique description of the the wafer from which the sample under test is taken. 0 The vertical location on the wafer of the sample under test. May be negative. 0 The horizontal location on the wafer of the sample under test. May be negative. 0 Serial identifier of the capacitor being tested. Unpressed Accept the entered values. Unpressed Close the dialog. Do not adjust the sample information. B.15 - Sensor Configuration Clicking Set Sensor opens a subdialog that allows voltages at the external SENSOR port to be acquired along with the measured data. The SENSOR data can be linearly scaled and offset to convert them from a voltage to a meaningful value. Inputting the known output impedance of the device attached to the sensor helps correct for small errors in the measured value. The sensor data can be labeled for identification. As shown on the dialog, the derived sensor value is given by: Sensor Data = Sensed Voltage x Sensor Scale (Tester Input Impedance + Sensor Impedance) / Tester Input Impedance + Offset (B.15.1) The results of enabling or disabling the Sensor data will be displayed in the Sensor Enabled control on the main dialog when the subdialog is closed. Figure B.15.1 - Sensor Configuration Subdialog. Name Sensor Enable Sensor Scale Type Default Description Check Unchecked Checking this control tells the software to capture the voltage signal atBox tached to the SENSOR port simultaneously with the measured data. The signal will be scaled and offset using equation (B.12.1). Checking this box enables Sensor Scale, Sensor Offset, Sensor Impedance and Sensor Label. Real 1.0 Checking Sensor Enable enables this control. Otherwise it is disabled. The value in this control will be used as a scale factor to linearly convert 19 VII.D.12 - i – Transistor Current Last Update – 7/27/10 the measured sensor signal to a physical value in accordance with equation (B.12.1). Sensor Real 0.0 Checking Sensor Enable enables this control. Otherwise it is disabled. Offset The value in this control will be used as an offset value to linearly convert the measured sensor signal to a physical value in accordance with equation (B.12.1). Sensor Integer 50 Checking Sensor Enable enables this control. Otherwise it is disabled. Impedance The value in this control will be used as a corrective term to adjust the measured voltage in accordance with equation (B.12.1). Sensor Text "" Checking Sensor Enable enables this control. Otherwise it is disabled. Label Box This value is used to identify the converted SENSOR signal when the sensor data are displayed. Cancel Button Unpressed Close the dialog. Discard any changes made in the Sensor configuration. OK Button Unpressed Close the dialog. Make the indicated changes in the Sensor configuration. 20 VII.D.12 - i – Transistor Current Last Update – 7/27/10 C – QuikLook Setup Task Name: Version: Last Update: In QuikLook Menu: Folder: Subfolder: Subsubfolder: Window Name: Change Record: Known Bugs: User Variables Added: Transistor Current 4.5.0 30 June 10 Yes Hardware Measurement None Transistor Current QuikLook Setup::Main Setup Go to Change Record None Go To User Variables C.1 - Setup Dialog Figure C.1.1 - Transistor Current Task QuikLook Configuration Main Dialog Tab. 21 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure C.1.2 - Transistor Current Task QuikLook Configuration Main Dialog Tab w/Vision Data File. C.2 - Discussion The Transistor Current Task configuration dialog, setup as in the example on the Discussion page, is shown Figure C.1.1. The dialog is used to configure the Task for inclusion into a Test Definition and execution within a DataSet. The upper portion of the dialog is used to specify the two DC Bias voltages - the Gate-Source (Vgs) voltage provided by the tester DRIVE port and the Drain-Source (Vds) voltage generate by the RTI Digital-toAnalog Converter (DAC) connected to the tester's I2C port. Also unique to the Transistor Current Task are the Soak Time (ms) and the Measure Time (ms). The remaining controls are common to the configuration of all Measurement Tasks. Internal Reference Element refers to various samples, internal to the tester, which may be switched into the signal path and measured in parallel to each other and to any sample attached to the tester DRIVE and RETURN ports. A 1.0 nF linear internal reference capacitor and a 2.5 M internal reference resistor are available to all testers except the RT66B. A selectable pair of internal reference ferroelectric elements may be switched in, individually or together, if the customer is using a Precision Premier II or Precision LC II tester. Amp Level, Start with Last Amp Level and Auto Amp refer to the software switching op22 VII.D.12 - i – Transistor Current Last Update – 7/27/10 tions when setting the RETURN signal transimpedence amplifier that adjusts the signal level to one appropriate for measurement. With Auto Amp unchecked, Amp Level is enabled and the user may select the amplification level to be used. In this case the measurement is made exactly once, and the data are returned whether or not the correct amplification level is returned. With Auto Amp checked, the driver will start either at the amplification level selected in Amp Level (if Start with Last Amp Level is unchecked) or at the last determined amplification level (if Start with Amp Level is checked). After the first measurement, the RETURN signal level is evaluated and the data may be returned if the level is appropriate. Otherwise the amplification level will be increased or decreased as appropriate and the measurement repeated and the signal reevaluated. The measurement-evaluation cycle will be repeated until an appropriate amplification level is reached or the driver determines that it is incapable of making the measurement. In these cases, all data are discarded except for the final, valid measurement. Set Sample Info, Set Multiplexer, Set Sensor and Set Amplifier are buttons that open subdialogs whose functions are described in detail below. Read Data From Vision File is normally unchecked. When checked, most controls are disabled and Browse to File and File Name become visible (Figure C.12). In this case, Browse to File is used to navigate to a Vision Data File (VDF), exported by a previous execution of the Transistor Current Task. Once identified, the file path and file name are shown in the read-only File Name control. On Task execution, the specified file will be opened and the data read rather than having the Task make a new measurement. The Task configuration values are read from the file, and so the controls are disabled. C.3 - Controls Control Task Name Type Text Default “Trans Cur.-#” DRIVE Volts (Vgs) I2C Volts (Vds) Real 4.0 Real 1.0 I2C Address Soak Time (ms) Integer Real 7 1000.0 Measure Time (ms) Sample Area (cm2) Sample Thickness (µm) Real 1000.0 Real 1e-4 Real 0.3 Description This serves as a root identifier for this instance of the Transistor Current Task. The Task will be identified with this value in the Editor and the Current Test Definition (CTD). Executed Tasks will be displayed and stored with this name with a „.‟ and an execution number appended to it. Each new instance of a Transistor Current Task within the Editor should have a unique Task Name assigned. 30-character limit. The DC Bias to be applied to the tester's DRIVE port and to the samples gate electrode during the first Task instance. The DC Bias to be applied to the by the RTI DAC connected to the I2C port and to the samples drain electrode during the first Task instance. The I2C Address that has been assigned to the RTI DAC. In milliseconds. The initial duration for which the DC Bias is to be applied before current sampling begins during the first Task instance. In milliseconds. The initial duration for during which the sample current is measured during the first Task instance. In cm2. The surface area of the ferroelectric sample electrode. This value is used in calculating the measured Polarization. In µm. The depth of the ferroelectric material in the sample. 23 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Set Sample Info Button Unpressed This button opens a subdialog in which sample documentary information may be entered as presented below. Set Sensor Button Unpressed This button opens a subdialog in which capture of a signal at the Sensor port may be enabled and configured or disabled. The status is indicated in the Sensor Enable control. Sensor Enable Check Unchecked Disabled - Indicator only. This control indicates if the signal at the Box Sensor port is to be captured (checked) or if this option is disabled (unchecked). Set Amplifier Button Unpressed This button opens a subdialog in which the user may set the sample drive signal to pass through an external High Voltage Amplifier (HVA), connected to the tester through an attached High Voltage Interface (HVI). Or the system can be returned to the default, low voltage "Internal" amplifier. If "High Voltage" is selected, the user must configure the tester port and HVI channel through which to pass the drive signal. The selected amplifier is indicated in Amplifier. Amplifier Text "Internal" Indicates of the measurement is to be a low-voltage testergenerated drive signal ("Internal") or a high-voltage signal generated by an external amplifier ("High Voltage"). The option is controlled using the Set Amplifier button. Set Multiplexer Button Unpressed This control opens a subdialog in which one the DRIVE and RETURN signal channels and ports can be specified for switching to one or two connected 48-channel multiplexers. The subdialog is described in detail below. Enable Ref. Cap Boolean Unchecked Two independently switchable internal test sample of known valEnable Ref. Resisue are built into the Precision tester. These are arranged in parallel tor and may be switched into the drive/return test loop in any order. If a sample is attached to the external DRIVE and RETURN BNCs these will be added in parallel to the sample. Enable Ref. Fer- Boolean Unchecked A third internal reference (ferroelectric) sample has been added to roelectric the Precision Premier II tester and is planned in the Precision LC II tester. The ferroelectric test element includes two switchable capacitors in a single package inserted into a user-accessible connector. A variety of capacitors are available from Radiant Technologies, Inc. and this test element may be easily changed to adjust the type or to replace fatigued samples. Just as with the internal reference capacitor and resistor, the ferroelectric test sample may be switched into the test signal path in parallel with any externally-connected test sample and/or the internal reference capacitor and/or resistor. More information is available in the Version 4.0.0 What's New page. Checking this control enables Cap A Enable and Cap B Enable. Otherwise those controls are disabled. Cap A Enable Boolean Unchecked When the internal reference ferroelectric is selected, these controls Cap B Enable are activated to allow the user to select the capacitor to be measured. Cap A, Cap B or both may be selected. When both are selected, the capacitors are measured in parallel. Both may also be disabled, though this has little practical value. Auto Amplifica- Boolean True Tells the tester to automatically adjust the sample return signal tion gain to an acceptable level. This is done by repeatedly measuring the sample using the configured conditions and adjusting the gain. Enabling this control disabled Amp. Level and enables Start with Last Amp Value. Start with Last Check Unchecked See the discussion under Description above. This control is disAmp Value Box abled if Auto Amplification is not selected. Amp. Level List Internal If Auto Amplification is disabled, this control is used to select the 24 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Read Data from Vision File Check Box File Name Text Browse to File Button Help OK Cancel Button Button Button Amplifier amplification level to be used by the hardware to make the measurement. Unchecked Checking this box indicates that the Transistor Current data are to be read from a Vision Data File, exported by a previous execution of the Transistor Current Task, and not taken by measuring a sample. Checking this box causes File Name and Browse to File to be shown. It also causes all controls except Task Name, Help, OK and Cancel to be disabled. “” This control is normally hidden. It is shown when Read Data From Vision File is checked. The control is a read-only indicator. It shows the file path and file name of the Vision Data File to be used to produce the Task's data on execution. Unpressed This control is normally hidden. It is shown when Read Data From Vision File is checked. The button opens a standard Windows file browser dialog that is to be used to identify the name and location of the Vision Data File, exported by a previous Transistor Current Task execution, which will produce the Task's data on execution. Unpressed Read this Help page. Unpressed Accept the configured Transistor Current Task values and execute. Unpressed Cancel Transistor Current Task configuration and execution. 25 VII.D.12 - i – Transistor Current Last Update – 7/27/10 C.4 – 48-Channel Multiplexer Configuration Figure C.4.1 - 8-Channel Multiplexer Configuration Subdialog. C.5 - Controls Control Type Drive/Return Integer Channel Default 0/0 Description 0-48. One or two 48-channel mulitplexers may be connected to the Precision tester using DB-25 connectors on the rear of the unit (limit one for the Precision LC). These accessories allow up to 95 samples (with a single common return) to be connected to the tester. These controls designate the channel to apply the drive signal to and to receive the return signal from. Values of 0 through 48 may be entered. A value of 0 indicates that no multiplexer is present or that it should not be selected. In this case, the signal will be routed through the normal BNC connector on the tester front panel. Setting a non-zero value in Drive Channel and/or Return Channel enables Drive Port and/or Return Port and sets the value in the control(s) to a default of '1'. Setting '0' in Drive Channel and/or Return Channel disables Drive Port and/or Return Port and sets the value in the control(s) to a default of '0'. Drive/Return Integer 0/0 0-2 (0-1 for the Precision LC tester). The DB-25 connector on the Port rear of the Precision Tester to which is connected the multiplexer to be used for the Drive/Return Signal. These controls are disabled and forced to a value of '0' if the Drive/Return Channel controls are set to '0'. Otherwise they will be enabled and initially set to a default value of '1'. A value of '0' in this control indicates that no multiplexer is to be used. Adjust Mux Button Unpressed This control is disabled in QuikLook. Adjust Mux Check Unchecked This control is fixed at unchecked and disabled in QuikLook. in a Loop Box Help Button Unpressed Read the Multiplexer help page. OK Button Unpressed Accept the configured 48-channel multiplexer configuration. Cancel Button Unpressed Close the dialog. Make no changes to the 48-channel multiplexer con- 26 VII.D.12 - i – Transistor Current Last Update – 7/27/10 figuration. C.6 - Amplifier Selection Selecting either the internal ±100 Volt amplifier (±10 Volts for some Precision LC models) or an external High Voltage Amplifier (HVA) connected to the tester through a High Voltage Interface (HVI) is accomplished by clicking Set Amplifier, opening the subdialog of Figure C.6.1. The "Internal" amplifier is set by default. As of Version 4.0.0 High Voltage configuration has been simplified by allowing only two amplifier selections - "Internal Amplifier" or "External Amplifier". "Internal Amplifier" refers to the ±100.0-Volt or ±200.0-Volt amplifier (±10.0 Volts in some LC models) that the Precision Tester can produce with no externally-attached accessories. "External Amplifier" refers to any amplifier connected to the Precision Tester through an HVI. The type of external amplifier is no longer specified. The software recognizes the type of amplifier through the ID module that accompanies the delivery of the High Voltage accessories. With an "External Amplifier" specified, the user must choose an HVI Comm Port ('1' or '2' for the Precision Premier or Workstation, '1' for the Precision LC) and an HVI Channel ('1' or '2' for the 10 kV HVI, '1' for the 4 kV unit) Figure C.6.1 - Internal Amplifier Selection or External Amplifier Configuration. C.7 – Controls Control Internal Amplifier Type Radio Button Default Description Selected Selecting this control instructs Vision to use the Tester's internal amplifier to generate a signal of up to ±100.0 Volts. HVI Comm Port and HVI Channel will be forced to values of '0' and disabled. External Am- Radio Unselected Selecting this control instructs Vision to use an external High Voltage plifier Button Amplifier (HVA), connected to the tester through a High Voltage Interface (HVI). Voltages of up to ±10,000 Volts can be switched to the sample HVI Comm Port and HVI Channel will be set to default 27 VII.D.12 - i – Transistor Current Last Update – 7/27/10 HVI Comm Port Integer 0/1 HVI Channel Integer 0/1 values of '1' and enabled. 0, 1 or 2. This is the DB-25 connector at the rear of the tester to which the external HVI is connected. For Precision Workstations and Premiers, this may take a value of '1' or '2', allowing two HVIs to be connected and switched in software. Precision LCs have only a single comm port, selected by '1'. A '0' indicates that the signal is to be taken from the Tester's internal amplifier. If Internal Amplifier is selected, this control is forced to '0' and disabled. If External Amplifier is selected, this control is set to '1' by default and enabled. 0, 1 or 2. This is the channel at the rear of the HVI to which the HVAs connected. For 10 kV HVIs, this may take a value of '1' or '2', allowing two HVAs to be connected and switched in software. 4 kV HVIs have only a single channel, selected by '1'. A '0' indicates that the signal is to be taken from the Tester's internal amplifier. If Internal Amplifier is selected, this control is forced to '0' and disabled. If External Amplifier is selected, this control is set to '1' by default and enabled. C.8 - Sample Identifying Information Clicking Set Sample Info opens a subdialog in which several sample identifying parameters may be configured. The purpose is strictly for documentation and most identifiers are not generic enough to apply to all cases. Figure C.8.1 - Sample Documentation Subdialog. C.9 - Controls Name Type Sample Name Text Default "" Lot ID Text "" Wafer ID Text "" Discussion 24 Characters Maximum. A unique description of the sample being measured 12 Characters Maximum. A unique description of the the lot from which the sample under test is taken. 12 Characters Maximum. A unique description of the the wafer from 28 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Die Row Integer 0 Die Column Integer 0 Capacitor Number OK Cancel Integer 0 which the sample under test is taken. The vertical location on the wafer of the sample under test. May be negative. The horizontal location on the wafer of the sample under test. May be negative. Serial identifier of the capacitor being tested. Button Unpressed Accept the entered values. Button Unpressed Close the dialog. Do not adjust the sample information. C.10 – Sensor Configuration Clicking Set Sensor opens a subdialog that allows voltages at the external SENSOR port to be acquired along with the measured data. The SENSOR data can be linearly scaled and offset to convert them from a voltage to a meaningful value. Inputting the known output impedance of the device attached to the sensor helps correct for small errors in the measured value. The sensor data can be labeled for identification. As shown on the dialog, the derived sensor value is given by: Sensor Data = Sensed Voltage x Sensor Scale (Tester Input Impedance + Sensor Impedance) / Tester Input Impedance + Offset (C.10.1) The results of enabling or disabling the Sensor data will be displayed in the Sensor Enabled control on the main dialog when the subdialog is closed. Figure C.10.1 - Sensor Configuration Subdialog. C.11 – Controls Name Sensor Enable Sensor Scale Type Default Discussion Check Unchecked Checking this control tells the software to capture the voltage signal atBox tached to the SENSOR port simultaneously with the measured data. The signal will be scaled and offset using equation (2). Checking this box enables Sensor Scale, Sensor Offset, Sensor Impedance and Sensor Label. Real 1.0 Checking Sensor Enable enables this control. Otherwise it is disabled. The value in this control will be used as a scale factor to linearly convert the measured sensor signal to a physical value in accordance with equa- 29 VII.D.12 - i – Transistor Current Last Update – 7/27/10 tion (C.10.1). Checking Sensor Enable enables this control. Otherwise it is disabled. The value in this control will be used as an offset value to linearly convert the measured sensor signal to a physical value in accordance with equation (C.10.1). Sensor Integer 50 Checking Sensor Enable enables this control. Otherwise it is disabled. Impedance The value in this control will be used as a corrective term to adjust the measured voltage in accordance with equation (C.10.1). Sensor Text “” Checking Sensor Enable enables this control. Otherwise it is disabled. Label This value is used to identify the converted SENSOR signal when the sensor data are displayed. Cancel Button Unpressed Close the dialog. Discard any changes made in the Sensor configuration. OK Button Unpressed Close the dialog. Make the indicated changes in the Sensor configuration. Sensor Offset Real 0.0 30 VII.D.12 - i – Transistor Current Last Update – 7/27/10 D - QuikLook Plot Configuration Task Name: Version: Last Update: In QuikLook Menu: Folder: Subfolder: Subsubfolder: Window Name: Change Record: Known Bugs: User Variables Added: Transistor Current 4.5.0 30 June 2010 Yes Hardware Measurement None Transistor Current QuikLook Setup::Plot Setup Go to Change Record None Go to User Variables D.1 - Setup Dialog Figure D.1.1 - Transistor Current Task QuikLook Plot Configuration Tab. D.2 - Discussion The plot setup tab of the QuikLook setup dialog for the Transistor Current Task is used primarily to identify text titles to be associated with the plotted data on the Results dialog that appears as the result of a QuikLook measurement. An additional text object, known as a Prompt, is displayed above the plot surface on the dialog. It can have a single User 31 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Variable appended to it and is a good tool to track a configuration or result parameter. Comments provide an opportunity for extended measurement discussion and will also appear on the results dialog. The Smooth Data check box instructs the Task to pass a moving average smoothing filter over the data before presentation. The Tabbed View control causes the data to be presented in a tabbed dialog with the data plotted on the first tab and configuration and measured parameters specified on the second tab. This reduces the size of the overall dialog presentation for users with reduced displays such as laptops. See Execution, Archive Regraph and Exporting for samples of the data display. D.3 - Controls Control Plot Title Type Text Plot Subtitle Text Plot X-Axis Label Text Plot Y-Axis Label Text Data Label Text User Self-Prompt Text Parameter to Append to Prompt Smooth Data Tabbed Data Comments Help OK Cancel Default “” Description 60 characters maximum. Appears centered above the plotted data. Allows discussion of the data displayed. “” 60 characters maximum. Appears centered above the plotted data and beneath Plot Title. Allows refinement of the discussion of the data displayed. “Time (ms)” 60 characters maximum. Identifies the independent variable against which data are measured and plotted. This variable is the Measurement Time, given in milliseconds, as indicated by the default label value. This label may, nonetheless, be altered. “Current 60 characters maximum. Identifies the the measured and plot(Amps)” ted data. This variable is the measured sample Current, given in Amps, as indicated by the default label value. This label may, nonetheless, be altered. “Trans Cur This value is used to identify the measured data trace on the Data” plot, by associating the label with the data line type, color and symbol, when two traces appear on the plot. Two traces will appear if the sensor acquisition is enabled. “” 60 characters maximum. This control allows further Task discussion by the researcher. The test is displayed above the plotted data on the Results dialog. This text may have a single User Variable appended to it. “<>” Identifies the User Variable to append to User Self-Prompt. List Box Check Unchecked Checking this box causes a 9-point Savitsky-Golay weighted Box moving average to be passed over the data to smooth them before display. Check Unchecked Checking this box causes the data to be displayed in a tabbed Box dialog, with the plotted data on the first tab and parametric information on the second tab. This allows a smaller dialog presentation for users with laptop displays. Text “” A string of up to 511 characters to be written at the user‟s discretion. Intended to allow a detailed description of the design decision to include the Transistor Current Task. Button Unpressed Read this Help page. Button Unpressed Accept the configured Transistor Current values Button Unpressed Cancel Transistor Current configuration and execution. 32 VII.D.12 - i – Transistor Current Last Update – 7/27/10 E - Results and Data Presentation E.1 – Transistor Current Execution As with most Measurement Tasks, executing the Transistor Task in a Test Definition causes the Task, along with its measured data, to be written to the Archive of the DataSet in which it was executed. The data can then be recalled from the Archive, for display and review, as described below. Data are not displayed by the Task during execution, though they may be displayed by associating the Task with one or more Filter Tasks. However, the Task may also be executed independent of any DataSet by selecting it from the QuikLook menu. This provides for immediate and independent Task configuration and execution. In the case of QuikLook execution, the acquired data are immediately displayed in a Results dialog as shown Figure E.1.1. 33 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.1.1 - Transistor Current Measurement Data Displayed in a QuikLook Results Dialog. Most of the controls of the Results Dialog are informational and set as read-only. Central to the dialog are the plotted data. The plot includes titles and labels as specified in the Plot Setup dialog. Above the plot is a Prompt string that may have a User Variable appended to it. To the left is information regarding the configuration of the measurement. To the upper right are the actual measured current (Amps) and derived Resistance () and Resistivity (•cm) values. These single-value parameters are taken from the final sample point. Annotations including lines, rectangles, ellipses, text and labeled or unlabeled symbols 34 VII.D.12 - i – Transistor Current Last Update – 7/27/10 may be added to the plot. See Step-by-Step->Plots and Data->Annotations in the main Vision help pages. A text field below the plotted data shows the current status of inserting an annotation. Under normal measurement circumstances an unlabeled text field will indicate "Valid Data" in blue text. However, if the driver returns a non-zero error value, a summary of the error will appear in red in the text box. In this case, an Error Report button will appear as well as an additional red text field that serves as a prompt to click the button. Clicking the button opens a subdialog that provides greater error detail and possible remedial action as shown in Figure E.1.2. 35 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.1.2 - Error Report Indicators and Detailed Error Report Subdialog. An array of buttons, including Admin Info, Export and Tabbed View, along with a check box labeled Create a DataSet, have functions that are detailed throughout the remainder of this document. The Tabbed View button closes the display of Figure E.1.1 and reopens the data display in a tabbed dialog. The first tab (Figure E.1.3) shows the data display and error reporting. It also offers the Export button. The second tab (Figure E.1.4) shows the configuration and measured parameters and offers the Admin Info button. The utility of this display is that it is smaller and more convenient for users with smaller displays such as those running laptops. Once a display option is selected it is persistent for all Tasks until changed. A display may be changed from full view to tabbed view either by checking the Tabbed View check box control in the plot configuration dialog or by clicking the Tabbed 36 VII.D.12 - i – Transistor Current Last Update – 7/27/10 View button on the full view display (Figure E.1.1). The display may be changed from tabbed to full view only by unchecking the Tabbed View check box in the plot configuration dialog. Figure E.1.3 - Tabbed View Tab 1 - Plotted Data and Error Reporting. 37 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.1.4 - Tabbed View Tab 2 - Configuration and Data Parameters. E.2 – Sensor Data As with all Measurement Tasks, an externally-generated voltage in the range ±10.0 Volts may be captured from the SENSOR port at the tester's rear panel simultaneously with each Transistor sample point. The voltage will normally represent some physical characteristic - temperature, light intensity, pressure, displacement, etc. - measured by an in38 VII.D.12 - i – Transistor Current Last Update – 7/27/10 strument that produces a voltage that is linearly related to the characteristic being measured. Vision allows the captured voltage to be scaled and offset linearly to reconvert it back into the property being measured. The sensor capture is enabled and configured in a subdialog accessed through the Transistor Current configuration dialog as described in configuration pages. When the sensor value is captured it is displayed on the response plot together with the captured sample current as shown in Figure E.2.1. In this case, the sensed voltage is the applied 1.0-Volt I2C DAC Vds voltage. It is scaled by 1.0 and offset by 0.0 to produce the blue line evident in the logarithmic plot. Figure E.2.1 - Transistor Current Data w/Sensor Enabled. 39 VII.D.12 - i – Transistor Current Last Update – 7/27/10 E.3 - Create a DataSet A QuikLook Task execution is intended to provide a rapid sampling of the test device and is not intended to save data. This is emphasized by the fact that the QuikLook measurement lies outside the DataSet and Archiving structure of Vision. However once data are acquired, there are two mechanisms by which they may be stored. The first is to export the data out of the Vision program as discussed below. The second method is to maintain the data within the Vision program by moving them into a DataSet Archive. This process begins with the data displayed in the Response Dialog as shown in the figures above. Once OK is clicked, the dialog will close and the data will be lost. However, if Create a DataSet is checked before closing the dialog, the process of saving the QuikLook-measured data to a DataSet Archive will begin. With the check box checked, once OK is clicked, the Results Dialog will close and the user will be presented with the option to create a new DataSet or append to an existing DataSet. If an existing DataSet is selected, the Data will be appended to the open DataSet whose tab is selected in the DataSet Explorer. Figure E.3.1 - DataSet Selection Dialog for DataSet Storage of QuikLook data. If a new DataSet is chosen, the DataSet creation process will begin once the dialog of Figure E.3.2 is closed. A standard "New DataSet" dialog will appear in which the DataSet is named, given a file path and file name, comments are added if desired and the user is identified. The process can be cancelled at this point, but the data will then be lost. Once the dialog is closed with the OK button, the DataSet will be created. 40 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.3.2 - Standard DataSet Creation Dialog. Regardless of the DataSet source - new or existing - the DataSet Current Test Definition (CTD) will be updated to contain the single Leakage Task, configured as it was in QuikLook. A CTD Rename dialog will appear to allow the Test Definition to be uniquely identified. Figure E.3.3 - CTD Rename Dialog. The DataSet Archive will have appended to it a single Executed Test Definition. The ETD will be named as the CTD and will contain the single Transistor Current Task. The Task will be configured as it was for the QuikLook execution and will contain the data measured by that execution. Configuration and data can be verified by performing an Archive Regraph as described in the next section. 41 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.3.4 - New DataSet Created from the QuikLook Execution. E.4 – Administrative Information Clicking the Admin Info button of Figures E.1.1, E.1.4 or E.2.1 opens a subdialog as in Figure E.4.1. All Tasks show the dates and times the Task was configured and executed. These also show the Vision version that the Task was executed under and the date that the version was compiled. Measurement Tasks such as the Transistor Current Task also show the tester name, serial number and driver version. This information may be of nominal use to the experimenter, but it can be of great use to Radiant Technologies in case in which the company is helping the customer troubleshoot a problem. Figure E.4.1 - Administrative Information Subdialog. E.5 - Archive Regraph Once the Transistor Current Task has been executed and written to a DataSet Archive (either by executing a Test Definition or by creating a DataSet from a QuikLook execu42 VII.D.12 - i – Transistor Current Last Update – 7/27/10 tion), it can be recalled to allow both the Task configuration and the measured data to be reviewed. From the DataSet Explorer, double-click the desired DataSet to open it and create a DataSet tab in the Explorer. Figure E.5.1 - Recovering the Transistor Current Task from the DataSet Archive. 43 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Open the DataSet Archive. Open the desired ETD and its "Experiment Data" folder. Double-click the desired Task. The Transistor Current Task configuration dialog will appear. Figure E.5.2 - Transistor Current Task Configuration Dialog Recalled from a DataSet Archive. Most of the controls of the dialog are disabled. They are presented here for configuration review. Set Sample Info, Set Adjust Mux, Set Sensor, Set Adjust Params and Set Amplifier controls are enabled to allow the controls to be switched so that the subdialogs that they initiate can be viewed for their configuration. These dialogs will have all controls disabled. Help is available and Cancel/Plot will eliminate the dialog and continue the regraph process. Once the configuration dialog has closed an intermediate dialog will appear that can be used to set or reset plot titles, prompt values and parameters to append to the prompt. This dialog is a duplicate of the QuikLook Plot Setup dialog and, if the DataSet was created from a QuikLook measurement, the dialog will show the titles as they were configured in QuikLook. 44 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.5.3 - Transistor Current Task Plot Configuration Dialog for Archived Data. Clicking OK causes the QuikLook Results Dialog to appear. The dialog will show the data as they were measured and stored in the Archive. The dialog is identical to the Results Dialog that appears as the result of a QuikLook execution, except that the Create a DataSet control is disabled. The Export button is enabled to allow data to be sent to a format outside of Vision as discussed in the next section. The data may also appear in tabbed view as discussed under Transistor Current Execution, above. 45 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.5.4 - Transistor Current Task Data Recalled from a DataSet Archive. 46 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.5.5 - Tabbed Data Recalled from a DataSet Archive. E.6 – Exporting In order to allow data to be exported from the Task when the Task is recalled from the DataSet Archive, an Export button appears on the recalled configuration dialog. This button is normally disabled, but it is enabled in Archive Regraph as in Figures E.5.4 and E.5.5, above. Clicking the button produces the new dialog that appears below. Figure 47 VII.D.12 - i – Transistor Current Last Update – 7/27/10 E.6.1 shows the Export configuration dialog in which the "Export Text" option is selected and the browser button enable. Figure E.6.2 shows an example of a browser dialog that opens when the Browse for File Name button is clicked. Figure E.6.1 - Export Configuration Dialog. 48 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.6.2 - Standard Windows File Browser Dialog. E.7 – Controls Control Select Option Type List Box Line Spacing Integer Left Margin Integer Tab Spacing Integer Browse for File Button Name Default "Print" Description Select between the "Print", "Export Text", "Export Word" and "Export Excel" options. This control enables the Browse for File Name button for all selections except the "Print" option. 100 This control appears when Select Option is set to "Print". Otherwise it is hidden. Increasing or decreasing this value will increase or decrease the vertical spacing of lines on the printed page. Experimentation will fix the value for any given printer. 100 This control appears when Select Option is set to "Print". Otherwise it is hidden. Increasing or decreasing this value will increase or decrease the left start point of text on the printed page. Experimentation will fix the value for any given printer. 200 This control appears when Select Option is set to "Print". Otherwise it is hidden. Increasing or decreasing this value will increase or decrease the horizontal spacing of tabbed sections of text on the printed page. Experi-mentation will fix the value for any given printer. Unpressed This control is enabled for all export options except "Print". For the "Export Text" and "Export Vision" options this control must be selected. For Word and Excel exporting the option is optional. The browser dialog will appear where a path and file name must be spe- 49 VII.D.12 - i – Transistor Current Last Update – 7/27/10 File Name Header Only Help OK Cancel cified for the export output. This control is always disabled and cannot be used to specify the file name or path for Text, Word, Excel or Vision export. Once the browser is used to select a path and file name, those will be displayed in this control for review. Note that a path and file name MUST be specified for the "Text" and "Vision" export option and may be specified for "Excel" or "Word". Check Checked This control only appears when Select Option is set to "Print" or Box "Word". Checking this box causes the Task to export all information except point-by-point data. With the option unchecked pointby-point data are exported producing long lists of numbers that may be of limited utility and wasted resources in a paper copy or Word document. Button Unpressed Open this help document for review. Button Unpressed Accept the configured export and close the dialog. Exporting will occur when the main data regraph dialog is closed. Button Unpressed Close the export dialog. Do not export. Text “” E.8 - Discussion Data can be exported to one of four targets:  Printer - Pre-formatted text is sent to the printer when the configuration dialog is closed. Before printing a printer setup dialog will appear (Figure E.8.2), allowing printer options to be adjusted. (The appearance of the dialog will vary from user to user.) With the release of Version 4.1.x, printer text can be formatted from within Vision by adjusting the Line Spacing, Left Margin and Tab Spacing integer values (Figure E.8.1). Experimentation will show the proper settings for all exporting to the attached printer. A Header Only control will cause the Task to export all information except for the point-by-point sample data. These controls are hidden unless the printer is specified as the target. 50 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.1 - Export Configuration Dialog - Printer Option. Figure E.8.2 - Standard Windows Printer Configuration Dialog. 51 VII.D.12 - i – Transistor Current Last Update – 7/27/10  Text File - Selecting this option enables the Browse for File Name button. Clicking this button will open a standard browser dialog in which a file name and path must be selected. If the file already exists, the output will be appended to existing text. An output file name must be specified for this export. Figures E.8.3 and E.8.4 show a sample of the Transistor Current Task text export. The information shown in the Admin Info subdialog of Figure E.4.1 has been added to the Text Export output. Figure E.8.3 - Sample Transistor Current Task Text Export File - Upper Portion. 52 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.4 - Sample Transistor Current Task Text Export File - Lower Portion.  Excel - Selecting this option enables the Browse for File Name button. Clicking this button will open a standard browser dialog in which a file name and path may be selected. Specifying a file name is optional. However, if specified, a unique file name/file path must be created or an overwrite situation will occur. Data are not appended to existing files. When the configuration dialog is closed, the Excel program will be started and a spread sheet created. When Excel is closed, the data will be written to the specified file name, or the user will be prompted to save if the file is not specified. Office/Excel 2000 or later must be loaded for this option. Office/Excel is not provided with the tester or Vision software. Figures E.8.5 and E.8.6 show a sample of the Transistor Current Task Excel export. The information shown in the Admin Info subdialog of Figure E.4.1 has been added to the Excel Export output. 53 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.5 - Sample Transistor Current Task Excel Export Output - Upper Portion. 54 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.6 - Sample Transistor Current Task Excel Export Output - Lower Portion.  Word - Selecting this option enables the Browse for File Name button. Clicking this button will open a standard browser dialog in which a file name and path may be selected. Specifying a file name is optional. The Word program will be opened and written when the regraph dialogs have been closed. If a new file name is specified, the document will be saved immediately. If no file name is specified, the user will be prompted to save the documents when closed. Office/Word 2000 or later must be loaded for this option. Office/Word is not provided with the tester or Vision software. The information shown in the Admin Info subdialog of Figure E.4.1 has been added to the Word Export output. 55 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.7 - Sample Transistor Current Task Word Export Output - Upper Portion. 56 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.8 - Sample Transistor Current Task Word Export Output - Lower Portion. 57 VII.D.12 - i – Transistor Current Last Update – 7/27/10  Vision Data File - In this option, added as of Version 4.0.0., the Task configuration parameters and measured data are written to a formatted binary file. Subsequent instances of the Transistor Current Task can be configured to import the data from the file, on execution, rather than making a new measurement. In this way, data can be moved from one DataSet to another where they can be grouped with other data and filtered. This utility is demonstrated in Figure E.8.9. Selecting this option enables the Browse for File Name button. Clicking this button will open a standard browser dialog in which a file name and path may be selected. Specifying a file name is required. 58 VII.D.12 - i – Transistor Current Last Update – 7/27/10 Figure E.8.9 – Utility of the Vision Data File. 59 VII.D.12 - i – Transistor Current Last Update – 7/27/10 F – User Variables Real Trans Cur: Current Time The total duration (soak + measure time), in milliseconds, of the current instance of the Transistor Current Task. This may differ from the initial duration if Soak Time and/or Measure Time is/are configured to be altered in a Branch Loop. Real Trans Cur: Current The DRIVE (Vgs) Voltage to be applied to the sample during the current Volts iteration of the Transistor Current Task. This may differ from the initial DRIVE voltage if Vgs is programmed to be altered in a Branch Loop. Real Trans Cur: Current The I2C (Vds) Voltage to be applied to the sample during the current iteI2C Volts ration of the Transistor Current Task. This may differ from the initial I2C voltage if Vds is programmed to be altered in a Branch Loop. Real Trans Cur: Current The current value, in milliseconds, of the delay to be applied to the samSoak Time ple after the application of the current DRIVE (V gs) and the current I2C (Vds) voltages before the measurement period begins. This delay allows signal introduced by the application of the voltages to settle before sample measurement. This value may differ from the initial Soak Time (ms) if Soak Time is programmed to be altered in a Branch Loop. Real Trans Cur: Current The current value, in milliseconds, of the duration of sample RETURN Measure Time signal capture during the application of the current DRIVE (Vgs) and the current I2C (Vds) voltages. This value may differ from the initial Measure Time (ms) if Measure Time is programmed to be altered in a Branch Loop. Real Trans Cur: Current The current (Amps) measured through the sample RETURN signal dur(Amps) ing the current instance of the Transistor Current Task. Real Trans Cur: Resis- The resistance () of the sample derived from the current (Amps) meastance (Ohms) ured through the sample RETURN signal during the current instance of the Transistor Current Task. Real Trans Cur: Resis- The resistivity (·cm) of the sample derived from the current (Amps) tivity (Ohms·cm) measured through the sample RETURN signal during the current instance of the Transistor Current Task. In Parallel with all other Measurement Tasks. Integer Points 5 to 1001 - Default = 1001. The number of discrete voltages applied during the profile. Text Vision Data File For Advanced C/V Task executions that read data from a Vision Data Name File, this is the name of the input file. Text Vision Data File For Advanced C/V Task executions that read data from a Vision Data Task Name File, this is the name of the Hysteresis Task that exported the file. Text Vision Data File For Advanced C/V Task executions that read data from a Vision Data Comments File, this is the Comments text associated with the Hysteresis Task that exported the file. 60 VII.D.12 - i – Transistor Current Last Update – 7/27/10 G - Change and Version Record Version 4.5.0 - 20 July 2010 1. Initial Release. 20 July 2010 - SPC. 61 VII.D.12 - i – Transistor Current Last Update – 7/27/10